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Extract from the Register of European Patents

EP About this file: EP0050159

EP0050159 - METHOD AND APPARATUS FOR DETECTING THE POSITION OF A LASER BEAM [Right-click to bookmark this link]
Former [1982/17]METHOD AND APPARATUS FOR MEASURING A LASER RAY
[1986/34]
StatusNo opposition filed within time limit
Status updated on  23.06.1987
Database last updated on 03.09.2024
Most recent event   Tooltip23.06.1987No opposition filed within time limitpublished on 12.08.1987 [1987/33]
Applicant(s)For all designated states
Hitachi, Ltd.
5-1, Marunouchi 1-chome
Chiyoda-ku
Tokyo 100 / JP
[N/P]
Former [1982/17]For all designated states
Hitachi, Ltd.
5-1, Marunouchi 1-chome
Chiyoda-ku, Tokyo 100 / JP
Inventor(s)01 / SHIRAKURA, Toshiharu
1180-3, Oaza-Muramatsu Tokai-mura
Naka-gun Ibaraki 319-11 / JP
02 / SUGAWARA, Hiroyuki
4-33-11, Nishinarusawa-cho Hitachi-shi
Ibaraki 316 / JP
03 / KUWABARA, Kouji
2-14-15, Mizuki-cho Hitachi-shi
Ibaraki 316 / JP
04 / SASAKI, Kouji
3-10-12, Suehiro-cho Hitachi-shi
Ibaraki 316 / JP
05 / TAKEMORI, Satoshi
161-433, Ishinazaka-cho Hitachi-shi
Ibaraki 319-12 / JP
[1986/31]
Former [1982/17]01 / SHIRAKURA, Toshiharu
1180-3, Oaza-Muramatu Tokai-mura
Naka-gun Ibaraki 319-11 / JP
02 / SUGAWARA, Hiroyuki
4-33-11, Nishinarusawa-cho Hitachi-shi
Ibaraki 316 / JP
03 / KUWABARA, Kouji
2-14-15, Mizuki-cho Hitachi-shi
Ibaraki 316 / JP
04 / SASAKI, Kouji
3-10-12, Suehiro-cho Hitachi-shi
Ibaraki 316 / JP
05 / TAKEMORI, Satoshi
161-433, Ishinazaka-cho Hitachi-shi
Ibaraki 319-12 / JP
Representative(s)Strehl, Peter, et al
Patentanwälte
Strehl Schübel-Hopf & Partner
Maximilianstrasse 54
80538 München / DE
[N/P]
Former [1983/04]Strehl, Peter, Dipl.-Ing., et al
Patentanwälte Strehl Schübel-Hopf Groening u. Partner Postfach 22 14 55
D-80504 München / DE
Former [1982/17]Strehl, Peter, Dipl.-Ing.
K.L. Schiff Dr. A. v. Funer Dipl.-Ing. P. Strehl Dr. U. Schübel-Hopf Dipl.-Ing. D. Ebbinghaus Dr.-Ing. D. Finck Patentanwälte Mariahilfplatz 2 & 3
D-8000 München 90 / DE
Application number, filing date81900953.115.04.1981
[1982/17]
WO1981JP00089
Priority number, dateJP1980005046718.04.1980         Original published format: JP 5046780
[1982/17]
Filing languageJA
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO8103068
Date:29.10.1981
[1981/25]
Type: A1 Application with search report 
No.:EP0050159
Date:28.04.1982
Language:EN
[1982/17]
Type: B1 Patent specification 
No.:EP0050159
Date:20.08.1986
Language:EN
[1986/34]
Search report(s)(Supplementary) European search report - dispatched on:EP03.09.1982
ClassificationIPC:G01J1/04, G01J5/20
[1982/17]
CPC:
G01J5/20 (EP,US); G01J1/42 (EP,US); G01J1/4257 (EP,US)
Designated contracting statesDE,   GB [1982/17]
TitleGerman:VERFAHREN UND VORRICHTUNG ZUM ERFASSEN DER LAGE EINES LASERSTRAHLS[1986/34]
English:METHOD AND APPARATUS FOR DETECTING THE POSITION OF A LASER BEAM[1986/34]
French:PROCEDE ET DISPOSITIF POUR DETECTER LA POSITION D'UN RAYON LASER[1986/34]
Former [1982/17]VERFAHREN UND VORRICHTUNG ZUM MESSEN EINES LASERSTRAHLS
Former [1982/17]METHOD AND APPARATUS FOR MEASURING A LASER RAY
Former [1982/17]PROCEDE ET DISPOSITIF DE MESURE D'UN RAYON LASER
File destroyed:20.04.2002
Entry into regional phase18.08.1981Translation filed 
16.09.1981National basic fee paid 
16.09.1981Search fee paid 
16.09.1981Designation fee(s) paid 
15.10.1981Examination fee paid 
Examination procedure15.10.1981Examination requested  [1982/46]
22.03.1984Despatch of a communication from the examining division (Time limit: M04)
01.08.1984Reply to a communication from the examining division
06.11.1984Despatch of a communication from the examining division (Time limit: M04)
18.03.1985Reply to a communication from the examining division
09.09.1985Despatch of communication of intention to grant (Approval: )
09.01.1986Communication of intention to grant the patent
18.04.1986Fee for grant paid
18.04.1986Fee for publishing/printing paid
Opposition(s)21.05.1987No opposition filed within time limit [1987/33]
Fees paidRenewal fee
06.07.1983Renewal fee patent year 03
25.04.1984Renewal fee patent year 04
31.05.1985Renewal fee patent year 05
28.04.1986Renewal fee patent year 06
Penalty fee
Additional fee for renewal fee
02.05.198303   M06   Fee paid on   06.07.1983
30.04.198505   M06   Fee paid on   31.05.1985
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Cited inInternational search[X]US3731099  (GREENE N);
 [A]JPS4630800Y
ExaminationFR1564270
 GB2011612
 US3939706
 GB1084263
    - ISA TRANSACTIONS, vol. 18, no. 4, 1979, PITTSBURGH, OH (US), T. FOSTER et al.: "A new approach to laser beam heat flux and power profiling", pages 57-65
    - APPLIED OPTICS, vol. 10, no. 11, November 1971, NEW YORK (US), S. JACOBS: "A simple CO2 laser power meter", pages 2564-2565
    - PHILIPS RESEARCH REPORTS, vol. 23, 1968, J. SIEKMAN et al.: "A simple power-output meter specially designed for continuous laser beams", pages 375-387
    - SOVIET JOURNAL OF QUANTUM ELECTRONICS, vol. 5, no. 1, July 1975, NEW YORK (US), V. KUTMICHEV et al.: "Determination of the energy center and diameter of a laser beam", pages 109-110
    - SOVIET JOURNAL OF QUANTUM ELECTRONICS, vol. 4, no. 11, May 1975, V. KUZMICHEV et al.: "Fast response meter for measuring the power of Carbon Dioxide laser radiation", pages 1337-1339
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.