blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP4107987

EP4107987 - A METHOD FOR RADIO ACCESS NETWORK VISIBLE QUALITY OF EXPERIENCE MEASUREMENT OF DUAL CONNECTIVITY [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  25.11.2022
Database last updated on 05.10.2024
FormerThe international publication has been made
Status updated on  10.10.2022
Formerunknown
Status updated on  23.09.2022
Most recent event   Tooltip09.07.2024The date on which the examining division becomes responsible, has been established 
09.07.2024Amendment by applicant 
Applicant(s)For all designated states
ZTE Corporation
ZTE Plaza
Keji Road South
Hi-Tech Industrial Park
Nanshan
Shenzhen, Guangdong 518057 / CN
[2022/52]
Inventor(s)01 / LIU, Zhuang
Shenzhen, Guangdong 518057 / CN
02 / LI, Dapeng
Shenzhen, Guangdong 518057 / CN
03 / GAO, Yin
Shenzhen, Guangdong 518057 / CN
 [2022/52]
Representative(s)Vossius & Partner Patentanwälte Rechtsanwälte mbB
Siebertstraße 3
81675 München / DE
[2022/52]
Application number, filing date21930622.231.03.2021
[2022/52]
WO2021CN84515
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2022205120
Date:06.10.2022
Language:EN
[2022/40]
Type: A1 Application with search report 
No.:EP4107987
Date:28.12.2022
Language:EN
The application published by WIPO in one of the EPO official languages on 06.10.2022 takes the place of the publication of the European patent application.
[2022/52]
Search report(s)International search report - published on:CN06.10.2022
(Supplementary) European search report - dispatched on:EP24.01.2024
ClassificationIPC:H04W24/10
[2022/52]
CPC:
H04W24/10 (EP,US); H04L41/5067 (US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2022/52]
TitleGerman:VERFAHREN ZUR MESSUNG DER SICHTBAREN ERFAHRUNGSQUALITÄT VON DUALER KONNEKTIVITÄT IN EINEM FUNKZUGANGSNETZWERK[2022/52]
English:A METHOD FOR RADIO ACCESS NETWORK VISIBLE QUALITY OF EXPERIENCE MEASUREMENT OF DUAL CONNECTIVITY[2022/52]
French:PROCÉDÉ DE MESURE DE QUALITÉ D'EXPÉRIENCE VISIBLE DE RÉSEAU D'ACCÈS RADIO DE CONNECTIVITÉ DOUBLE[2022/52]
Entry into regional phase23.09.2022National basic fee paid 
23.09.2022Search fee paid 
23.09.2022Designation fee(s) paid 
23.09.2022Examination fee paid 
Examination procedure23.09.2022Examination requested  [2022/52]
05.07.2024Amendment by applicant (claims and/or description)
05.07.2024Date on which the examining division has become responsible
Fees paidRenewal fee
13.12.2022Renewal fee patent year 03
03.01.2024Renewal fee patent year 04
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[IY]CN111432419  (ZTE CORP);
 [XYI]WO2020151731  (QUALCOMM INC [US], et al);
 [A]CN112533227  (HUAWEI TECH CO LTD);
 [T]EP3910987  (ZTE CORP [CN]);
 [T]EP4024941  (HUAWEI TECH CO LTD [CN])
International search[A]US2019230551  (VIKBERG JARI [SE], et al);
 [XY]WO2020151731  (QUALCOMM INC [US], et al);
 [Y]CN112351442  (HUAWEI TECH CO LTD);
 [A]CN112533227  (HUAWEI TECH CO LTD);
by applicantCN111432419
 WO2020151731
 CN112533227
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.