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Extract from the Register of European Patents

EP About this file: EP0165634

EP0165634 - Method of visualizing individual submicroscopic metal particles [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  11.09.1993
Database last updated on 24.04.2024
Most recent event   Tooltip11.09.1993No opposition filed within time limitpublished on 03.11.1993 [1993/44]
Applicant(s)For all designated states
Janssen Pharmaceutica NV
Turnhoutseweg 30
2340 Beerse / BE
[N/P]
Former [1985/52]For all designated states
JANSSEN PHARMACEUTICA N.V.
Turnhoutsebaan 30
B-2340 Beerse / BE
Inventor(s)01 / De Brabander, Marc Joris
Valerialaan 2
B-2153 Zoersel / BE
02 / Geuens, Gustaaf Maria Albert
Groot Kapellen 46
B-2400 Mol / BE
03 / Nuydens, Rony Maria
Duivenstraat 18
B-2350 Vosselaar / BE
04 / Moeremans, Marc Karel Julia Jozef
Donk 90
B-2400 Mol / BE
[1985/52]
Application number, filing date85200862.230.05.1985
[1985/52]
Priority number, dateUS1984062292321.06.1984         Original published format: US 622923
[1985/52]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0165634
Date:27.12.1985
Language:EN
[1985/52]
Type: A3 Search report 
No.:EP0165634
Date:20.07.1988
Language:EN
[1988/29]
Type: B1 Patent specification 
No.:EP0165634
Date:11.11.1992
Language:EN
[1992/46]
Search report(s)(Supplementary) European search report - dispatched on:EP02.06.1988
ClassificationIPC:G01N21/17, G02B21/12, G01N33/53, G01N21/21, G01N15/14
[1985/52]
CPC:
G02B21/12 (EP,US); G01N15/147 (EP,US); G01N33/532 (EP,US);
G01N33/553 (EP,US); G02B21/0004 (EP,US); G01N21/21 (EP,US);
Y10S435/81 (EP,US); Y10S436/805 (EP,US); Y10S436/807 (EP,US) (-)
Designated contracting statesAT,   BE,   CH,   DE,   FR,   GB,   IT,   LI,   LU,   NL,   SE [1985/52]
TitleGerman:Verfahren zum Sichtbarmachen von gesonderten submikroskopischen Metallteilchen[1985/52]
English:Method of visualizing individual submicroscopic metal particles[1985/52]
French:Méthode pour la visualisation de particules métalliques individuelles submicroscopiques[1985/52]
Examination procedure12.06.1986Examination requested  [1986/33]
07.12.1990Despatch of a communication from the examining division (Time limit: M06)
24.07.1991Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
24.08.1991Reply to a communication from the examining division
28.10.1991Despatch of communication of intention to grant (Approval: Yes)
06.05.1992Communication of intention to grant the patent
02.07.1992Fee for grant paid
02.07.1992Fee for publishing/printing paid
Opposition(s)12.08.1993No opposition filed within time limit [1993/44]
Request for further processing for:24.08.1991Request for further processing filed
24.08.1991Full payment received (date of receipt of payment)
Request granted
19.09.1991Decision despatched
Fees paidRenewal fee
14.05.1987Renewal fee patent year 03
17.05.1988Renewal fee patent year 04
16.05.1989Renewal fee patent year 05
16.05.1990Renewal fee patent year 06
21.12.1990Renewal fee patent year 07
11.05.1992Renewal fee patent year 08
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[Y]US4000417  (ADKISSON WILLIAM M, et al);
 [Y]EP0007654  (AKZO NV [NL]);
 [YD]US4420558  (DE MEY JAN R [BE], et al)
 [Y]  - IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, vol. PAMI-3, no. 6, November 1981, page 655-661, New York, US; P.M. NARENDRA et al.: "Real-Time Adaptive Contrast Enhancement"
 [A]  - H. APPELT "Einführung in die mikroskopischen Untersuchungsmethoden", 4. Ausgabe, Akademische Verlagsgesellschaft Geest & Portig K.G., 1959, Leipzig
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.