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Extract from the Register of European Patents

EP About this file: EP0271646

EP0271646 - Device for the contactless measurement of a distance from a surface, especially for the palpation of a contour of a surface of a worked article along a measuring path [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  01.11.1991
Database last updated on 22.08.2024
Most recent event   Tooltip11.02.1993Lapse of the patent in a contracting state
New state(s): GB
published on 31.03.1993 [1993/13]
Applicant(s)For all designated states
Hommelwerke GmbH
Alte Tuttlinger Strasse 20
D-78056 Villingen-Schwenningen / DE
[1988/25]
Inventor(s)01 / Ulbers, Gerd, Dr.
Lindenbaumstrasse 20
D-7730 VS-Weilersbach / DE
02 / Hutter, Karl, Dipl.-Ing.
Ortholzweg 11
D-7730 VS-Mühlhausen / DE
[1988/25]
Representative(s)Leine, Sigurd, et al
Leine & Wagner Patentanwälte Burckhardtstrasse 1
30163 Hannover / DE
[N/P]
Former [1988/25]Leine, Sigurd, Dipl.-Ing., et al
LEINE & KÖNIG Patentanwälte Burckhardtstrasse 1
D-30163 Hannover / DE
Application number, filing date87113658.618.09.1987
[1988/25]
Priority number, dateDE1986364350019.12.1986         Original published format: DE 3643500
DE1987371942211.06.1987         Original published format: DE 3719422
[1988/25]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP0271646
Date:22.06.1988
Language:DE
[1988/25]
Type: B1 Patent specification 
No.:EP0271646
Date:02.01.1991
Language:DE
[1991/01]
Search report(s)(Supplementary) European search report - dispatched on:EP14.04.1988
ClassificationIPC:G01B11/30, G01B11/24
[1988/25]
CPC:
G01B11/24 (EP,US); G01B11/303 (EP,US)
Designated contracting statesCH,   FR,   GB,   IT,   LI,   SE [1988/25]
TitleGerman:Vorrichtung zur berührungsfreien Messung eines Abstandes von einer Oberfläche, insbesondere zur Abtastung einer Kontur einer Oberfläche eines Werkstückes länges eines Messweges[1988/25]
English:Device for the contactless measurement of a distance from a surface, especially for the palpation of a contour of a surface of a worked article along a measuring path[1988/25]
French:Dispositif de mesure sans contact d'une distance d'une surface, en particulier pour palper un contour d'une surface d'une pièce d'oeuvre le long d'une trajectoire de mesure[1988/25]
Examination procedure06.05.1988Examination requested  [1988/27]
26.10.1989Despatch of a communication from the examining division (Time limit: M04)
14.12.1989Reply to a communication from the examining division
15.01.1990Despatch of a communication from the examining division (Time limit: M02)
21.03.1990Reply to a communication from the examining division
08.05.1990Despatch of communication of intention to grant (Approval: Yes)
04.07.1990Communication of intention to grant the patent
20.09.1990Fee for grant paid
20.09.1990Fee for publishing/printing paid
Opposition(s)03.10.1991No opposition filed within time limit [1991/52]
Fees paidRenewal fee
21.08.1989Renewal fee patent year 03
07.09.1990Renewal fee patent year 04
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Lapses during opposition  TooltipGB18.09.1991
SE19.09.1991
CH30.09.1991
LI30.09.1991
[1993/13]
Former [1992/33]SE19.09.1991
CH30.09.1991
LI30.09.1991
Former [1992/24]SE19.09.1991
Documents cited:SearchEP0070141  [ ] (RENISHAW ELECTRICAL LTD [GB]);
 EP0177038  [ ] (HITACHI LTD [JP]);
 DE3342675  [ ] (ZEISS CARL FA [DE]);
 DE3231719  [ ] (ZEISS CARL FA [DE]);
 DE3540596  [ ] (JENOPTIK JENA GMBH [DD])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.