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Extract from the Register of European Patents

EP About this file: EP0266268

EP0266268 - Method of depositing an insulating layer on a III-V material substrate by chemical vapour deposition with thermal irradiation, use in the production of an MIS structure [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  27.05.1993
Database last updated on 07.06.2024
Most recent event   Tooltip27.05.1993No opposition filed within time limitpublished on 14.07.1993 [1993/28]
Applicant(s)For all designated states
Nissim, Yves
14, rue des Pavillons
F-92800 Puteaux / FR
For all designated states
BENSOUSSAN, Marcel
881 Cours Aquitaine
F-92100 Boulogne / FR
[1988/18]
Inventor(s)01 / Nissim, Yves
14, rue des Pavillons
F-92800 Puteaux / FR
02 / Bensoussan, Marcel
991 Cours Aquitaine
F-92100 Boulogne / FR
[1988/18]
Representative(s)Mongrédien, André, et al
c/o BREVATOME 25, rue de Ponthieu
F-75008 Paris / FR
[1988/18]
Application number, filing date87402397.123.10.1987
[1988/18]
Priority number, dateFR1986001489627.10.1986         Original published format: FR 8614896
[1988/18]
Filing languageFR
Procedural languageFR
PublicationType: A1 Application with search report 
No.:EP0266268
Date:04.05.1988
Language:FR
[1988/18]
Type: B1 Patent specification 
No.:EP0266268
Date:22.07.1992
Language:FR
[1992/30]
Search report(s)(Supplementary) European search report - dispatched on:EP03.03.1988
ClassificationIPC:H01L21/314, H01L21/316, H01L21/318, H01L21/28
[1988/18]
CPC:
H01L29/66522 (EP,US); H01L21/02112 (EP,US); H01L21/02164 (EP,US);
H01L21/0217 (EP,US); H01L21/02247 (EP,US); H01L21/02255 (EP,US);
H01L21/02271 (EP,US); H01L21/02312 (EP,US); H01L21/28264 (EP,US);
H01L21/314 (US); H01L21/31608 (US); H01L21/3185 (US) (-)
Designated contracting statesDE,   FR,   GB [1988/18]
TitleGerman:Chemischer Dampfniederschlag mit Wärmestrahlung von einer Isolierschicht auf ein Substrat aus III-V-Material, Verwendung zur Herstellung einer MIS-Struktur[1988/18]
English:Method of depositing an insulating layer on a III-V material substrate by chemical vapour deposition with thermal irradiation, use in the production of an MIS structure[1988/18]
French:Procédé de dépot en phase vapeur à flash thermique d'une couche isolante sur un substrat en matériau III-V, application à la fabrication d'une structure MIS[1992/30]
Former [1988/18]Procédé de dépot en phase vapeur à flash thermique d'une couche isolante sur un substrat en matériau III-V, application à la fabrication d'une structure mis
Examination procedure06.10.1988Examination requested  [1988/48]
11.12.1990Despatch of a communication from the examining division (Time limit: M04)
30.03.1991Reply to a communication from the examining division
08.10.1991Despatch of communication of intention to grant (Approval: Yes)
22.01.1992Communication of intention to grant the patent
09.03.1992Fee for grant paid
09.03.1992Fee for publishing/printing paid
Opposition(s)23.04.1993No opposition filed within time limit [1993/28]
Fees paidRenewal fee
20.10.1989Renewal fee patent year 03
19.10.1990Renewal fee patent year 04
18.10.1991Renewal fee patent year 05
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Documents cited:Search[Y]JP5710240  ;
 [A]US4371587  (PETERS JOHN W);
 [A]US4532695  (SCHUERMEYER FRITZ L [US]);
 [A]WO8605320  (SONY CORP [JP])
 [X]  - EXTENDED ABSTRACTS OF THE 16TH (1984 INTERNATIONAL) CONFERENCE ON SOLID STATE DEVICES AND MATERIALS, Kobe, 30 août - 1 septembre 1984, pages 663-666, Tokyo, JP; N. HAYAFUJI et al.: "Photo-CVD dielectric films on InP"
 [Y]  - PATENT ABSTRACTS OF JAPAN, vol 6, no. 67 (E-104)[945], 28 avril 1982; & JP-A-57 10 240 (SONY K.K.) 19-01-1982, & JP5710240 A 00000000
 [Y]  - REVUE DE PHYSIQUE APPLIQUEE, vol. 19, no. 2, février 1984, pages 155-159, Orsay, FR; R. CARMONA et al.: "The rôle of plasma oxide in InP MIS structures"
 [A]  - JOURNAL OF THE ELECTROCHEMICAL SOCIETY, vol. 124, no. 11, novembre 1977, pages 1781-1784; K.V. VAIDYANATHAN et al.: "Study of encapsulants for annealing GaAs"
 [A]  - THIN SOLID FILMS, vol. 64, no. 1, novembre 1979, pages 49-55, Elsevier Sequoia S.A., Lausanne, CH; C.W. WILMSEN et al.: "Interface formation of deposited insulator layers on GaAs and InP"
 [A]  - APPLIED PHYSICS LETTERS, vol. 42, no. 11, 1 juin 1983, pages 950-952, American Institute of Physics, New York, US; F.H.P.M. HABRAKEN et al.: "Surface and interface nitridation of thin polycrystalline silicon films"
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.