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EP0124241
European procedure
Extract from the Register of European Patents
EP About this file: EP0124241
| EP0124241 - Microscope provided with automatic focusing device [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 13.09.1989 Database last updated on 19.10.2024 | Most recent event Tooltip | 13.09.1989 | No opposition filed within time limit | published on 02.11.1989 [1989/44] | Applicant(s) | For all designated states Olympus Optical Co., Ltd. 43-2, 2-chome, Hatagaya Shibuya-ku Tokyo 151-0072 / JP | [N/P] |
| Former [1984/45] | For all designated states OLYMPUS OPTICAL CO., LTD. 43-2, 2-chome, Hatagaya Shibuya-ku Tokyo 151 / JP | Inventor(s) | 01 /
Kawasaki, Masami Kureru Hachiouji 407 Hachiman-cho, 3-23 Hachiouji-shi Tokyo-to / JP | [1984/45] | Representative(s) | Woodin, Anthony John, et al Fitzpatricks Europe House Box No. 88 World Trade Centre East Smithfield London E1 9AA / GB | [1985/39] |
| Former [1984/45] | Connor, Terence Kevin FITZPATRICKS Kern House 61/62 Lincoln's Inn Fields London WC2B 6EX / GB | Application number, filing date | 84301963.9 | 22.03.1984 | [1984/45] | Priority number, date | JP19830053169 | 29.03.1983 Original published format: JP 5316983 | JP19830053170 | 29.03.1983 Original published format: JP 5317083 | [1984/45] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0124241 | Date: | 07.11.1984 | Language: | EN | [1984/45] | Type: | B1 Patent specification | No.: | EP0124241 | Date: | 02.11.1988 | Language: | EN | [1988/44] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 03.08.1984 | Classification | IPC: | G02B21/00 | [1984/45] | CPC: |
G02B21/244 (EP,US)
| Designated contracting states | DE, FR, GB [1984/45] | Title | German: | Mit einer automatischen Fokussiereinrichtung ausgestattetes Mikroskop | [1984/45] | English: | Microscope provided with automatic focusing device | [1984/45] | French: | Microscope équipé d'un système de mise au point automatique | [1984/45] | Examination procedure | 10.10.1984 | Examination requested [1984/51] | 18.03.1986 | Despatch of a communication from the examining division (Time limit: M06) | 13.09.1986 | Reply to a communication from the examining division | 30.04.1987 | Date of oral proceedings | 23.05.1987 | Minutes of oral proceedings despatched | 15.06.1987 | Despatch of a communication from the examining division (Time limit: M04) | 05.10.1987 | Reply to a communication from the examining division | 15.12.1987 | Despatch of communication of intention to grant (Approval: No) | 20.04.1988 | Despatch of communication of intention to grant (Approval: later approval) | 26.04.1988 | Communication of intention to grant the patent | 06.07.1988 | Fee for grant paid | 06.07.1988 | Fee for publishing/printing paid | Opposition(s) | 03.08.1989 | No opposition filed within time limit [1989/44] | Fees paid | Renewal fee | 24.03.1986 | Renewal fee patent year 03 | 26.03.1987 | Renewal fee patent year 04 | 22.03.1988 | Renewal fee patent year 05 | Penalty fee | Penalty fee Rule 85a EPC 1973 | 23.04.1984 | DE M02 Fee paid on 30.05.1984 | 23.04.1984 | FR M02 Fee paid on 30.05.1984 | 23.04.1984 | GB M02 Fee paid on 30.05.1984 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [Y]US4000417 (ADKISSON WILLIAM M, et al); | [Y]US4202037 (DER LOOS HENDRIK VAN [CH], et al); | [YP]EP0088985 (ZEISS CARL FA [DE]); | [A]US4163150 (STANKEWITZ HANS-WERNER [DE]); | [A]US4241251 (YONEKUBO KEN [JP]); | [A]US3906219 (STAUFFER NORMAN L); | [A]US3932733 (OLSEN BENGT, et al); | [A]US4093991 (CHRISTIE JR JOHN S, et al) | [A] - IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING, vol. BME-29, no. 2, February 1982, pages 70-81, IEEE, New York, USA; I.T. YOUNG et al.: "SSAM: Solid-state automated microscope" | [A] - AUTOMATION, vol. 23, no. 12, December 1976, pages 42-45, Cleveland, USA; R.E. STEVENS et al.: "The happy marriage of the microscope and electronics" | Examination | EP0119857 |