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Extract from the Register of European Patents

EP About this file: EP0113954

EP0113954 - A substrate for manufacturing single crystal thin films [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  28.03.1988
Database last updated on 15.05.2024
Most recent event   Tooltip28.03.1988No opposition filed within time limitpublished on 18.05.1988 [1988/20]
Applicant(s)For all designated states
Hamakawa, Yoshihiro
3-17-4, Minami-Hanayashiki Kawanishi
Hyogo / JP
[N/P]
Former [1984/30]For all designated states
Hamakawa, Yoshihiro
3-17-4, Minami-Hanayashiki
Kawanishi Hyogo / JP
Inventor(s)01 / Hamakawa, Yoshihiro
17-4, Minamihanayashiki 3-chome
Kawanishi-shi Hyogo-ken / JP
02 / Takakura, Hideyuki
3-12, Hata 2-chome
Ikeda-shi Osaka / JP
[1984/30]
Representative(s)Myerscough, Philip Boyd, et al
J.A.KEMP & CO. 14, South Square Gray's Inn
London WC1R 5LX / GB
[1984/30]
Application number, filing date83306543.627.10.1983
[1984/30]
Priority number, dateJP1982020229817.11.1982         Original published format: JP 20229882
[1984/30]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0113954
Date:25.07.1984
Language:EN
[1984/30]
Type: B1 Patent specification 
No.:EP0113954
Date:27.05.1987
Language:EN
[1987/22]
Search report(s)(Supplementary) European search report - dispatched on:EP03.04.1984
ClassificationIPC:C30B25/18, C30B19/12, C30B23/02
[1984/30]
CPC:
C30B19/12 (EP,US); C30B23/04 (EP,US); C30B25/04 (EP,US);
C30B25/18 (EP,US); Y10S117/902 (EP,US); Y10S117/914 (EP,US);
Y10T428/12472 (EP,US); Y10T428/12674 (EP,US); Y10T428/12722 (EP,US);
Y10T428/12792 (EP,US); Y10T428/12889 (EP,US); Y10T428/12896 (EP,US);
Y10T428/12944 (EP,US) (-)
Designated contracting statesDE,   FR,   GB,   NL [1984/30]
TitleGerman:Substrat für einkristalline Dünnschichtbildung[1984/30]
English:A substrate for manufacturing single crystal thin films[1984/30]
French:Substrat pour la fabrication d'une couche mince monocristalline[1984/30]
Examination procedure04.09.1984Examination requested  [1984/46]
13.06.1985Despatch of a communication from the examining division (Time limit: M06)
23.12.1985Reply to a communication from the examining division
13.03.1986Despatch of a communication from the examining division (Time limit: M04)
14.07.1986Reply to a communication from the examining division
11.09.1986Despatch of communication of intention to grant (Approval: )
05.11.1986Communication of intention to grant the patent
19.01.1987Fee for grant paid
19.01.1987Fee for publishing/printing paid
Opposition(s)01.03.1988No opposition filed within time limit [1988/20]
Fees paidRenewal fee
12.10.1985Renewal fee patent year 03
09.10.1986Renewal fee patent year 04
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Documents cited:Search[Y]WO8102948  (MASSACHUSETTS INST TECHNOLOGY [US]);
 [Y]GB1601206  (MASSACHUSETTS INST TECHNOLOGY)
 [Y]  - INTERNATIONAL ELECTRON DEVICES MEETING 1979, Washington, D.C., 3rd-5th December 1979, pages 210-212, IEEE, New York, USA
 [Y]  - JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 20, no. 12, December 1981, pages L905-L908, Tokyo, JP.
Examination   - JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 20, no. 12, December 1981, pages L905-L908, Tokyo, JP. H. MORI: "2-D Grating graphoepitaxy of silicon films from silicon-gold supersaturated solution"
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.