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Extract from the Register of European Patents

EP About this file: EP4060330

EP4060330 - X-RAY INSPECTION APPARATUS [Right-click to bookmark this link]
StatusThe patent has been granted
Status updated on  29.03.2024
Database last updated on 17.09.2024
FormerGrant of patent is intended
Status updated on  18.10.2023
FormerRequest for examination was made
Status updated on  17.03.2023
FormerThe application has been published
Status updated on  19.08.2022
Most recent event   Tooltip29.03.2024(Expected) grantpublished on 01.05.2024  [2024/18]
Applicant(s)For all designated states
ISHIDA CO., Ltd.
44, Sanno-cho, Shogoin
Sakyo-ku
Kyoto-shi, Kyoto 606-8392 / JP
[2024/18]
Former [2022/38]For all designated states
ISHIDA CO., Ltd.
44, Sanno-cho
Shogoin
Sakyo-ku
Kyoto-shi
Kyoto 606-8392 / JP
Inventor(s)01 / HORI, Hiroshi
Shiga, 520-3026 / JP
 [2022/38]
Representative(s)Gill Jennings & Every LLP
The Broadgate Tower
20 Primrose Street
London EC2A 2ES / GB
[2022/38]
Application number, filing date22161763.214.03.2022
[2022/38]
Priority number, dateJP2021004565919.03.2021         Original published format: JP 2021045659
[2022/38]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP4060330
Date:21.09.2022
Language:EN
[2022/38]
Type: B1 Patent specification 
No.:EP4060330
Date:01.05.2024
Language:EN
[2024/18]
Search report(s)(Supplementary) European search report - dispatched on:EP27.07.2022
ClassificationIPC:G01N23/18
[2022/38]
CPC:
G01N23/18 (EP,KR); G01N23/04 (CN,KR,US); G01N23/083 (KR);
G01V5/20 (US); G21F3/00 (CN,KR,US); G01N2223/1016 (CN,KR);
G01N2223/30 (US); G01N2223/317 (EP); G01N2223/3307 (KR);
G01N2223/40 (US); G01N2223/618 (EP); G01N2223/643 (EP);
G01N2223/646 (KR); G01N2223/652 (EP,KR) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2023/16]
Former [2022/38]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
TitleGerman:RÖNTGENPRÜFVORRICHTUNG[2022/38]
English:X-RAY INSPECTION APPARATUS[2022/38]
French:APPAREIL À RAYONS X[2022/38]
Examination procedure15.03.2023Amendment by applicant (claims and/or description)
15.03.2023Examination requested  [2023/16]
15.03.2023Date on which the examining division has become responsible
19.10.2023Communication of intention to grant the patent
16.02.2024Fee for grant paid
16.02.2024Fee for publishing/printing paid
16.02.2024Receipt of the translation of the claim(s)
Fees paidRenewal fee
27.03.2024Renewal fee patent year 03
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Documents cited:Search[YA]JP2003107016  (ANRITSU CORP);
 [A]JP2003185602  (SHIMADZU CORP);
 [XYI]JP2004233206  (ANRITSU SANKI SYS CO LTD)
by applicantJP2007183201
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.