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Extract from the Register of European Patents

EP About this file: EP0074541

EP0074541 - Method for the production of a semiconductor device comprising dielectrically isolating regions [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  08.01.1990
Database last updated on 27.07.2024
Most recent event   Tooltip08.01.1990No opposition filed within time limitpublished on 28.02.1990 [1990/09]
Applicant(s)For all designated states
FUJITSU LIMITED
1015, Kamikodanaka, Nakahara-ku Kawasaki-shi
Kanagawa 211 / JP
[N/P]
Former [1983/12]For all designated states
FUJITSU LIMITED
1015, Kamikodanaka, Nakahara-ku
Kawasaki-shi, Kanagawa 211 / JP
Inventor(s)01 / Ogawa, Tetsuya
Fujinodai-danchi 1-17-207, 3486 Honmachida
Machida-shi Tokyo 194 / JP
02 / Toyokura, Nobuo
1569-1, Shinsaku Takatsu-ku
Kawasaki-shi Kanagawa 213 / JP
[1983/12]
Representative(s)Sajda, Wolf E., et al
Meissner Bolte Patentanwälte
Rechtsanwälte Partnerschaft mbB
Widenmayerstrasse 47
80538 München / DE
[N/P]
Former [1988/42]Sajda, Wolf E., Dipl.-Phys., et al
MEISSNER, BOLTE & PARTNER Widenmayerstrasse 48
D-80538 München / DE
Former [1988/40]Sajda, Wolf E., Dipl.-Phys.
MEISSNER, BOLTE & PARTNER Widenmayerstrasse 48
D-80538 München / DE
Former [1986/27]Reinländer & Bernhardt Patentanwälte
Postfach 86 06 24
D-8000 München 86 / DE
Former [1983/12]Reinländer & Bernhardt Patentanwälte
Orthstrasse 12
D-8000 München 60 / DE
Application number, filing date82107889.627.08.1982
[1983/12]
Priority number, dateJP1981014291110.09.1981         Original published format: JP 14291181
[1983/12]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0074541
Date:23.03.1983
Language:EN
[1983/12]
Type: A3 Search report 
No.:EP0074541
Date:30.05.1984
Language:EN
[1984/22]
Type: B1 Patent specification 
No.:EP0074541
Date:01.03.1989
Language:EN
[1989/09]
Search report(s)(Supplementary) European search report - dispatched on:EP30.03.1984
ClassificationIPC:H01L21/76, H01L21/324, H01L21/90
[1983/12]
CPC:
H01L21/28512 (EP,US); H01L21/3245 (EP,US); H01L21/743 (EP,US);
H01L21/76 (EP,US); H01L21/76224 (EP,US); H01L21/76801 (EP,US);
H01L21/76829 (EP,US) (-)
Designated contracting statesDE,   FR,   GB [1983/12]
TitleGerman:Verfahren zur Herstellung einer Halbleiteranordnung mit dielektrischen Isolationszonen[1989/09]
English:Method for the production of a semiconductor device comprising dielectrically isolating regions[1983/12]
French:Procédé pour la production d'un dispositif semi-conducteur comportant des régions d'isolation diélectriques[1983/12]
Former [1983/12]Verfahren zur Herstellung einer Halbleiteranordnung mit dielektrischen Isolationsmassen
File destroyed:15.01.2000
Examination procedure30.04.1984Examination requested  [1984/28]
03.05.1985Despatch of a communication from the examining division (Time limit: M08)
13.01.1986Reply to a communication from the examining division
18.08.1986Despatch of a communication from the examining division (Time limit: M08)
24.04.1987Reply to a communication from the examining division
06.07.1988Despatch of communication of intention to grant (Approval: No)
19.08.1988Despatch of communication of intention to grant (Approval: later approval)
29.08.1988Communication of intention to grant the patent
12.09.1988Fee for grant paid
12.09.1988Fee for publishing/printing paid
Opposition(s)01.12.1989No opposition filed within time limit [1990/09]
Fees paidRenewal fee
30.08.1984Renewal fee patent year 03
29.08.1985Renewal fee patent year 04
14.08.1986Renewal fee patent year 05
06.10.1987Renewal fee patent year 06
29.08.1988Renewal fee patent year 07
Penalty fee
Additional fee for renewal fee
31.08.198706   M06   Fee paid on   06.10.1987
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Documents cited:Search[X]US4069577  (DINGWALL ANDREW GORDON FRANCIS);
 [X]US4181537  (ICHINOHE EISUKE [JP]);
 [X]US4282647  (RICHMAN PAUL);
 [XP]DE3023410  (SIEMENS AG [DE])
 [X]  - IBM TECHNICAL DISCLOSURE BULLETIN, vol. 23, no. 8, January 1981 New York, US D.W. ORMOND: "Method of manufacturing dielectrically isolated regions of silicon utilizing high pressure steam", pages 3694-3697
 [X]  - IBM TECHNICAL DISCLOSURE BULLETIN, vol. 21, no. 7, December 1978 New York, US H.B. POGGE: "Single mask selfaligned trench isolation/diffusion process", pages 2734-2735
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.