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Extract from the Register of European Patents

EP About this file: EP4377703

EP4377703 - METHOD FOR THE SELF-DIAGNOSIS OF A CIRCUIT FOR MEASURING THE INSULATION RESISTANCE OF A HIGH-VOLTAGE SYSTEM [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  03.05.2024
Database last updated on 05.10.2024
FormerThe international publication has been made
Status updated on  03.02.2023
Formerunknown
Status updated on  05.08.2022
Most recent event   Tooltip03.10.2024Change: Validation statespublished on 06.11.2024 [2024/45]
03.10.2024Change - extension statespublished on 06.11.2024 [2024/45]
Applicant(s)For all designated states
Sensor-Technik Wiedemann GmbH
Am Bärenwald 6
87600 Kaufbeuren / DE
[2024/23]
Inventor(s)01 / SCHUSTER, Franz-Josef
87653 Eggenthal / DE
 [2024/23]
Representative(s)Glück Kritzenberger Patentanwälte PartGmbB
Franz-Mayer-Str. 16a
93053 Regensburg / DE
[2024/23]
Application number, filing date22744466.815.07.2022
[2024/23]
WO2022EP69833
Priority number, dateDE20211011983030.07.2021         Original published format: DE102021119830
[2024/23]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO2023006443
Date:02.02.2023
Language:DE
[2023/05]
Type: A1 Application with search report 
No.:EP4377703
Date:05.06.2024
Language:DE
The application published by WIPO in one of the EPO official languages on 02.02.2023 takes the place of the publication of the European patent application.
[2024/23]
Search report(s)International search report - published on:EP02.02.2023
ClassificationIPC:G01R27/02, G01R35/00
[2024/23]
CPC:
G01R27/025 (EP); G01R35/00 (EP)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2024/23]
TitleGerman:VERFAHREN ZUR EIGENDIAGNOSE EINER SCHALTUNG ZUR ISOLATIONSWIDERSTANDSMESSUNG EINES HOCHSPANNUNGSSYSTEMS[2024/23]
English:METHOD FOR THE SELF-DIAGNOSIS OF A CIRCUIT FOR MEASURING THE INSULATION RESISTANCE OF A HIGH-VOLTAGE SYSTEM[2024/23]
French:PROCÉDÉ D'AUTO-DIAGNOSTIC D'UN CIRCUIT POUR LA MESURE DE LA RÉSISTANCE D'ISOLEMENT D'UN SYSTÈME HAUTE TENSION[2024/23]
Entry into regional phase31.01.2024National basic fee paid 
31.01.2024Designation fee(s) paid 
31.01.2024Examination fee paid 
Examination procedure31.01.2024Examination requested  [2024/23]
31.01.2024Date on which the examining division has become responsible
25.09.2024Despatch of communication that the application is deemed to be withdrawn, reason: reply to the Extended European Search Report/Written Opinion of the International Searching Authority/International Preliminary Examination Report/Supplementary international search report not received in time
Fees paidRenewal fee
31.01.2024Renewal fee patent year 03
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Cited inInternational search[Y]KR20130112495  (LG CHEMICAL LTD [KR]);
 [A]KR20130112496  (LG CHEMICAL LTD [KR]);
 [A]DE102016122115  (DRAEXLMAIER LISA GMBH [DE]);
 [Y]CN108333548  (NINGDE CONTEMPORARY AMPEREX TECH CO LTD);
 [A]CN109100618  (UNITED AUTOMOTIVE ELECT SYS CO);
 [IY]WO2021051947  (CONTEMPORARY AMPEREX TECHNOLOGY CO LTD [CN]);
 [A]WO2021085893  (LG CHEMICAL LTD [KR])
by applicantEP1857825
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.