Extract from the Register of European Patents

EP About this file: EP0198468

EP0198468 - Protective device for integrated circuit [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  27.08.1992
Database last updated on 11.04.2026
Most recent event   Tooltip27.08.1992No opposition filed within time limitpublished on 14.10.1992 [1992/42]
Applicant(s)For all designated states
NEC Corporation
7-1, Shiba 5-chome Minato-ku
Tokyo 108-8001 / JP
[N/P]
Former [1986/43]For all designated states
NEC CORPORATION
7-1, Shiba 5-chome Minato-ku
Tokyo / JP
Inventor(s)01 / Fujii, Takeo
c/o NEC Corporation 33-1, Shiba 5-chome
Minato-ku Tokyo / JP
[1986/43]
Representative(s)Glawe, Delfs, Moll
Partnerschaft mbB von
Patent- und Rechtsanwälten
Postfach 26 01 62
80058 München / DE
[N/P]
Former [1986/43]Glawe, Delfs, Moll & Partner
Patentanwälte Postfach 26 01 62
D-80058 München / DE
Application number, filing date86105169.615.04.1986
[1986/43]
Priority number, dateJP1985007964515.04.1985         Original published format: JP 7964585
[1986/43]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0198468
Date:22.10.1986
Language:EN
[1986/43]
Type: A3 Search report 
No.:EP0198468
Date:22.04.1987
Language:EN
[1987/17]
Type: B1 Patent specification 
No.:EP0198468
Date:23.10.1991
Language:EN
[1991/43]
Search report(s)(Supplementary) European search report - dispatched on:EP05.03.1987
ClassificationIPC:H01L27/02, H01L29/06
[1986/43]
CPC:
H10D89/811 (EP)
Designated contracting statesDE,   FR,   GB [1986/43]
TitleGerman:Schutzanordnung für eine integrierte Schaltung[1986/43]
English:Protective device for integrated circuit[1986/43]
French:Dispositif de protection pour circuit intégré[1986/43]
Examination procedure15.04.1986Examination requested  [1986/43]
05.12.1989Despatch of a communication from the examining division (Time limit: M06)
15.05.1990Reply to a communication from the examining division
12.07.1990Despatch of a communication from the examining division (Time limit: M04)
15.11.1990Reply to a communication from the examining division
17.12.1990Despatch of communication of intention to grant (Approval: Yes)
26.04.1991Communication of intention to grant the patent
30.07.1991Fee for grant paid
30.07.1991Fee for publishing/printing paid
Opposition(s)24.07.1992No opposition filed within time limit [1992/42]
Fees paidRenewal fee
20.04.1988Renewal fee patent year 03
20.04.1989Renewal fee patent year 04
20.04.1990Renewal fee patent year 05
22.04.1991Renewal fee patent year 06
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Documents cited:Search[A] JP5851555  
 [X]   MICROELECTRONICS AND RELIABILITY, vol. 22, no. 2, 1982,pages 187-193, Pergamon Press LTD, Oxford, GB; C.A.MILLER et al.: "Punch-through gate protection of M.O.S. devices" [X]
 [A]   PATENTS ABSTRACTS OF JAPAN, vol. 7, no. 136 (E-181)[1281], 14th June 1983; & JP-A-58 51 555 (NIPPON DENSO K.K.) 26-03-1983 [A]
 [A]   IEEE-11th ANNUAL PROCEEDINGS RELIABILITY PHYSICS, Las Vegas, 3th-5th April 1973, pages 198-202, IEEE, New York, US; L.W.LINHOLM et al.: "Electrostatic gate protection using an arc gap device" [A]
 [A]   IEEE Transactions on electron devices, vol. ED-25, no. 8, August 1978, pages 926-932, IEEE, New York, US; S.H.COHEN et al.: "An improved input protection circuit for C-Mos/SOS arrays" [A]
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