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Extract from the Register of European Patents

EP About this file: EP0103767

EP0103767 - Method of producing a semiconductor device by ion-implantation and device produced by the method [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  17.05.1990
Database last updated on 15.06.2024
Most recent event   Tooltip17.05.1990No opposition filed within time limitpublished on 04.07.1990 [1990/27]
Applicant(s)For all designated states
Kabushiki Kaisha Toshiba
72, Horikawa-cho, Saiwai-ku Kawasaki-shi
Kanagawa-ken 210-8572 / JP
[N/P]
Former [1984/42]For all designated states
KABUSHIKI KAISHA TOSHIBA
72, Horikawa-cho, Saiwai-ku
Kawasaki-shi, Kanagawa-ken 210, Tokyo / JP
Former [1984/35]For all designated states
Kabushiki Kaisha Toshiba
72 Horikawa-cho Saiwai-ku
Kawasaki-shi Kanagawa-ken / JP
Former [1984/13]For all designated states
KABUSHIKI KAISHA TOSHIBA
72, Horikawa-cho, Saiwai-ku
Kawasaki-shi, Kanagawa-ken 210, Tokyo / JP
Inventor(s)01 / Ajima, Takashi
2-9-28, Oomachi
Kamakura-Shi Kanagawa-Ken / JP
02 / Ohshima, Jiro
7-501, 2-8-1, Teraodai Tama-Ku
Kawasaki-Shi Kanagawa-Ken / JP
03 / Koshino, Yutaka
3-10-6, Uragaoka
Yokosuka-Shi Kanagawa-Ken / JP
[1984/13]
Representative(s)Lehn, Werner, et al
Hoffmann Eitle, Patent- und Rechtsanwälte, Postfach 81 04 20
81904 München / DE
[N/P]
Former [1984/13]Lehn, Werner, Dipl.-Ing., et al
Hoffmann, Eitle & Partner, Patentanwälte, Postfach 81 04 20
D-81904 München / DE
Application number, filing date83108255.722.08.1983
[1984/13]
Priority number, dateJP1982014598023.08.1982         Original published format: JP 14598082
[1984/13]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0103767
Date:28.03.1984
Language:EN
[1984/13]
Type: A3 Search report 
No.:EP0103767
Date:11.06.1986
Language:EN
[1986/24]
Type: B1 Patent specification 
No.:EP0103767
Date:19.07.1989
Language:EN
[1989/29]
Search report(s)(Supplementary) European search report - dispatched on:EP22.04.1986
ClassificationIPC:H01L21/265, H01L21/316
[1984/13]
CPC:
H01L21/02178 (EP,US); H01L21/02263 (EP,US); H01L21/22 (EP,US);
H01L21/26506 (EP,US); H01L21/2652 (EP,US); H01L21/3162 (US)
Designated contracting statesDE,   FR,   GB,   IT [1984/13]
TitleGerman:Verfahren zur Herstellung einer Halbleiteranordnung mittels einer Ionenimplantation und nach diesem Verfahren hergestellte Anordnung[1984/13]
English:Method of producing a semiconductor device by ion-implantation and device produced by the method[1984/13]
French:Procédé pour la fabrication d'un dispositif semi-conducteur utilisant une étape d'implantation ionique et dispositif produit par ce procédé[1984/13]
Examination procedure22.08.1983Examination requested  [1984/13]
26.10.1987Despatch of a communication from the examining division (Time limit: M06)
26.04.1988Reply to a communication from the examining division
30.08.1988Despatch of communication of intention to grant (Approval: Yes)
05.01.1989Communication of intention to grant the patent
07.03.1989Fee for grant paid
07.03.1989Fee for publishing/printing paid
Opposition(s)20.04.1990No opposition filed within time limit [1990/27]
Fees paidRenewal fee
13.08.1985Renewal fee patent year 03
14.08.1986Renewal fee patent year 04
12.08.1987Renewal fee patent year 05
10.08.1988Renewal fee patent year 06
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]US3925106  (KU SAN-MEI, et al);
 [A]FR2309039  (SONY CORP [JP], et al);
 [A]US4295898  (YOSHIDA MASAKATSU, et al);
 [A]DE2045304  (WESTERN ELECTRIC CO);
 [A]US3773566  (TSUCHIMOTO T);
 [A]FR2016207  (ATOMIC ENERGY AUTHORITY UK);
 [A]DE2752439  (IBM)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.