EP0083942 - Detecting irregularities in a coating on a substrate [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 16.02.1989 Database last updated on 09.09.2024 | Most recent event Tooltip | 16.02.1989 | No opposition filed within time limit | published on 05.04.1989 [1989/14] | Applicant(s) | For all designated states JAPAN CROWN CORK CO., LTD. Saiwa Building 3-1 Uchisaiwai-cho 1-chome Chiyoda-ku Tokyo / JP | [N/P] |
Former [1983/29] | For all designated states JAPAN CROWN CORK CO. LTD. Saiwa Building 3-1 Uchisaiwai-cho 1-chome Chiyoda-ku Tokyo / JP | Inventor(s) | 01 /
Reich, Frederich R. 710 Cottonwood Loop Richland Washington 99352 / US | [1983/29] | Representative(s) | Heidrich, Udo European Patent Attorney, Apdo. 488 E - 38650 Los Christianos / Tenerife / ES | [N/P] |
Former [1983/29] | Heidrich, Udo, Dr. jur., Dipl.-Phys. Rechtsanwalt & Patentanwalt Dipl.-Phys. Dr. jur. U. HEIDRICH Franziskanerstrasse 30 D-81669 München / DE | Application number, filing date | 83100170.6 | 11.01.1983 | [1983/29] | Priority number, date | US19820338384 | 11.01.1982 Original published format: US 338384 | [1983/29] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0083942 | Date: | 20.07.1983 | Language: | EN | [1983/29] | Type: | A3 Search report | No.: | EP0083942 | Date: | 09.05.1984 | Language: | EN | [1984/19] | Type: | B1 Patent specification | No.: | EP0083942 | Date: | 20.04.1988 | Language: | EN | [1988/16] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 07.03.1984 | Classification | IPC: | G01N21/88, G01N21/21, G01N21/49 | [1983/29] | CPC: |
G01N21/88 (EP,US);
G01J4/00 (KR);
G01N21/21 (EP,KR,US);
G01N2021/8427 (EP,US);
G01N2201/1045 (EP,US)
| Designated contracting states | DE, FR, GB, IT, NL, SE [1983/29] | Title | German: | Verfahren und Vorrichtung zum Nachweis von Unregelmässigkeiten in der Beschichtung eines Substrats | [1983/29] | English: | Detecting irregularities in a coating on a substrate | [1983/29] | French: | Procédé et dispositif pour détecter des irrégularités dans une couche sur un substrat | [1983/29] | Examination procedure | 21.08.1984 | Examination requested [1984/44] | 15.10.1985 | Despatch of a communication from the examining division (Time limit: M08) | 25.06.1986 | Reply to a communication from the examining division | 01.08.1986 | Despatch of a communication from the examining division (Time limit: M04) | 10.12.1986 | Reply to a communication from the examining division | 14.04.1987 | Despatch of communication of intention to grant (Approval: ) | 22.07.1987 | Communication of intention to grant the patent | 30.10.1987 | Fee for grant paid | 30.10.1987 | Fee for publishing/printing paid | Opposition(s) | 21.01.1989 | No opposition filed within time limit [1989/14] | Fees paid | Renewal fee | 27.02.1985 | Renewal fee patent year 03 | 30.12.1985 | Renewal fee patent year 04 | 22.12.1986 | Renewal fee patent year 05 | 27.01.1988 | Renewal fee patent year 06 | Penalty fee | Additional fee for renewal fee | 31.01.1985 | 03   M06   Fee paid on   27.02.1985 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [Y]US3790286 (KRAUS G); | [YD]US3904293 (GEE SHERMAN); | [YD]US2947212 (WOODS ROBERT C); | [AD]US4015127 (SHARKINS ALLEN J) | [A] - IBM TECHNICAL DISCLOSURE BULLETIN, vol. 17, no. 9, February 1975 W.P. SHAW et al. "High-speed automatic particle counter", page 2588 |