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EP4575475
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EP About this file: EP4575475
| EP4575475 - SYSTEMS AND METHODS FOR ANALYZING A SAMPLE USING CHARGED PARTICLE BEAMS AND ACTIVE PIXEL CONTROL SENSORS [Right-click to bookmark this link] | Status | Grant of patent is intended Status updated on 22.03.2026 Database last updated on 28.03.2026 | |
| Former | Request for examination was made Status updated on 28.11.2025 | ||
| Former | The application has been published Status updated on 23.05.2025 | Most recent event Tooltip | 22.03.2026 | New entry: Communication of intention to grant a patent | Applicant(s) | For all designated states FEI COMPANY 5350 NE Dawson Creek Drive Hillsboro, OR 97124 / US | [2025/26] | Inventor(s) | 01 /
STRAKA, Branislav Hillsboro, 97124 / US | 02 /
STEJSKAL, Pavel Hillsboro, 97124 / US | 03 /
VYSTAVEL, Tomas Hillsboro, 97124 / US | 04 /
HOLZER, Jakub Hillsboro, 97124 / US | [2025/26] | Representative(s) | Boult Wade Tennant LLP Salisbury Square House 8 Salisbury Square London EC4Y 8AP / GB | [2025/26] | Application number, filing date | 24218633.6 | 10.12.2024 | [2025/26] | Priority number, date | US202318545447 | 19.12.2023 Original published format: US202318545447 | [2025/26] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP4575475 | Date: | 25.06.2025 | Language: | EN | [2025/26] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 25.04.2025 | Classification | IPC: | G01N23/2251, H01J37/244, H01J37/28 | [2026/16] | CPC: |
G01N23/2251 (EP);
G01N23/203 (CN);
H01J37/244 (EP,US);
H01J37/28 (EP);
G01N2223/413 (EP);
G01N2223/418 (EP);
H01J2237/2441 (EP,US);
H01J2237/24475 (EP);
H01J2237/2448 (EP);
H01J2237/24495 (EP,US)
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| Former IPC [2025/26] | G01N23/2251, H01J37/244 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, ME, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2025/26] | Extension states | BA | Not yet paid | Validation states | GE | Not yet paid | KH | Not yet paid | MA | Not yet paid | MD | Not yet paid | TN | Not yet paid | Title | German: | SYSTEME UND VERFAHREN ZUR ANALYSE EINER PROBE MIT GELADENEN TEILCHENSTRAHLEN UND AKTIVEN PIXELSTEUERUNGSSENSOREN | [2025/26] | English: | SYSTEMS AND METHODS FOR ANALYZING A SAMPLE USING CHARGED PARTICLE BEAMS AND ACTIVE PIXEL CONTROL SENSORS | [2025/26] | French: | SYSTÈMES ET PROCÉDÉS D'ANALYSE D'UN ÉCHANTILLON À L'AIDE DE FAISCEAUX DE PARTICULES CHARGÉES ET DE CAPTEURS À PIXELS ACTIFS COMMANDÉS | [2025/26] | Examination procedure | 25.11.2025 | Examination requested [2026/01] | 25.11.2025 | Date on which the examining division has become responsible | 23.03.2026 | Communication of intention to grant the patent |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A] FARUQI ET AL: "Electronic detectors for electron microscopy", CURRENT OPINION IN STRUCTURAL BIOLOGY, ELSEVIER LTD, GB, vol. 17, no. 5, 29 October 2007 (2007-10-29), pages 549 - 555, XP022324278, ISSN: 0959-440X, DOI: 10.1016/J.SBI.2007.08.014 DOI: http://dx.doi.org/10.1016/j.sbi.2007.08.014 | [A] STUART I. WRIGHT ET AL: "Electron imaging with an EBSD detector", ULTRAMICROSCOPY, vol. 148, 23 October 2014 (2014-10-23), NL, pages 132 - 145, XP055763084, ISSN: 0304-3991, DOI: 10.1016/j.ultramic.2014.10.002 [A] 1-15 * abstract * * page 550, column right, paragraph 2 - page 551, column left, paragraph 1 * * figure 1 * DOI: http://dx.doi.org/10.1016/j.ultramic.2014.10.002 | [A] SCHWARZER ROBERT A ET AL: "Backscattered Electron Imaging with an EBSD Detector", MICROSCOPY TODAY, vol. 23, no. 1, 31 January 2015 (2015-01-31), pages 12 - 17, XP093268343, DOI: 10.1017/S1551929514001333 [A] 1-15 * abstract * * page 134, column left, paragraph 3 - page 135, column right, paragraph 2 * * figures 2,3 * | by applicant | US11114275 |