Extract from the Register of European Patents

EP About this file: EP0211353

EP0211353 - Method for the manufacture of a field effect transistor [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  23.04.1992
Database last updated on 09.04.2026
Most recent event   Tooltip23.04.1992No opposition filed within time limitpublished on 10.06.1992 [1992/24]
Applicant(s)For all designated states
NIPPON TELEGRAPH AND TELEPHONE CORPORATION
1-6 Uchisaiwai-cho 1-chome Chiyoda-ku
Tokyo 100 / JP
[N/P]
Former [1987/09]For all designated states
Nippon Telegraph and Telephone Corporation
1-6 Uchisaiwai-cho 1-chome Chiyoda-ku
Tokyo 100 / JP
Inventor(s)01 / Enoki, Takamoto
Soubudai-Ryo 2-183, Soubudai
Zama-shi Kanagawa 228 / JP
02 / Yamasaki, Kimiyoshi
Denden 5-101, 861-1 Ishida
Isehara-shi Kanagawa 259-11 / JP
03 / Ohwada, Kuniki
1074-47, Katakura-cho
Hachioji-shi Tokyo 192 / JP
[1987/09]
Representative(s)Sunderland, James Harry, et al
Haseltine Lake LLP Lincoln House 300 High Holborn London
WC1V 7JH / GB
[N/P]
Former [1987/09]Sunderland, James Harry, et al
HASELTINE LAKE & CO Hazlitt House 28 Southampton Buildings Chancery Lane
London WC2A 1AT / GB
Application number, filing date86110293.725.07.1986
[1987/09]
Priority number, dateJP1985016730429.07.1985         Original published format: JP 16730485
[1987/09]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0211353
Date:25.02.1987
Language:EN
[1987/09]
Type: A3 Search report 
No.:EP0211353
Date:19.11.1987
Language:EN
[1987/47]
Type: B1 Patent specification 
No.:EP0211353
Date:19.06.1991
Language:EN
[1991/25]
Search report(s)(Supplementary) European search report - dispatched on:EP28.09.1987
ClassificationIPC:H01L21/28
[1987/09]
CPC:
H10D30/0614 (EP,US); H10D64/0125 (EP,US); Y10S148/139 (EP,US)
Designated contracting statesDE,   FR,   GB [1987/09]
TitleGerman:Verfahren zur Herstellung eines Feldeffekttransistors[1987/09]
English:Method for the manufacture of a field effect transistor[1987/09]
French:Méthode de fabrication d'un transistor à effet de champ[1987/09]
Examination procedure29.01.1988Examination requested  [1988/13]
09.10.1989Despatch of a communication from the examining division (Time limit: M06)
18.04.1990Reply to a communication from the examining division
05.07.1990Despatch of communication of intention to grant (Approval: No)
07.12.1990Despatch of communication of intention to grant (Approval: later approval)
14.12.1990Communication of intention to grant the patent
07.03.1991Fee for grant paid
07.03.1991Fee for publishing/printing paid
Opposition(s)20.03.1992No opposition filed within time limit [1992/24]
Fees paidRenewal fee
13.07.1988Renewal fee patent year 03
18.07.1989Renewal fee patent year 04
17.07.1990Renewal fee patent year 05
28.12.1990Renewal fee patent year 06
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Documents cited:Search[Y] JP57103364  
 [Y]   PATENT ABSTRACTS OF JAPAN, vol. 6, no. 189 (E-133)[1067], 28th September 1982; & JP-A-57 103 364 (NIPPON DENSHIN DENWA KOSHA) 26-06-1982 [Y]
 [Y]   IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. ED-29, no. 11, November 1982, pages 1772-1777, IEEE, New York, US; KIMIYOSHI YAMASAKI et al.: "GaAs LSI-directed MESFET's with a self-aligned implantation for n+-layer technology (SAINT)" [Y]
 [A]   IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. ED-25, no. 10, October 1978, pages 1213-1218, IEEE, New York, US; SUSUMU TAKAHASHI et al.: "Submicrometer gate fabrication of GaAs MESFET by plasma etching" [A]
 [XP]   JAPANESE JOURNAL OF APPLIED PHYSICS, supplements 17th Conference on Solid State Devices and Materials, 25th-27th August 1985, pages 413-416, Tokyo, JP; T. ENOKI et al.: "Advanced GaAs SAINT FET fabrication technology and its application to above 9 GHz frequency divider" [XP]
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