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EP0203388

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Extract from the Register of European Patents

EP About this file: EP0203388

EP0203388 - Light scan device with a light concentrator for monitoring surface quality [Right-click to bookmark this link]
Status	The application has been refused Status updated on 25.02.1991 Database last updated on 10.08.2024
Most recent event Tooltip	13.06.2008	Change - representative	published on 16.07.2008 [2008/29]
Applicant(s)	For all designated states Erwin Sick GmbH Optik-Elektronik Sebastian-Kneipp-Strasse 1 D-79183 Waldkirch / DE
	[1986/49]
Inventor(s)	01 / Dabelstein, Klaus, Dipl.-Ing. Gut Schmalzhof D-8134 Pöcking/Starnberg / DE
	02 / Skrobol, Christian, Dipl.-Phys. Leitenstrasse 14 D-8084 Inning / DE
	[1986/49]
Representative(s)	Manitz Finsterwald Patent- und Rechtsanwaltspartnerschaft mbB Postfach 31 02 20 80102 München / DE
	[N/P]
Former [2008/29]	Manitz, Finsterwald & Partner GbR Postfach 31 02 20 80102 München / DE
Former [1987/15]	Dipl.-Phys.Dr. Manitz Dipl.-Ing. Finsterwald Dipl.-Ing. Grämkow Dipl.-Chem.Dr. Heyn Dipl.-Phys. Rotermund Morgan, B.Sc.(Phys) Postfach 22 16 11 D-80506 München / DE
Former [1986/49]	Dipl.-Phys.Dr. Manitz Dipl.-Ing. Finsterwald Dipl.-Ing. Grämkow Dipl.-Chem.Dr. Heyn Dipl.-Phys.Rotermund B.Sc. Morgan, Postfach 22 16 11 D-80506 München / DE
Application number, filing date	86105765.1	25.04.1986
	[1986/49]
Priority number, date	DE19853518832	24.05.1985 Original published format: DE 3518832
	[1986/49]
Filing language	DE
Procedural language	DE
Publication	Type:	A2 Application without search report
	No.:	EP0203388
	Date:	03.12.1986
	Language:	DE
	[1986/49]
	Type:	A3 Search report
	No.:	EP0203388
	Date:	18.01.1989
	Language:	DE
	[1989/03]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	28.11.1988
Classification	IPC:	G01N21/89	[1986/49]
	CPC:	G01N21/8901 (EP,US)
Designated contracting states	BE, CH, DE, FR, GB, IT, LI, LU, NL, SE [1986/49]
Title	German:	Oberflächenbeschaffenheitsfeststellungs-Lichtabtastvorrichtung mit einem Lichtkonzentrator	[1986/49]
	English:	Light scan device with a light concentrator for monitoring surface quality	[1986/49]
	French:	Dispositif de balayage lumineux pour le contrôle d'états de surface, utilisant un concentrateur de lumière	[1986/49]
File destroyed:	02.03.1998
Examination procedure	25.04.1986	Examination requested [1986/49]
	01.06.1990	Despatch of communication of intention to grant (Approval: )
	15.11.1990	Despatch of communication that the application is refused, reason: formalities examination [1991/16]
	25.11.1990	Application refused, date of legal effect [1991/16]
Fees paid	Renewal fee
	26.04.1988	Renewal fee patent year 03
	26.04.1989	Renewal fee patent year 04
	30.04.1990	Renewal fee patent year 05
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[A]EP0123929 (SICK OPTIK ELEKTRONIK ERWIN [DE]);
		[A]EP0075766 (BOEHRINGER MANNHEIM GMBH [DE]);
		[A]DE707745 (SIEMENS AG);
		[A]US4378159 (GALBRAITH LEE K);
		[A]US3845297 (MAEDA I, et al)

The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.

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