EP0209952 - Method for the measurement of the spatial distribution of scattering cross-sections in elastically scattered X-radiation, and arrangement for carrying out such a method [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 17.09.1992 Database last updated on 19.10.2024 | Most recent event Tooltip | 17.09.1992 | No opposition filed within time limit | published on 11.11.1992 [1992/46] | Applicant(s) | For:DE
Philips Corporate Intellectual Property GmbH Habsburgerallee 11 52064 Aachen / DE | For:FR
GB
Koninklijke Philips Electronics N.V. Groenewoudseweg 1 5621 BA Eindhoven / NL | [N/P] |
Former [1987/05] | For:DE
Philips Patentverwaltung GmbH Röntgenstrasse 24 D-22335 Hamburg / DE | ||
For:FR
GB
Philips Electronics N.V. Groenewoudseweg 1 NL-5621 BA Eindhoven / NL | Inventor(s) | 01 /
Harding, Geoffrey, Dr. Poststrasse 18c D-2083 Halstenbek / DE | 02 /
Kosanetzky, Josef-Maria, Dr. Langenharmer Ring 120 D-2000 Norderstedt 1 / DE | 03 /
Neitzel, Ulrich, Dr. Kipps Weg 3 D-2000 Hamburg 65 / DE | [1987/05] | Representative(s) | David, Günther M., et al Philips Patentverwaltung GmbH Postfach 10 51 49 20035 Hamburg / DE | [N/P] |
Former [1987/05] | David, Günther M., et al Philips Patentverwaltung GmbH Postfach 10 51 49 D-20035 Hamburg / DE | Application number, filing date | 86201250.7 | 16.07.1986 | [1987/05] | Priority number, date | DE19853526015 | 20.07.1985 Original published format: DE 3526015 | [1987/05] | Filing language | DE | Procedural language | DE | Publication | Type: | A2 Application without search report | No.: | EP0209952 | Date: | 28.01.1987 | Language: | DE | [1987/05] | Type: | A3 Search report | No.: | EP0209952 | Date: | 03.05.1989 | Language: | DE | [1989/18] | Type: | B1 Patent specification | No.: | EP0209952 | Date: | 13.11.1991 | Language: | DE | [1991/46] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 15.03.1989 | Classification | IPC: | G01N23/20, G01T1/29, A61B6/02 | [1987/05] | CPC: |
G01N23/201 (EP,US);
G21K2207/005 (EP,US)
| Designated contracting states | DE, FR, GB [1987/05] | Title | German: | Verfahren zum Bestimmen der räumlichen Verteilung der Streuquerschnitte für elastisch gestreute Röntgenstrahlung und Anordnung zur Durchführung des Verfahrens | [1987/05] | English: | Method for the measurement of the spatial distribution of scattering cross-sections in elastically scattered X-radiation, and arrangement for carrying out such a method | [1987/05] | French: | Procédé pour la mesure de la répartition spatiale de rayonnement X diffusé élastiquement ainsi que le dispositif pour la mise en oeuvre du procédé | [1987/05] | Examination procedure | 27.10.1989 | Examination requested [1989/52] | 18.01.1991 | Despatch of communication of intention to grant (Approval: Yes) | 14.05.1991 | Communication of intention to grant the patent | 26.07.1991 | Fee for grant paid | 26.07.1991 | Fee for publishing/printing paid | Opposition(s) | 14.08.1992 | No opposition filed within time limit [1992/46] | Fees paid | Renewal fee | 19.07.1988 | Renewal fee patent year 03 | 14.07.1989 | Renewal fee patent year 04 | 16.07.1990 | Renewal fee patent year 05 | 22.07.1991 | Renewal fee patent year 06 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [AD]DE2432905 (WAECHTLER MAXIMILIAN DR); | [A]DE2544354 (SIEMENS AG) | Examination | DE2432305 |