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Extract from the Register of European Patents

EP About this file: EP4290225

EP4290225 - DIELECTRIC SPECTROSCOPIC MEASUREMENT DEVICE AND DIELECTRIC SPECTROSCOPIC MEASUREMENT METHOD [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  13.06.2025
Database last updated on 10.03.2026
FormerRequest for examination was made
Status updated on  10.11.2023
FormerThe international publication has been made
Status updated on  12.08.2022
Most recent event   Tooltip30.12.2025New entry: Renewal fee paid 
Applicant(s)For all designated states
NTT, Inc.
5-1, Otemachi 1-chome
Chiyoda-ku
Tokyo 100-8116 / JP
[2025/40]
Former [2023/50]For all designated states
Nippon Telegraph And Telephone Corporation
5-1, Otemachi 1-chome
Chiyoda-ku
Tokyo 100-8116 / JP
Inventor(s)01 / NAKAMURA Masahito
Musashino-shi, Tokyo 180-8585 / JP
02 / TAJIMA Takuro
Musashino-shi, Tokyo 180-8585 / JP
03 / SEYAMA Michiko
Musashino-shi, Tokyo 180-8585 / JP
 [2023/50]
Representative(s)Santarelli
Tour Trinity
1 bis Place de la Défense
92400 Courbevoie / FR
[N/P]
Former [2023/50]Brevalex
Tour Trinity
1 B Place de la Défense
92400 Courbevoie / FR
Application number, filing date21924645.105.02.2021
[2023/50]
WO2021JP04219
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2022168250
Date:11.08.2022
Language:JA
[2022/32]
Type: A1 Application with search report 
No.:EP4290225
Date:13.12.2023
Language:EN
[2023/50]
Search report(s)International search report - published on:JP11.08.2022
(Supplementary) European search report - dispatched on:EP25.09.2024
ClassificationIPC:G01N22/00, A61B5/1495, A61B5/0537, // A61B5/0507, A61B5/145, G01N27/02
[2024/43]
CPC:
G01N22/00 (EP,US); A61B5/0507 (EP,US); A61B5/0537 (EP,US);
A61B5/145 (EP,US); A61B5/1495 (EP,US); G01N27/026 (EP,US)
Former IPC [2023/50]G01N22/00
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2023/50]
TitleGerman:DIELEKTRISCHE SPEKTROSKOPISCHE MESSVORRICHTUNG UND DIELEKTRISCHES SPEKTROSKOPISCHES MESSVERFAHREN[2023/50]
English:DIELECTRIC SPECTROSCOPIC MEASUREMENT DEVICE AND DIELECTRIC SPECTROSCOPIC MEASUREMENT METHOD[2023/50]
French:DISPOSITIF DE MESURE SPECTROSCOPIQUE DIÉLECTRIQUE ET PROCÉDÉ DE MESURE SPECTROSCOPIQUE DIÉLECTRIQUE[2023/50]
Entry into regional phase10.08.2023Translation filed 
10.08.2023National basic fee paid 
10.08.2023Search fee paid 
10.08.2023Designation fee(s) paid 
10.08.2023Examination fee paid 
Examination procedure10.08.2023Examination requested  [2023/50]
27.02.2025Amendment by applicant (claims and/or description)
27.02.2025Date on which the examining division has become responsible
12.06.2025Despatch of a communication from the examining division (Time limit: M04)
06.10.2025Reply to a communication from the examining division
17.12.2025Despatch of a communication from the examining division (Time limit: M04)
Fees paidRenewal fee
10.08.2023Renewal fee patent year 03
28.02.2024Renewal fee patent year 04
26.02.2025Renewal fee patent year 05
30.12.2025Renewal fee patent year 06
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Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[I] JP2019190895  (NIPPON TELEGRAPH & TELEPHONE et al.) [I] 1-8 * figures 1,3 * * paragraphs [0013] , [0016] , [0019] , [0023] - [0025] - [0030] - [0031] *
 [A] JPH0843463  (HEWLETT PACKARD JAPAN LTD et al.) [A] 1-8 * figure 2 * * paragraphs [0007] - [0010] *
 [A] JPH11211766  (ADVANTEST CORP et al.) [A] 1-8 * figures 1,4 * * paragraphs [0022] - [0028] *
 [A]   ALESSANDRA LA GIOIA ET AL: "Open-Ended Coaxial Probe Technique for Dielectric Measurement of Biological Tissues: Challenges and Common Practices", DIAGNOSTICS (BASEL, SWITZERLAND), 5 June 2018 (2018-06-05), Switzerland, pages 40, XP055556648, DOI: 10.3390/diagnostics8020040 [A] 1-8 * section 4.1 *

DOI:   http://dx.doi.org/10.3390/diagnostics8020040
 [A]   PLA J ET AL: "On-wafer calibration techniques for measurement of microwave circuits and devices on thin substrates", MICROWAVE SYMPOSIUM DIGEST, 1995., IEEE MTT-S INTERNATIONAL ORLANDO, FL, USA 16-20 MAY 1995, NEW YORK, NY, USA,IEEE, US, 16 May 1995 (1995-05-16), pages 1045, XP032444924, ISBN: 978-0-7803-2581-4, DOI: 10.1109/MWSYM.1995.406151 [A] 7 * page 1046, column r *

DOI:   http://dx.doi.org/10.1109/MWSYM.1995.406151
International search[Y] JPH0843463  (HEWLETT PACKARD JAPAN LTD et al.) [Y] 1-6, 8 * paragraphs [0002], [0007]-[0010], fig. 1-2 *
 [Y] JP2005121422  (AET JAPAN KK et al.) [Y] 1-6, 8 * claim 8, fig. 1, 5B-5C *
 [Y] JP2018096806  (NIPPON TELEGRAPH & TELEPHONE et al.) [Y] 1-6, 8 * paragraphs [0041], [0045], fig. 9 *
 [Y] JP2001272428  (ADVANTEST CORP et al.) [Y] 1-6, 8 * paragraphs [0046]-[0048], fig. 6 *
 [Y] JP2003075369  (ELECTRONIC NAVIGATION RES INST et al.) [Y] 1-6, 8 * claim 1, fig. 1 *
 [A] JPH11211766  (ADVANTEST CORP et al.) [A] 1-8 * entire text, all drawings *
 [A] US2016128602  (CAYOREN MEHMET et al.) [A] 1-8 * entire text, all drawings *
 [A]   HOFMANN, MAXIMILIAN: "Microwave-Based Noninvasive Concentration Measurements for Biomedical Applications", IEEE TRANSACTIONS ON MICROWAVE THEORY AND THCHNIQUES, vol. 61, no. 5, May 2013 (2013-05-01), pages 2195 - 2204, XP055464102, DOI: 10.1109/TMTT.2013.2250516 [A] 1-8 * entire text, all drawings *

DOI:   http://dx.doi.org/10.1109/TMTT.2013.2250516
by applicantJP2013032933
   M. HOFMANNG. FISCHERR. WEIGELD. KISSINGER: "Microwave-Based Noninvasive Concentration Measurements for Biomedical Applications", IEEE TRANS. MICROWAVE THEORY AND TECHNIQUES, vol. 61, no. 5, 2013, pages 2195 - 2204
   J P. GRANTR N. CLARKEG T. SYMMN M. SPYROU: "A critical study of the open-ended coaxial line sensor technique for RF and microwave complex permittivity measurements", J. PHYS. E: SCI. INSTRUM, vol. 22, 1989, pages 757 - 770
   T.P. MARSLANDS. EVANS: "Dielectric measurements with an open-ended coaxial probe", IEE PROCEEDINGS, vol. 134, no. 4, 1987, pages 341 - 349
   ANDREJ RUMIANTSEVN.M. RIDLE: "VNA Calibration", IEEE MICROWAVE MAGAZINE, IEEE XPLORE, vol. 9, no. 3, June 2008 (2008-06-01), pages 86 - 99, XP011214626
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.