blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP4273536

EP4273536 - SYSTEMS AND METHODS FOR THE DETECTION AND ANALYSIS OF FREE THIOL [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  14.06.2024
Database last updated on 13.09.2024
FormerThe application has been published
Status updated on  06.10.2023
Most recent event   Tooltip27.08.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
ProteinSimple
3001 Orchard Parkway
San Jose, CA 95134 / US
[2023/45]
Inventor(s)01 / MCELROY, James
San Jose, 95124 / US
02 / HEGER, Christopher
Campbell, 95008 / US
 [2023/45]
Representative(s)Gill Jennings & Every LLP
The Broadgate Tower
20 Primrose Street
London EC2A 2ES / GB
[2023/45]
Application number, filing date23183319.523.08.2019
[2023/45]
Priority number, dateUS201862722012P23.08.2018         Original published format: US 201862722012 P
[2023/45]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP4273536
Date:08.11.2023
Language:EN
[2023/45]
Type: A3 Search report 
No.:EP4273536
Date:13.12.2023
Language:EN
[2023/50]
Search report(s)(Supplementary) European search report - dispatched on:EP13.11.2023
ClassificationIPC:C40B30/04, G01N21/33, G01N21/64, G01N33/68, G01N33/58
[2023/50]
CPC:
G01N33/6815 (EP,CN); G01N21/33 (CN); G01N21/6428 (EP,CN,US);
G01N33/582 (EP,CN,US); G01N33/68 (CN); G01N33/6854 (CN);
G01N2021/6439 (CN); G01N2440/20 (EP,US); G01N2500/00 (CN,US) (-)
Former IPC [2023/45]G01N21/64
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2024/29]
Former [2023/45]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
TitleGerman:SYSTEME UND VERFAHREN ZUR DETEKTION UND ANALYSE VON FREIEM THIOL[2023/45]
English:SYSTEMS AND METHODS FOR THE DETECTION AND ANALYSIS OF FREE THIOL[2023/45]
French:SYSTÈMES ET PROCÉDÉS DE DÉTECTION ET D'ANALYSE DE THIOL LIBRE[2023/45]
Examination procedure13.06.2024Amendment by applicant (claims and/or description)
13.06.2024Examination requested  [2024/29]
13.06.2024Date on which the examining division has become responsible
Parent application(s)   TooltipEP19851480.4  / EP3841234
Fees paidRenewal fee
04.07.2023Renewal fee patent year 03
04.07.2023Renewal fee patent year 04
04.07.2023Renewal fee patent year 05
27.08.2024Renewal fee patent year 06
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]US5951981  (MARKLAND JR FRANCIS S [US], et al);
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.