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EP4198989
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EP About this file: EP4198989
| EP4198989 - OSCILLATION PERIOD MEASUREMENT CIRCUIT AND METHOD, AND SEMICONDUCTOR MEMORY [Right-click to bookmark this link] | Status | Request for examination was made Status updated on 19.05.2023 Database last updated on 19.07.2024 | |
| Former | The international publication has been made Status updated on 03.03.2023 | Most recent event Tooltip | 16.04.2024 | Supplementary search report | published on 15.05.2024 [2024/20] | Applicant(s) | For all designated states Changxin Memory Technologies, Inc. No. 388, Xingye Avenue Airport Industrial Park Economic and Technological Development Area Hefei, Anhui 230000 / CN | [2023/25] | Inventor(s) | 01 /
ZHANG, Zhiqiang Hefei, Anhui 230000 / CN | [2023/25] | Representative(s) | Gulde & Partner Patent- und Rechtsanwaltskanzlei mbB Wallstraße 58/59 10179 Berlin / DE | [2023/25] | Application number, filing date | 21954782.5 | 03.11.2021 | [2023/25] | WO2021CN128356 | Priority number, date | CN202110993836 | 27.08.2021 Original published format: CN202110993836 | [2023/25] | Filing language | ZH | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2023024262 | Date: | 02.03.2023 | Language: | ZH | [2023/09] | Type: | A1 Application with search report | No.: | EP4198989 | Date: | 21.06.2023 | Language: | EN | [2023/25] | Search report(s) | International search report - published on: | CN | 02.03.2023 | (Supplementary) European search report - dispatched on: | EP | 15.04.2024 | Classification | IPC: | H03K5/26, H03K5/19, // G01R23/10, G01R31/317 | [2024/20] | CPC: |
H03K5/19 (EP,KR);
G01R31/31727 (EP,KR,US);
H03K19/20 (US);
H03K3/037 (US);
H03K5/26 (EP);
G01R23/10 (EP)
|
| Former IPC [2023/25] | G11C29/50 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2023/25] | Extension states | BA | Not yet paid | ME | Not yet paid | Validation states | KH | Not yet paid | MA | Not yet paid | MD | Not yet paid | TN | Not yet paid | Title | German: | SCHALTUNG UND VERFAHREN ZUR MESSUNG DER OSZILLATIONSPERIODE UND HALBLEITERSPEICHER | [2023/25] | English: | OSCILLATION PERIOD MEASUREMENT CIRCUIT AND METHOD, AND SEMICONDUCTOR MEMORY | [2023/25] | French: | CIRCUIT ET PROCÉDÉ DE MESURE DE PÉRIODE D'OSCILLATION, ET MÉMOIRE À SEMI-CONDUCTEURS | [2023/25] | Entry into regional phase | 16.03.2023 | Translation filed | 16.03.2023 | National basic fee paid | 16.03.2023 | Search fee paid | 16.03.2023 | Designation fee(s) paid | 16.03.2023 | Examination fee paid | Examination procedure | 16.03.2023 | Amendment by applicant (claims and/or description) | 16.03.2023 | Examination requested [2023/25] | Fees paid | Renewal fee | 24.11.2023 | Renewal fee patent year 03 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [XAI]US5487097 (HATAKENAKA MAKOTO [JP], et al); | [A]US2018059159 (HSU CHIH CHENG [TW], et al) |