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Extract from the Register of European Patents

EP About this file: EP4120148

EP4120148 - PARAMETER ADJUSTING DEVICE, INFERENCE DEVICE, PARAMETER ADJUSTING METHOD, AND PARAMETER ADJUSTING PROGRAM [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  16.12.2022
Database last updated on 27.07.2024
FormerThe international publication has been made
Status updated on  17.09.2021
Most recent event   Tooltip20.02.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
OMRON Corporation
801, Minamifudodo-cho
Horikawahigashiiru
Shiokoji-dori
Shimogyo-ku
Kyoto-shi, Kyoto 600-8530 / JP
[2023/03]
Inventor(s)01 / IMAI, Hiroshi
c/o OMRON Corporation, 801, Minamifudodo-cho,
Horikawahigashiiru, Shiokoji-dori, Shimogyo-ku
Kyoto-shi, Kyoto 600-8530 / JP
02 / YONETANI, Ryo
c/o OMRON SINICX Corporation, Nagase Hongo
Building 3F, 5-24-5, Hongo, Bunkyo-ku
Tokyo 113-0033 / JP
03 / MIYAURA, Hiroyuki
c/o OMRON Corporation, 801, Minamifudodo-cho,
Horikawahigashiiru, Shiokoji-dori, Shimogyo-ku
Kyoto-shi, Kyoto 600-8530 / JP
 [2023/03]
Representative(s)Horn Kleimann Waitzhofer Schmid-Dreyer Patent- und Rechtsanwälte PartG mbB
Theresienhöhe 12
80339 München / DE
[N/P]
Former [2023/03]Horn Kleimann Waitzhofer Patentanwälte PartG mbB
Ganghoferstraße 29a
80339 München / DE
Application number, filing date21766836.710.02.2021
[2023/03]
WO2021JP05063
Priority number, dateJP2020004211911.03.2020         Original published format: JP 2020042119
[2023/03]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2021182000
Date:16.09.2021
Language:JA
[2021/37]
Type: A1 Application with search report 
No.:EP4120148
Date:18.01.2023
Language:EN
[2023/03]
Search report(s)International search report - published on:JP16.09.2021
(Supplementary) European search report - dispatched on:EP28.09.2023
ClassificationIPC:G06N3/045, G06N3/084, G06N3/09, G06N3/096
[2023/44]
CPC:
G06N3/045 (EP); G06N5/04 (US); G06N3/084 (EP);
G06N3/09 (EP); G06N3/096 (EP)
Former IPC [2023/03]G06N20/00
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2023/03]
TitleGerman:VORRICHTUNG ZUR PARAMETEREINSTELLUNG, ABLEITUNGSVERFAHREN, VERFAHREN ZUR PARAMETEREINSTELLUNG UND PROGRAMM ZUR PARAMETEREINSTELLUNG[2023/03]
English:PARAMETER ADJUSTING DEVICE, INFERENCE DEVICE, PARAMETER ADJUSTING METHOD, AND PARAMETER ADJUSTING PROGRAM[2023/03]
French:DISPOSITIF DE RÉGLAGE DE PARAMÈTRES, DISPOSITIF D'INFÉRENCE, PROCÉDÉ DE RÉGLAGE DE PARAMÈTRES ET PROGRAMME DE RÉGLAGE DE PARAMÈTRES[2023/03]
Entry into regional phase10.08.2022Translation filed 
10.08.2022National basic fee paid 
10.08.2022Search fee paid 
10.08.2022Designation fee(s) paid 
10.08.2022Examination fee paid 
Examination procedure10.08.2022Examination requested  [2023/03]
31.01.2024Amendment by applicant (claims and/or description)
31.01.2024Date on which the examining division has become responsible
Fees paidRenewal fee
22.02.2023Renewal fee patent year 03
20.02.2024Renewal fee patent year 04
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Documents cited:Search[A]US2018314975  (ZANG HUI [US], et al) [A] 1-12 * paragraph [0003] - paragraph [0014]; paragraph [0026] - paragraph [0077];; figures 1-6C *;
 [I]  - ZHAO HANG ET AL, "Transfer Learning with Ensemble of Multiple Feature Representations", 2018 IEEE 16TH INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING RESEARCH, MANAGEMENT AND APPLICATIONS (SERA), IEEE, (20180613), doi:10.1109/SERA.2018.8477189, pages 54 - 61, XP033410031 [I] 1-12 * abstract; Sections I-V;; figures 1,2 *

DOI:   http://dx.doi.org/10.1109/SERA.2018.8477189
 [A]  - LI ZHIQIANG ET AL, "Heterogeneous Defect Prediction Through Multiple Kernel Learning and Ensemble Learning", 2017 IEEE INTERNATIONAL CONFERENCE ON SOFTWARE MAINTENANCE AND EVOLUTION (ICSME), IEEE, (20170917), doi:10.1109/ICSME.2017.19, pages 91 - 102, XP033248468 [A] 1-12 * abstract; Sections I and III;; figure 1 *

DOI:   http://dx.doi.org/10.1109/ICSME.2017.19
International search[A]US2017200041  (KUMAR VIPIN [US], et al) [A] 1-12 * , claims 8-18 *;
 [A]  - LI, Z. Q. et al., "Heterogeneous defect prediction through multiple kernel learning and ensemble learning", Proceedings of the 2017 IEEE International Conference on Software Maintenance and Evolution (ICSME, (20170922), doi:10.1109/ICSME.2017.19, ISBN 978-1-5386-0992-7, pages 91 - 102, XP033248468 [A] 1-12 * , p. 95, left-hand column, 11. 3-13, formulas (3), (4) *

DOI:   http://dx.doi.org/10.1109/ICSME.2017.19
 [A]  - LIN, C. K. et al., "Exploring ensemble of models in taxonomy-based cross-domain sentiment classification", Proceedings of the 23rdACMInternational Conference on Information and Knowledge Management (CIKM'14, (20141107), doi:10.1145/2661829.2662071, ISBN 978-1-4503-2598-1, pages 1279 - 1288, XP058061118 [A] 1-12 * , p. 1283, left-hand column, 11. 1-17, Formulas (1)-(3), algorithm 1 *

DOI:   http://dx.doi.org/10.1145/2661829.2662071
by applicantJP2012026982
    - Decentralized learning technique ''Decentralized X, (20200311), URL: https://www.omron.co.jp/technology/information/brand/dcx/index.html
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