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Extract from the Register of European Patents

EP About this file: EP0088421

EP0088421 - Semiconductor memory device having tunnel diodes [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  09.01.1992
Database last updated on 22.05.2024
Most recent event   Tooltip05.10.2005Change: Appeal number 
Applicant(s)For all designated states
Kabushiki Kaisha Toshiba
72, Horikawa-cho, Saiwai-ku Kawasaki-shi
Kanagawa-ken 210-8572 / JP
[N/P]
Former [1983/37]For all designated states
KABUSHIKI KAISHA TOSHIBA
72, Horikawa-cho, Saiwai-ku
Kawasaki-shi, Kanagawa-ken 210, Tokyo / JP
Inventor(s)01 / Matsukawa, Naohiro
Toshiba-Kikuna-ryo 217 Mamedo-cho
Kohoku-ku Yokohama-shi / JP
[1983/37]
Representative(s)Henkel & Partner mbB
Patentanwaltskanzlei, Rechtsanwaltskanzlei
Maximiliansplatz 21
80333 München / DE
[N/P]
Former [1983/37]Henkel, Feiler, Hänzel & Partner
Möhlstrasse 37
D-81675 München / DE
Application number, filing date83102232.207.03.1983
[1983/37]
Priority number, dateJP1982003601908.03.1982         Original published format: JP 3601982
[1983/37]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0088421
Date:14.09.1983
Language:EN
[1983/37]
Type: A3 Search report 
No.:EP0088421
Date:26.11.1986
Language:EN
[1986/48]
Type: B1 Patent specification 
No.:EP0088421
Date:06.03.1991
Language:EN
[1991/10]
Type: B1 RE Reissue of patent specification
No.:EP0088421
Date:19.08.1991
[1991/41]
Search report(s)(Supplementary) European search report - dispatched on:EP07.10.1986
ClassificationIPC:G11C11/38
[1991/10]
CPC:
G11C11/38 (EP,US)
Former IPC [1986/47]G11C11/34, G11C11/38
Former IPC [1983/37]G11C11/34
Designated contracting statesDE,   FR,   GB [1983/37]
TitleGerman:Halbleiterspeicheranordnung mit Tunneldioden[1983/37]
English:Semiconductor memory device having tunnel diodes[1983/37]
French:Dispositif de mémoire semi-conductrice à diodes tunnel[1983/37]
Examination procedure05.04.1983Examination requested  [1983/37]
11.09.1987Despatch of a communication from the examining division (Time limit: M04)
26.10.1987Reply to a communication from the examining division
18.02.1988Despatch of a communication from the examining division (Time limit: M06)
23.08.1988Reply to a communication from the examining division
10.05.1989Despatch of communication that the application is refused, reason: substantive examination {1}
10.07.1990Date of oral proceedings
12.07.1990Minutes of oral proceedings despatched
13.08.1990Despatch of communication of intention to grant (Approval: Yes)
04.09.1990Communication of intention to grant the patent
23.11.1990Fee for grant paid
23.11.1990Fee for publishing/printing paid
Appeal following examination22.06.1989Appeal received No.  T0600/89
24.08.1989Statement of grounds filed
10.07.1990Result of appeal procedure: remittal for grant
Opposition(s)07.12.1991No opposition filed within time limit [1992/09]
Fees paidRenewal fee
13.03.1985Renewal fee patent year 03
15.03.1986Renewal fee patent year 04
09.03.1987Renewal fee patent year 05
07.03.1988Renewal fee patent year 06
13.03.1989Renewal fee patent year 07
15.03.1990Renewal fee patent year 08
17.12.1990Renewal fee patent year 09
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]US4187602  (MCELROY DAVID J [US])
 [A]  - ELECTRONICS, vol. 33, no. 22, 27th May 1960, pages 75-84, New York, US; "Research and engineering frontiers of the electronics technology"
 [A]  - K.N. CHANG: "Parametric and tunnel diodes", 1964, pages 169-171, Englewood Cliffs, New Jersey, US; "Memory elements"
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.