| EP4657013 - LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD [Right-click to bookmark this link] | Status | Request for examination was made Status updated on 31.10.2025 Database last updated on 31.03.2026 | |
| Former | The international publication has been made Status updated on 03.08.2024 | Most recent event Tooltip | 27.03.2026 | Change: Validation states | published on 29.04.2026 [2026/18] | 27.03.2026 | Change - extension states | published on 29.04.2026 [2026/18] | Applicant(s) | For all designated states HITACHI HIGH-TECH CORPORATION 17-1, Toranomon 1-chome Minato-ku Tokyo 105-6409 / JP | [2025/49] | Inventor(s) | 01 /
MINEMURA Hiroyuki Tokyo 100-8280 / JP | 02 /
ANZAI Yumiko Tokyo 100-8280 / JP | [2025/49] | Representative(s) | MERH-IP Matias Erny Reichl Hoffmann Patentanwälte PartG mbB Paul-Heyse-Straße 29 80336 München / DE | [2025/49] | Application number, filing date | 23918528.3 | 10.11.2023 | [2025/49] | WO2023JP40642 | Priority number, date | JP20230009516 | 25.01.2023 Original published format: JP 2023009516 | [2025/49] | Filing language | JA | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2024157573 | Date: | 02.08.2024 | Language: | JA | [2024/31] | Type: | A1 Application with search report | No.: | EP4657013 | Date: | 03.12.2025 | Language: | EN | [2025/49] | Search report(s) | International search report - published on: | JP | 02.08.2024 | Classification | IPC: | G01B11/08 | [2025/49] | CPC: |
G01N15/1429 (EP);
G01N15/0227 (EP);
G01N15/1425 (EP);
G01N15/1433 (EP);
G01N2015/1493 (EP)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, ME, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2025/49] | Title | German: | LICHTMESSVORRICHTUNG UND LICHTMESSVERFAHREN | [2025/49] | English: | LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD | [2025/49] | French: | DISPOSITIF DE MESURE DE LUMIÈRE ET PROCÉDÉ DE MESURE DE LUMIÈRE | [2025/49] | Entry into regional phase | 09.05.2025 | Translation filed | 25.08.2025 | National basic fee paid | 25.08.2025 | Search fee paid | 25.08.2025 | Designation fee(s) paid | 25.08.2025 | Examination fee paid | Examination procedure | 09.05.2025 | Amendment by applicant (claims and/or description) | 25.08.2025 | Examination requested [2025/49] | Fees paid | Renewal fee | 01.12.2025 | Renewal fee patent year 03 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [AY] JP2003131151 (CANON KK et al.) [A] 3 [Y] 1-2, 4-12 | [AY] WO2020144754 (HITACHI HIGH TECH CORP et al.) [A] 3 [Y] 1-2, 4-12 | [A] JP2005242037 (CANON KK et al.) [A] 1-12 * paragraphs [0001]-[0106], fig. 1-17 * | by applicant | JP2017102032 | WO2020144754 | JP2011154312 |