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Extract from the Register of European Patents

EP About this file: EP0050512

EP0050512 - Method of forming electrical interconnections on contact pads of semi-conductor devices [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  25.02.1985
Database last updated on 30.09.2024
Most recent event   Tooltip20.12.1990Lapse of the patent in a contracting statepublished on 06.02.1991 [1991/06]
Applicant(s)For all designated states
HONEYWELL INC.
Honeywell Plaza
Minneapolis, MN 55408 / US
[N/P]
Former [1982/17]For all designated states
HONEYWELL INC.
Honeywell Plaza
Minneapolis Minnesota 55408 / US
Inventor(s)01 / Young, Miriam F.
277 Fuller Street
Dorchester Massachusetts / US
[1982/17]
Representative(s)Harman, Michael Godfrey
Honeywell Control Systems Ltd.
Patent Department
Charles Square
Bracknell
Berkshire RG12 1EB / GB
[N/P]
Former [1985/12]Harman, Michael Godfrey
Honeywell Control Systems Ltd. Patent Department Charles Square
Bracknell Berkshire RG12 1EB / GB
Former [1982/17]Riddle, John
Honeywell Control Systems Ltd. Patent Department Charles Square
Bracknell, Berks. / GB
Application number, filing date81304882.420.10.1981
[1982/17]
Priority number, dateUS1980019831920.10.1980         Original published format: US 198319
[1982/17]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0050512
Date:28.04.1982
Language:EN
[1982/17]
Type: B1 Patent specification 
No.:EP0050512
Date:25.04.1984
Language:EN
[1984/17]
Search report(s)(Supplementary) European search report - dispatched on:EP03.02.1982
ClassificationIPC:H01L21/90, H01L21/58, H01L27/14
[1982/17]
CPC:
H01L21/76801 (EP,US); H01L24/02 (US); H01L21/76885 (EP,US);
H01L23/147 (EP,US); H01L24/29 (EP,US); H01L24/83 (EP,US);
H01L2224/24225 (EP,US); H01L2224/2919 (EP,US); H01L2224/8319 (EP,US);
H01L2224/8385 (EP,US); H01L2924/01014 (EP,US); H01L2924/01015 (EP,US);
H01L2924/01028 (EP,US); H01L2924/0103 (EP,US); H01L2924/01033 (EP,US);
H01L2924/01052 (EP,US); H01L2924/01075 (EP,US); H01L2924/01077 (EP,US);
H01L2924/01078 (EP,US); H01L2924/01079 (EP,US); H01L2924/0665 (EP,US);
H01L2924/07802 (EP,US); H01L2924/12033 (EP,US); H01L2924/14 (EP,US) (-)
C-Set:
H01L2224/2919, H01L2924/0665, H01L2924/00 (EP,US);
H01L2924/0665, H01L2924/00 (US,EP);
H01L2924/12033, H01L2924/00 (US,EP)
Designated contracting statesDE,   GB [1982/17]
TitleGerman:Verfahren zum Formen von elektrischen Verbindungen an Kontakflächen von Halbleitervorrichtungen[1982/17]
English:Method of forming electrical interconnections on contact pads of semi-conductor devices[1982/17]
French:Procédé pour former des interconnextions électriques sur des zones de contact de dispositifs semiconducteurs[1982/17]
File destroyed:02.03.1998
Examination procedure06.07.1982Examination requested  [1982/37]
30.08.1983Despatch of communication of intention to grant (Approval: )
07.10.1983Communication of intention to grant the patent
03.12.1983Fee for grant paid
03.12.1983Fee for publishing/printing paid
Opposition(s)26.01.1985No opposition filed within time limit [1985/18]
Fees paidRenewal fee
21.09.1983Renewal fee patent year 03
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Documents cited:SearchUS3965568  [ ] (GOOCH ROLAND W);
 US4113578  [ ] (DEL MONTE LOUIS A);
 US4196508  [ ] (LORENZE ROBERT V JR [US]);
 US4209358  [ ] (DILEO DANIEL A [US], et al)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.