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EP0304793

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Extract from the Register of European Patents

EP About this file: EP0304793

EP0304793 - Device for the determination of the thickness of film bases [Right-click to bookmark this link]
Status	No opposition filed within time limit Status updated on 28.08.1993 Database last updated on 11.04.2026
Most recent event Tooltip	28.08.1993	No opposition filed within time limit	published on 20.10.1993 [1993/42]
Applicant(s)	For all designated states BASF Magnetics GmbH Dynamostrasse 3 68165 Mannheim / DE
	[N/P]
Former [1991/46]	For all designated states BASF Magnetics GmbH Dynamostrasse 3 D-68165 Mannheim / DE
Former [1989/09]	For all designated states Agfa-Gevaert AG Kaiser-Wilhelm-Allee D-51373 Leverkusen / DE
Inventor(s)	01 / Zierl, Richard, Dr. Flurstrasse 21 D-8031 Eichenau / DE
	02 / Kreuzer, Erwin, Dipl.-Ing. Goethering 56 D-8018 Grafing / DE
	03 / Zuckermayr, Alfred Gerhart-Hauptmann-Ring, 8 D-8000 München 83 / DE
	[1989/09]
Representative(s)	Münch, Volker, et al Dres. Fitzner & Münch Rechts- und Patentanwälte Hauser Ring 10 40878 Ratingen / DE
	[N/P]
Former [1991/46]	Münch, Volker, et al BASF Aktiengesellschaft, Patentabteilung ZDX - C 6 D-67056 Ludwigshafen / DE
Former [1991/38]	Langfinger, Klaus-Dieter, Dr. BASF Aktiengesellschaft, Carl-Bosch-Strasse 38 D-67056 Ludwigshafen / DE
Application number, filing date	88113388.8	18.08.1988
	[1989/09]
Priority number, date	DE19873728704	28.08.1987 Original published format: DE 3728704
	[1989/09]
Filing language	DE
Procedural language	DE
Publication	Type:	A2 Application without search report
	No.:	EP0304793
	Date:	01.03.1989
	Language:	DE
	[1989/09]
	Type:	A3 Search report
	No.:	EP0304793
	Date:	12.09.1990
	Language:	DE
	[1990/37]
	Type:	B1 Patent specification
	No.:	EP0304793
	Date:	28.10.1992
	Language:	DE
	[1992/44]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	26.07.1990
Classification	IPC:	G01B11/06	[1989/09]
	CPC:	G01B11/0691 (EP,US)
Designated contracting states	DE, FR, GB, IT [1989/09]
Title	German:	Vorrichtung zur Bestimmung der Dicke von Schichtträgern	[1989/09]
	English:	Device for the determination of the thickness of film bases	[1989/09]
	French:	Dispositif pour la détermination de l'épaisseur de supports d'enduits	[1992/44]
	Former [1989/09]	Dispositif pour la détermination de l'épaisseur des bases
Examination procedure	18.08.1988	Examination requested [1989/09]
	16.07.1991	Despatch of a communication from the examining division (Time limit: M04)
	30.10.1991	Reply to a communication from the examining division
	23.12.1991	Despatch of communication of intention to grant (Approval: Yes)
	04.03.1992	Communication of intention to grant the patent
	16.04.1992	Fee for grant paid
	16.04.1992	Fee for publishing/printing paid
Opposition(s)	29.07.1993	No opposition filed within time limit [1993/42]
Fees paid	Renewal fee
	18.07.1990	Renewal fee patent year 03
	28.12.1990	Renewal fee patent year 04
	18.08.1992	Renewal fee patent year 05
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[AP] ISA TRANSACTIONS, Band 27, Nr. 1, 1988, Seiten 31-42, Research Triangle Park, NC, US; P. CIELO et al.: "On-Line Electro-Optical Instrumentation for Continuous Quality Control of Manufactured Sheets". [AP]
		[A] ADVANCES IN INSTRUMENTATION, Band 42, Teil 3, 1987, Seiten 1601-1614, Research Triangle Park, NC, US; P. CIELO et al.: "On-Line Electro-Optical Instrumentation for Continuous Quality Control of Manufactured Sheets". [A]

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