Extract from the Register of European Patents

EP About this file: EP0235911

EP0235911 - Level detecting waveform sampling system [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  05.11.1994
Database last updated on 09.04.2026
Most recent event   Tooltip17.04.2015Change - lapse in a contracting state
Updated state(s): FR
published on 20.05.2015  [2015/21]
Applicant(s)For all designated states
TEKTRONIX, INC.
Tektronix Industrial Park D/S Y3-121 4900 S.W. Griffith Drive P.O. Box 500 Beaverton
Oregon 97077 / US
[N/P]
Former [1987/37]For all designated states
TEKTRONIX, INC.
Tektronix Industrial Park D/S Y3-121 4900 S.W. Griffith Drive P.O. Box 500
Beaverton Oregon 97077 / US
Inventor(s)01 / Reuss, Edward L.
2035 S.W. 185th
Aloha Oregon 97006 / US
02 / Hollister, Allen Leonard
12643 Oak Knoll Road
Poway California 92064 / US
[1987/37]
Representative(s)Wombwell, Francis, et al
Forresters
15, Hamilton Square
Birkenhead
Merseyside CH41 6BR / GB
[N/P]
Former [1987/37]Wombwell, Francis, et al
Potts, Kerr & Co. 15, Hamilton Square
Birkenhead Merseyside L41 6BR / GB
Application number, filing date87300622.526.01.1987
[1987/37]
Priority number, dateUS1986083541703.03.1986         Original published format: US 835417
[1987/37]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0235911
Date:09.09.1987
Language:EN
[1987/37]
Type: A3 Search report 
No.:EP0235911
Date:26.10.1988
Language:EN
[1988/43]
Type: B1 Patent specification 
No.:EP0235911
Date:05.01.1994
Language:EN
[1994/01]
Search report(s)(Supplementary) European search report - dispatched on:EP08.09.1988
ClassificationIPC:G01R13/34, H03K5/135
[1988/43]
CPC:
G01R13/34 (EP,US); H03K5/135 (EP,US)
Former IPC [1987/37]G01R13/34
Designated contracting statesCH,   DE,   FR,   GB,   LI,   NL [1987/37]
TitleGerman:Niveaudetektor für ein Wellenform-Abtastsystem[1987/37]
English:Level detecting waveform sampling system[1987/37]
French:Détecteur de niveau pour une forme de l'onde d'un système échantillonneur[1987/37]
File destroyed:15.01.2000
Examination procedure11.04.1989Examination requested  [1989/24]
04.09.1991Despatch of a communication from the examining division (Time limit: M04)
19.12.1991Reply to a communication from the examining division
16.04.1992Despatch of a communication from the examining division (Time limit: M04)
13.08.1992Reply to a communication from the examining division
16.10.1992Despatch of a communication from the examining division (Time limit: M02)
01.12.1992Reply to a communication from the examining division
07.04.1993Despatch of communication of intention to grant (Approval: Yes)
06.07.1993Communication of intention to grant the patent
26.08.1993Fee for grant paid
26.08.1993Fee for publishing/printing paid
Opposition(s)06.10.1994No opposition filed within time limit [1994/52]
Fees paidRenewal fee
27.01.1989Renewal fee patent year 03
04.01.1990Renewal fee patent year 04
17.12.1990Renewal fee patent year 05
10.12.1991Renewal fee patent year 06
16.12.1992Renewal fee patent year 07
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Lapses during opposition  TooltipCH05.01.1994
DE05.01.1994
FR05.01.1994
LI05.01.1994
NL05.01.1994
GB05.04.1994
[2015/21]
Former [1995/19]CH05.01.1994
DE05.01.1994
LI05.01.1994
NL05.01.1994
GB05.04.1994
FR27.05.1994
Former [1995/08]CH05.01.1994
DE05.01.1994
LI05.01.1994
NL05.01.1994
FR27.05.1994
Former [1995/03]CH05.01.1994
DE05.01.1994
LI05.01.1994
FR27.05.1994
Former [1994/45]CH05.01.1994
DE05.01.1994
LI05.01.1994
Former [1994/31]CH05.01.1994
LI05.01.1994
Documents cited:Search[A]   JOURNAL OF ELECTRONIC ENGINEERING, vol. 17, no. 161, May 1980, page 42-45, Tokyo, JP; K. KOBAYASHI: "Sampling oscilloscopes become sophisticated with new technology" [A]
 [AP]   HEWLETT-PACKARD JOURNAL, April 1986, pages 26-33; S.A. GENTHER et al.:"Hardware implementation of a high-performance trigger system" [AP]
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