blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability
Register Forum

2022.02.11

More...
blank News flashes

News flashes

New version of the European Patent Register - SPC information for Unitary Patents.

2024-03-06

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP0283610

EP0283610 - Improvements in or relating to the testing of electronic equipment [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  14.12.1989
Database last updated on 07.06.2024
Most recent event   Tooltip07.07.2007Change - inventorpublished on 08.08.2007  [2007/32]
Applicant(s)For all designated states
Hewlett-Packard Limited
Nine Mile Ride Wokingham
Berkshire RG11 3LL / GB
[N/P]
Former [1991/02]For all designated states
Hewlett-Packard Limited
Nine Mile Ride
Wokingham, Berkshire RG11 3LL / GB
Former [1988/39]For all designated states
Hewlett Packard Ltd
Nine Mile Ride
Wokingham, Berkshire RG11 3LL / GB
Inventor(s)01 / Paterson, Eric Paul
19 Grange Road
Edinburgh EH9 1UQ / GB
02 / Moule, Anthony William
21 Viewforth Gardens
Edinburgh EH10 4ET / GB
[1988/39]
Representative(s)Smith, Norman Ian, et al
Cleveland
40-43 Chancery Lane
London WC2A 1JQ / GB
[N/P]
Former [1988/39]Smith, Norman Ian, et al
F.J. CLEVELAND & COMPANY 40-43 Chancery Lane
London WC2A 1JQ / GB
Application number, filing date87302667.827.03.1987
[1988/39]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0283610
Date:28.09.1988
Language:EN
[1988/39]
Search report(s)(Supplementary) European search report - dispatched on:EP19.10.1987
ClassificationIPC:G06F11/22, G06F11/32
[1988/39]
CPC:
G06F11/22 (EP); G06F11/321 (EP); G06F11/267 (EP)
Designated contracting statesDE,   FR,   GB [1988/47]
Former [1988/39]AT,  BE,  CH,  DE,  ES,  FR,  GB,  GR,  IT,  LI,  LU,  NL,  SE 
TitleGerman:Testen von elektronischer Einrichtung[1988/39]
English:Improvements in or relating to the testing of electronic equipment[1988/39]
French:Test d'équipement électronique[1988/39]
File destroyed:26.06.1996
Examination procedure29.03.1988Loss of particular rights, legal effect: designated state(s)
28.06.1988Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, ES, GR, IT, LU, NL, SE
01.03.1989Examination requested  [1989/18]
02.12.1989Application withdrawn by applicant  [1990/05]
Fees paidRenewal fee
28.03.1989Renewal fee patent year 03
Penalty fee
Penalty fee Rule 85a EPC 1973
28.03.1988AT   M02   Not yet paid
28.03.1988BE   M02   Not yet paid
28.03.1988CH   M02   Not yet paid
28.03.1988ES   M02   Not yet paid
28.03.1988GR   M02   Not yet paid
28.03.1988IT   M02   Not yet paid
28.03.1988LU   M02   Not yet paid
28.03.1988NL   M02   Not yet paid
28.03.1988SE   M02   Not yet paid
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]EP0199273  ;
 [X]EP0121570  ;
 [Y]EP0138535  ;
 [E]US4654852
 [Y]  - IEEE AUTOTESTCON '81 PROCEEDINGS, Orlando, Florida, 19th-21st October 1981, pages 140-148, IEEE, New York, US; V. MONIE: "Color graphics in ATE"
 [A]  - SIEMENS FORSCHUNGS- UND ENTWICKLUNGSBERICHTE, vol. 12, no. 1, 1983, pages 47-54, Springer Verlag, Würzburg, DE; P.P. FASANG: "Microbit, a method of built-in test for microcomputers"
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.