Extract from the Register of European Patents

EP About this file: EP4657013

EP4657013 - LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  31.10.2025
Database last updated on 31.03.2026
FormerThe international publication has been made
Status updated on  03.08.2024
Most recent event   Tooltip27.03.2026Change: Validation statespublished on 29.04.2026 [2026/18]
27.03.2026Change - extension statespublished on 29.04.2026 [2026/18]
Applicant(s)For all designated states
HITACHI HIGH-TECH CORPORATION
17-1, Toranomon 1-chome
Minato-ku
Tokyo 105-6409 / JP
[2025/49]
Inventor(s)01 / MINEMURA Hiroyuki
Tokyo 100-8280 / JP
02 / ANZAI Yumiko
Tokyo 100-8280 / JP
 [2025/49]
Representative(s)MERH-IP Matias Erny Reichl Hoffmann Patentanwälte PartG mbB
Paul-Heyse-Straße 29
80336 München / DE
[2025/49]
Application number, filing date23918528.310.11.2023
[2025/49]
WO2023JP40642
Priority number, dateJP2023000951625.01.2023         Original published format: JP 2023009516
[2025/49]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2024157573
Date:02.08.2024
Language:JA
[2024/31]
Type: A1 Application with search report 
No.:EP4657013
Date:03.12.2025
Language:EN
[2025/49]
Search report(s)International search report - published on:JP02.08.2024
ClassificationIPC:G01B11/08
[2025/49]
CPC:
G01N15/1429 (EP); G01N15/0227 (EP); G01N15/1425 (EP);
G01N15/1433 (EP); G01N2015/1493 (EP)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   ME,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2025/49]
TitleGerman:LICHTMESSVORRICHTUNG UND LICHTMESSVERFAHREN[2025/49]
English:LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD[2025/49]
French:DISPOSITIF DE MESURE DE LUMIÈRE ET PROCÉDÉ DE MESURE DE LUMIÈRE[2025/49]
Entry into regional phase09.05.2025Translation filed 
25.08.2025National basic fee paid 
25.08.2025Search fee paid 
25.08.2025Designation fee(s) paid 
25.08.2025Examination fee paid 
Examination procedure09.05.2025Amendment by applicant (claims and/or description)
25.08.2025Examination requested  [2025/49]
Fees paidRenewal fee
01.12.2025Renewal fee patent year 03
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Cited inInternational search[AY] JP2003131151  (CANON KK et al.) [A] 3 [Y] 1-2, 4-12
 [AY] WO2020144754  (HITACHI HIGH TECH CORP et al.) [A] 3 [Y] 1-2, 4-12
 [A] JP2005242037  (CANON KK et al.) [A] 1-12 * paragraphs [0001]-[0106], fig. 1-17 *
by applicantJP2017102032
 WO2020144754
 JP2011154312
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