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Extract from the Register of European Patents

EP About this file: EP0034244

EP0034244 - Non-destructive read-out one-FET cell memory matrix [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  02.08.1983
Database last updated on 10.07.2024
Most recent event   Tooltip07.07.2007Change - inventorpublished on 08.08.2007  [2007/32]
Applicant(s)For all designated states
International Business Machines Corporation
New Orchard Road
Armonk, NY 10504 / US
[N/P]
Former [1981/34]For all designated states
International Business Machines Corporation
Old Orchard Road
Armonk, N.Y. 10504 / US
Inventor(s)01 / Thomas, Donald Ralph
Birch Ridge Road
Westford Vermont 05468 / US
[1981/34]
Representative(s)Jost, Ottokarl
IBM Deutschland Informationssysteme GmbH Patentwesen und Urheberrecht Pascalstrasse 100
W-7000 Stuttgart 80 / DE
[N/P]
Former [1981/34]Jost, Ottokarl, Dipl.-Ing.
IBM Deutschland Informationssysteme GmbH Patentwesen und Urheberrecht Pascalstrasse 100
W-7000 Stuttgart 80 / DE
Application number, filing date81100082.708.01.1981
[1981/34]
Priority number, dateUS1980011673630.01.1980         Original published format: US 116736
[1981/34]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0034244
Date:26.08.1981
Language:EN
[1981/34]
Type: A3 Search report 
No.:EP0034244
Date:16.09.1981
Language:EN
[1981/37]
Search report(s)(Supplementary) European search report - dispatched on:EP14.07.1981
ClassificationIPC:G11C11/24, H01L27/10, H01L29/10, H01L29/78
[1981/34]
CPC:
H01L29/7827 (EP,US); G11C11/404 (EP,US); H01L29/105 (EP,US);
H10B12/00 (EP,US)
Designated contracting statesDE,   FR,   GB [1981/34]
TitleGerman:Zerstörungsfrei lesbare 1-FET-Speicherzellenmatrix[1981/34]
English:Non-destructive read-out one-FET cell memory matrix[1981/34]
French:Matrice de cellules de mémoire à un transistor à effet de champ et lecture non-destructive[1981/34]
File destroyed:18.06.1989
Examination procedure05.10.1981Examination requested  [1981/50]
26.10.1982Despatch of a communication from the examining division (Time limit: M04)
15.04.1983Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [1983/40]
27.06.1983Application deemed to be withdrawn, date of legal effect  [1983/40]
Fees paidPenalty fee
Additional fee for renewal fee
31.01.198303   M06   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:SearchUS4014036  [ ] (HO IRVING T, et al);
 US4109270  [ ] (VON BASSE PAUL WERNER, et al);
 US4116720  [ ] (VINSON MARK ALEXANDER);
 [A]US4126881  (BASSE P [DE], et al);
 [A]GB2006523  (MOHSEN A M);
 [A]GB2011175  (AMERICAN MICRO SYST);
 WO7900474  [ ] (ERB D)
    [ ] - IBM TECHNICAL DISCLOSURE BULLETIN, Vol. 15, No. 2, July 1972, Armonk, US HO et al. "Reach-through mode operation of single-electrode double-threshold charge-coupled memory cell"pages 412-413.
    [ ] - IEEE TRANSACTIONS ON ELECTRON DEVICES, Vol. ED 25, No. 10, October 1978, New York, US JENNE et al. "A theoretical and experimental analysis of the buried-source VMOS dynamic RAM cell"pages 1204-1213.
 [A]  - IBM TECHNICAL DISCLOSURE BULLETIN, Vol. 14, No. 4, September 1971, Armonk, US KEMERER "Storage cell using double-threshold FET'S"pages 1077-1078.
 [A]  - IEEE JOURNAL OF SOLID-STATE CIRCUITS, Vol. SC 13, No. 5, October 1978, New YorkUS HOFFMANN et al. "VMOS technology applied to dynamic RAM's" pages 617-622.
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.