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Extract from the Register of European Patents

EP About this file: EP4080414

EP4080414 - SYSTEMS AND METHODS FOR IDENTIFYING MANUFACTURING DEFECTS [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  02.12.2022
Database last updated on 28.06.2024
FormerThe application has been published
Status updated on  23.09.2022
Most recent event   Tooltip13.03.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
Samsung Display Co., Ltd.
1, Samsung-ro
Giheung-gu
Yongin-si, Gyeonggi-do 17113 / KR
[2022/43]
Inventor(s)01 / QU, Shuhui
Fremont, 94536 / US
02 / LEE, Janghwan
Pleasanton, 94588 / US
03 / KANG, Yan
Sunnyvale, 94065 / US
 [2022/43]
Representative(s)Marks & Clerk LLP
15 Fetter Lane
London EC4A 1BW / GB
[2022/43]
Application number, filing date22159396.501.03.2022
[2022/43]
Priority number, dateUS202163179111P23.04.2021         Original published format: US 202163179111 P
US20211731780611.05.2021         Original published format: US202117317806
[2022/43]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP4080414
Date:26.10.2022
Language:EN
[2022/43]
Search report(s)(Supplementary) European search report - dispatched on:EP26.07.2022
ClassificationIPC:G06N3/04, G06N3/08, G06N20/00, // G06N5/00
[2022/43]
CPC:
G06N20/00 (EP); G06N20/20 (KR); G06N3/08 (EP,CN,KR,US);
G06N3/045 (EP,KR,US); G06T7/0004 (KR); G06V10/764 (KR);
G06N5/01 (EP); G06T2207/20081 (KR); G06T2207/20084 (KR);
G06T2207/30168 (KR) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2023/01]
Former [2022/43]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:SYSTEME UND VERFAHREN ZUR IDENTIFIZIERUNG VON HERSTELLUNGSFEHLERN[2022/43]
English:SYSTEMS AND METHODS FOR IDENTIFYING MANUFACTURING DEFECTS[2022/43]
French:SYSTÈMES ET PROCÉDÉS PERMETTANT D'IDENTIFIER DES DÉFAUTS DE FABRICATION[2022/43]
Examination procedure01.12.2022Amendment by applicant (claims and/or description)
01.12.2022Examination requested  [2023/01]
01.12.2022Date on which the examining division has become responsible
Fees paidRenewal fee
13.03.2024Renewal fee patent year 03
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Documents cited:Search[A]WO2020073737  (UNIV ZHEJIANG [CN]) [A] 1-15* the whole document *;
 [I]CN111044525  (GOERTEK INC) [I] 1-15 * paragraph [0017]; figures 1,2 * * paragraph [0034] - paragraph [0041] * * paragraph [0052] - paragraph [0063] *;
 [A]US2021102527  (LIU XIN [HK], et al) [A] 1-15 * the whole document *;
 [IP]US2021374941  (LIU JIE [CN], et al) [IP] 1-15 * figures 1,2 * * paragraph [0017] * * paragraph [0034] - paragraph [0041] * * paragraph [0052] - paragraph [0063] *
by applicantUS19370173067
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