blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP4220108

EP4220108 - METHOD AND DEVICE FOR DETECTING ABSOLUTE OR RELATIVE TEMPERATURE AND/OR ABSOLUTE OR RELATIVE WAVELENGTH [Right-click to bookmark this link]
StatusThe patent has been granted
Status updated on  01.03.2024
Database last updated on 19.10.2024
FormerGrant of patent is intended
Status updated on  17.12.2023
FormerRequest for examination was made
Status updated on  27.10.2023
FormerThe application has been published
Status updated on  30.06.2023
Most recent event   Tooltip27.09.2024Lapse of the patent in a contracting statepublished on 30.10.2024 [2024/44]
Applicant(s)For all designated states
Adtran Networks SE
Märzenquelle 1-3
98617 Meiningen / DE
[2023/49]
Former [2023/31]For all designated states
ADVA Optical Networking SE
Märzenquelle 1 - 3
98617 Meiningen / DE
Inventor(s)01 / Wohlfeil, Benjamin
10715 Berlin / DE
02 / Mehrpoor, Gilda
98617 Meiningen / DE
 [2023/31]
Representative(s)Eder Schieschke & Partner mbB
Patentanwälte
Elisabethstraße 34
80796 München / DE
[N/P]
Former [2023/31]Eder, Thomas
Eder Schieschke & Partner mbB
Patentanwälte
Elisabethstrasse 34/II
80796 München / DE
Application number, filing date23176852.409.12.2020
[2023/31]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP4220108
Date:02.08.2023
Language:EN
[2023/31]
Type: B1 Patent specification 
No.:EP4220108
Date:03.04.2024
Language:EN
[2024/14]
Search report(s)(Supplementary) European search report - dispatched on:EP26.06.2023
ClassificationIPC:G01K11/00, G02B6/293, H01S5/0687, // H01S5/068, H01S5/0683
[2023/31]
CPC:
H01S5/0687 (EP,US); G01M11/0207 (US); G01J9/0246 (US);
G01K11/00 (EP); G01K11/32 (US); G01M11/0228 (US);
G01M11/33 (US); G02B6/29338 (EP); G02B6/29395 (EP);
H01S5/0683 (US); H01S5/06837 (EP,US); H01S5/06804 (EP) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2023/48]
Former [2023/31]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
TitleGerman:VERFAHREN UND VORRICHTUNG ZUR ERFASSUNG DER ABSOLUTEN ODER RELATIVEN TEMPERATUR UND/ODER DER ABSOLUTEN ODER RELATIVEN WELLENLÄNGE[2023/31]
English:METHOD AND DEVICE FOR DETECTING ABSOLUTE OR RELATIVE TEMPERATURE AND/OR ABSOLUTE OR RELATIVE WAVELENGTH[2023/31]
French:PROCÉDÉ ET DISPOSITIF DE DÉTECTION DE TEMPÉRATURE ABSOLUE OU RELATIVE ET/OU DE LONGUEUR D'ONDE ABSOLUE OU RELATIVE[2023/31]
Examination procedure26.10.2023Amendment by applicant (claims and/or description)
26.10.2023Examination requested  [2023/48]
26.10.2023Date on which the examining division has become responsible
18.12.2023Communication of intention to grant the patent
22.02.2024Fee for grant paid
22.02.2024Fee for publishing/printing paid
22.02.2024Receipt of the translation of the claim(s)
Parent application(s)   TooltipEP20212879.9  / EP4012854
Fees paidRenewal fee
01.06.2023Renewal fee patent year 03
25.12.2023Renewal fee patent year 04
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipNL03.04.2024
[2024/44]
Documents cited:Search[IA]US6243506  (WU JING-SHOWN [TW], et al) [I] 1-3,5-7,9 * column 3, line 4 - column 5, line 30; figures 1-6 * [A] 4,8;
 [A]US2011103415  (RASRAS MAHMOUD [US]) [A] 1-9* paragraph [0020] - paragraph [0054]; figures 1-5 *;
 [A]US9726553  (AHMED ZEESHAN [US], et al) [A] 1-9 * column 3, line 31 - column 15, line 33; figures 1-20 *
by applicant   - "Temperature optical sensor based on a silicon bimodal Y branch", BREGLIO, GIOVANNI et al., Silicon-based and Hybrid Optoelectronics III, International Society for Optics and Photonics, (20010000), vol. 4293
    - IRACE, ANDREAGIOVANNI BREGLIO, "All-silicon optical temperature sensor based on Multi-Mode Interference", Optics express, (20030000), vol. 11, no. 22, pages 2807 - 2812
    - KIM, GUN-DUK et al., "Silicon photonic temperature sensor employing a ring resonator manufactured using a standard CMOS process", Optics express, (20100000), vol. 18, no. 21, doi:10.1364/OE.18.022215, pages 22215 - 22221, XP055806475

DOI:   http://dx.doi.org/10.1364/OE.18.022215
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.