| EP0139019 - SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE THEREOF [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 21.06.1990 Database last updated on 11.04.2026 | Most recent event Tooltip | 15.08.2008 | Change - representative | published on 17.09.2008 [2008/38] | Applicant(s) | For all designated states Hitachi, Ltd. 6, Kanda Surugadai 4-chome Chiyoda-ku Tokyo / JP | [N/P] |
| Former [1985/18] | For all designated states HITACHI, LTD. 6, Kanda Surugadai 4-chome Chiyoda-ku, Tokyo 100 / JP | Inventor(s) | 01 /
IKEDA, Takahide 41-11, Nakaarai 4-chome Tokorozawa-shi Saitama 359 / JP | 02 /
WATANABE, Atsuo 3949-3, Yamashita-cho Hitachiota-shi Ibaraki 313 / JP | 03 /
MUKAI, Touji 89, Aimoto, Sanda-shi Hyougo 669-16 / JP | 04 /
ODAKA, Masanori 1-17-7-201, Gakuennishi-cho Kodaira-shi Tokyo 187 / JP | 05 /
OGIUE, Katsumi 2196-98, Hirai, Hinode-cho Nishitama-Gun Tokyo 190-01 / JP | [1985/18] | Representative(s) | Beetz & Partner mbB Patentanwälte Prinzregentenstraße 54 80538 München / DE | [N/P] |
| Former [2008/38] | Beetz & Partner Patentanwälte Steinsdorfstrasse 10 80538 München / DE | ||
| Former [1985/18] | Patentanwälte Beetz - Timpe - Siegfried Schmitt-Fumian - Mayr Steinsdorfstrasse 10 D-80538 München / DE | Application number, filing date | 84901232.3 | 26.03.1984 | [1985/18] | WO1984JP00133 | Priority number, date | JP19830053077 | 28.03.1983 Original published format: JP 5307783 | [1985/18] | Filing language | JA | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | WO8403996 | Date: | 11.10.1984 | [1984/24] | Type: | A1 Application with search report | No.: | EP0139019 | Date: | 02.05.1985 | Language: | EN | [1985/18] | Type: | B1 Patent specification | No.: | EP0139019 | Date: | 23.08.1989 | Language: | EN | [1989/34] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 02.12.1985 | Classification | IPC: | H01L27/06, H01L27/08, H01L29/78 | [1985/18] | CPC: |
H10W15/00 (EP,KR,US);
H10D84/0109 (EP,KR,US);
H10D84/0165 (KR);
H10D84/038 (EP,US);
H10D84/401 (EP,KR,US);
H10D84/85 (KR);
H10W15/01 (EP,US)
(-)
| Designated contracting states | CH, DE, FR, GB, LI, NL, SE [1985/18] | Title | German: | HALBLEITERANORDNUNG UND DEREN HERSTELLUNG | [1985/18] | English: | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE THEREOF | [1985/18] | French: | DISPOSITIF SEMICONDUCTEUR ET SON PROCEDE DE FABRICATION | [1985/18] | Entry into regional phase | 14.11.1984 | Translation filed | 15.11.1984 | National basic fee paid | 15.11.1984 | Search fee paid | 15.11.1984 | Designation fee(s) paid | 15.11.1984 | Examination fee paid | Examination procedure | 15.11.1984 | Examination requested [1985/18] | 19.11.1987 | Despatch of a communication from the examining division (Time limit: M06) | 12.04.1988 | Reply to a communication from the examining division | 15.09.1988 | Despatch of communication of intention to grant (Approval: No) | 10.02.1989 | Despatch of communication of intention to grant (Approval: later approval) | 16.02.1989 | Communication of intention to grant the patent | 21.02.1989 | Fee for grant paid | 21.02.1989 | Fee for publishing/printing paid | Opposition(s) | 24.05.1990 | No opposition filed within time limit [1990/32] | Fees paid | Renewal fee | 01.04.1986 | Renewal fee patent year 03 | 25.03.1987 | Renewal fee patent year 04 | 22.03.1988 | Renewal fee patent year 05 | 22.03.1989 | Renewal fee patent year 06 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [YD] PROCEEDINGS OF THE 1981 CUSTOM INTEGRATED CIRCUIT CONFERENCE, 11th-13th May 1981, pages 8-12, IEEE, Rochester, N.Y., US; M. HEISIG: "BiMOS - A new way to simplify high-power custom interface" [YD] | [A] IBM TECHNICAL DISCLOSURE BULLETIN, vol. 13, no. 5, October 1970, page 1106, New York, US; M.B. VORA: "FET-bipolar integration" [A] | International search | [X] JPH0537507 [X] | [X] IBM Technical Disclosure Bulletin Vol. 16 No. 6 (1973-11) p. 1985-1986 [X] | [A] IBM Technical Disclosure Bulletin Vol. 13 No. 5 (1970-10) p. 1160 [A] | Examination | IBM Technical Disclosure Bulletin, vol. 16, no. 6 (1973-11), pp. 1985-1986 [YD] |