blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability
Register Forum

2022.02.11

More...
blank News flashes

News flashes

New version of the European Patent Register - SPC information for Unitary Patents.

2024-03-06

More...
blank Related links

Release notes
European Patent Register Assistant
European Patent Register Resource Book
European Patent Register – pocket guide
FAQ - European Patent Register
FAQ - Register Alert
Federated Register (Flyer)
Global Dossier (Flyer)
Register events
Deep link coverage
Federated Register content
The Patent Information Tour
Fair use charter

Extract from the Register of European Patents

EP About this file: EP4130796

EP4130796 - TIME OF FLIGHT (TOF) MEASUREMENT METHOD AND APPARATUS [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  06.01.2023
Database last updated on 04.06.2024
FormerThe international publication has been made
Status updated on  25.10.2021
Most recent event   Tooltip29.03.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
Huawei Technologies Co., Ltd.
Huawei Administration Building
Bantian, Longgang District
Shenzhen, Guangdong 518129 / CN
[2023/06]
Inventor(s)01 / YU, Kai
Huawei Administration Building
Bantian, Longgang District
Shenzhen, Guangdong 518129 / CN
02 / QU, Fengguang
Huawei Administration Building
Bantian, Longgang District
Shenzhen, Guangdong 518129 / CN
03 / YU, Feng
Huawei Administration Building
Bantian, Longgang District
Shenzhen, Guangdong 518129 / CN
04 / HE, Shichuan
Huawei Administration Building
Bantian, Longgang District
Shenzhen, Guangdong 518129 / CN
05 / JIANG, Kewei
Huawei Administration Building
Bantian, Longgang District
Shenzhen, Guangdong 518129 / CN
 [2023/06]
Representative(s)Gill Jennings & Every LLP
The Broadgate Tower
20 Primrose Street
London EC2A 2ES / GB
[2023/06]
Application number, filing date21789062.312.04.2021
[2023/06]
WO2021CN86690
Priority number, dateCN20201029191014.04.2020         Original published format: CN202010291910
[2023/06]
Filing languageZH
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2021208866
Date:21.10.2021
Language:ZH
[2021/42]
Type: A1 Application with search report 
No.:EP4130796
Date:08.02.2023
Language:EN
[2023/06]
Search report(s)International search report - published on:CN21.10.2021
(Supplementary) European search report - dispatched on:EP07.08.2023
ClassificationIPC:G01S17/14, G01S7/4865, G01S7/487
[2023/36]
CPC:
G01S7/4865 (EP,CN,US); G01S17/14 (EP,CN,US); G01S7/487 (EP);
G01S7/4876 (CN,US)
Former IPC [2023/06]G01S17/14
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2023/06]
TitleGerman:FLUGZEITMESSVERFAHREN UND -VORRICHTUNG[2023/06]
English:TIME OF FLIGHT (TOF) MEASUREMENT METHOD AND APPARATUS[2023/06]
French:PROCÉDÉ ET APPAREIL DE MESURE DE TEMPS DE VOL (TOF)[2023/06]
Entry into regional phase27.10.2022Translation filed 
27.10.2022National basic fee paid 
27.10.2022Search fee paid 
27.10.2022Designation fee(s) paid 
27.10.2022Examination fee paid 
Examination procedure27.10.2022Examination requested  [2023/06]
23.02.2024Amendment by applicant (claims and/or description)
23.02.2024Date on which the examining division has become responsible
Fees paidRenewal fee
22.03.2023Renewal fee patent year 03
28.03.2024Renewal fee patent year 04
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[Y]US2018299552  (SHU MARVIN [US], et al) [Y] 5,6,14* paragraphs [0115] - [0118]; figure 6 *;
 [X]CN109752729  (UNIV ELECTRONIC SCI & TECH CHINA) [X] 1,10 * figure 1 * * the whole document *;
 [IY]US10551501  (LACHAPELLE JOSEPH G [US]) [I] 1-4,7-13,15,16 * paragraphs [0042] , [0078] , [0043] , [0064] , [0077] - [0078] - [0148] , [0159] , [0160] , [0161] , [0165] , [0171] , [0174]; figures 1,13,18a-18c,24,25 * [Y] 5,6,14
International search[A]US6873406  (HINES ROBIN H [US], et al) [A] 1-16* entire document *;
 [A]CN103913749  (SHANGHAI TECH PHYSICS INST) [A] 1-16 * entire document *;
 [A]CN108139481  (QUALCOMM INC) [A] 1-16 * entire document *;
 [A]CN108279407  (SUZHOU LEITU PHOTOELECTRIC TECH CO LTD) [A] 1-16 * entire document *;
 [X]CN109752729  (UNIV ELECTRONIC SCI & TECH CHINA) [X] 1-16 * description, paragraphs [0073]-[0103], and figures 1-8 *;
 [X]CN110609293  (SHENZHEN AORUIDA TECH CO LTD) [X] 1-16 * description, paragraphs [0039]-[0072], and figures 1-7 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.