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EP0204365
European procedure
Extract from the Register of European Patents
EP About this file: EP0204365
| EP0204365 - Measuring apparatus and method employing hard X-rays [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 09.01.1992 Database last updated on 11.04.2026 | Most recent event Tooltip | 09.01.1992 | No opposition filed within time limit | published on 26.02.1992 [1992/09] | Applicant(s) | For all designated states Fujisaki, Yukio 705, Daiichi-Kodan, 20-23 Hakataeki-mae 4-chome Hakata-ku Fukuoka-shi Fukuoka 812 / JP | [N/P] |
| Former [1986/50] | For all designated states Fujisaki, Yukio 705, Daiichi-Kodan, 20-23 Hakataeki-mae 4-chome Hakata-ku Fukuoka-shi Fukuoka 812 / JP | Inventor(s) | 01 /
see applicant ... | [1986/50] | Representative(s) | Kupecz, Arpad, et al Octrooibureau Los en Stigter B.V. P.O. Box 20052 1000 HB Amsterdam / NL | [N/P] |
| Former [1986/50] | Kupecz, Arpad, et al Octrooibureau Los en Stigter B.V. Postbox 20052 NL-1000 HB Amsterdam / NL | Application number, filing date | 86200879.4 | 21.05.1986 | [1986/50] | Priority number, date | JP19850078312 | 24.05.1985 Original published format: JP 7831285 | [1986/50] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0204365 | Date: | 10.12.1986 | Language: | EN | [1986/50] | Type: | A3 Search report | No.: | EP0204365 | Date: | 07.12.1988 | Language: | EN | [1988/49] | Type: | B1 Patent specification | No.: | EP0204365 | Date: | 06.03.1991 | Language: | EN | [1991/10] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 18.10.1988 | Classification | IPC: | G01N23/083, G21K1/10, G21K3/00 | [1991/10] | CPC: |
H01H51/28 (EP,US);
G01N23/04 (EP,US)
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| Former IPC [1988/48] | G01N23/08, G21K1/10, G21K3/00 | ||
| Former IPC [1986/50] | G01N23/08, G21K1/10 | Designated contracting states | DE, FR, GB, IT, NL, SE [1986/50] | Title | German: | Messverfahren und -vorrichtung unter Verwendung harter Röntgenstrahlen | [1986/50] | English: | Measuring apparatus and method employing hard X-rays | [1986/50] | French: | Méthode et appareil de mesure utilisant des rayons X durs | [1986/50] | Examination procedure | 27.01.1989 | Examination requested [1989/13] | 31.05.1990 | Despatch of communication of intention to grant (Approval: Yes) | 22.08.1990 | Communication of intention to grant the patent | 13.11.1990 | Fee for grant paid | 13.11.1990 | Fee for publishing/printing paid | Opposition(s) | 07.12.1991 | No opposition filed within time limit [1992/09] | Fees paid | Renewal fee | 31.05.1988 | Renewal fee patent year 03 | 31.05.1989 | Renewal fee patent year 04 | 31.05.1990 | Renewal fee patent year 05 |
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