blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP0021148

EP0021148 - Method and device for interferometric measurement [Right-click to bookmark this link]
StatusThe application has been refused
Status updated on  15.11.1983
Database last updated on 07.10.2024
Most recent event   Tooltip14.08.2009Change - representativepublished on 16.09.2009  [2009/38]
Applicant(s)For all designated states
International Business Machines Corporation
New Orchard Road
Armonk, NY 10504 / US
[N/P]
Former [1981/01]For all designated states
International Business Machines Corporation
Old Orchard Road
Armonk, N.Y. 10504 / US
Inventor(s)01 / Makosch, Günter
Stuttgarter Strasse 40
D-7032 Sindelfingen-Maichingen / DE
[1981/01]
Representative(s)Teufel, Fritz
IBM Deutschland Management & Business Support GmbH
Patentwesen u. Urheberrecht
71137 Ehningen / DE
[N/P]
Former [2009/38]Teufel, Fritz
IBM Deutschland Management & Business Support GmbH Patentwesen u. Urheberrecht
71137 Ehningen / DE
Former [2008/37]Teufel, Fritz
IBM Deutschland GmbH Intellectual Property
70548 Stuttgart / DE
Former [1981/01]Teufel, Fritz, Dipl.-Phys.
IBM Deutschland Informationssysteme GmbH Patentwesen und Urheberrecht Pascalstrasse 100
W-7000 Stuttgart 80 / DE
Application number, filing date80103087.503.06.1980
[1981/01]
Priority number, dateDE1979292511722.06.1979         Original published format: DE 2925117
[1981/01]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP0021148
Date:07.01.1981
Language:DE
[1981/01]
Search report(s)(Supplementary) European search report - dispatched on:EP02.10.1980
ClassificationIPC:G01B9/02, G01B11/30
[1981/01]
CPC:
G01B11/306 (EP,US); G01B9/02015 (EP,US); G01B2290/70 (EP,US)
Designated contracting statesDE,   FR,   GB [1981/01]
TitleGerman:Verfahren und Einrichtung zur interferometrischen Messung[1981/01]
English:Method and device for interferometric measurement[1981/01]
French:Procédé et dispositif de mesure interférométrique[1981/01]
File destroyed:18.06.1989
Examination procedure31.03.1981Examination requested  [1981/23]
10.12.1981Despatch of a communication from the examining division (Time limit: M04)
11.02.1982Reply to a communication from the examining division
18.03.1982Despatch of a communication from the examining division (Time limit: M04)
16.07.1982Reply to a communication from the examining division
28.12.1982Despatch of a communication from the examining division (Time limit: M04)
20.01.1983Reply to a communication from the examining division
14.02.1983Despatch of a communication from the examining division (Time limit: M02)
19.04.1983Reply to a communication from the examining division
28.07.1983Despatch of communication that the application is refused, reason: substantive examination [1984/03]
07.10.1983Application refused, date of legal effect [1984/03]
Fees paidRenewal fee
23.06.1982Renewal fee patent year 03
21.06.1983Renewal fee patent year 04
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:SearchGB717233  [ ] (FRANCIS HUGHES SMITH, et al);
 US3666371  [ ] (LANG HENDRIK DE);
 DE2518047  [ ] (VICKERS LTD)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.