EP0307729 - Test arrangement for electronic circuits [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 01.09.1992 Database last updated on 15.06.2024 | Most recent event Tooltip | 01.09.1992 | Application deemed to be withdrawn | published on 21.10.1992 [1992/43] | Applicant(s) | For all designated states SIEMENS AKTIENGESELLSCHAFT Werner-von-Siemens-Str. 1 DE-80333 München / DE | [N/P] |
Former [1989/12] | For all designated states SIEMENS AKTIENGESELLSCHAFT Wittelsbacherplatz 2 D-80333 München / DE | Inventor(s) | 01 /
Kolb, Eberhard, Dipl.-Phys. Belchenstrasse 60 D-7516 Karlsbad / DE | [1989/12] | Application number, filing date | 88114297.0 | 01.09.1988 | [1989/12] | Priority number, date | DE19873729712 | 04.09.1987 Original published format: DE 3729712 | [1989/12] | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | EP0307729 | Date: | 22.03.1989 | Language: | DE | [1989/12] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 30.01.1989 | Classification | IPC: | G01R15/00, G01R33/06 | [1989/12] | CPC: |
G01R15/205 (EP)
| Designated contracting states | DE, FR, GB, IT [1989/12] | Title | German: | Prüfanordnung für elektronische Schaltungen | [1989/12] | English: | Test arrangement for electronic circuits | [1989/12] | French: | Dispositif de test pour circuits électroniques | [1989/12] | File destroyed: | 12.06.1999 | Examination procedure | 29.05.1989 | Examination requested [1989/30] | 10.12.1991 | Despatch of a communication from the examining division (Time limit: M04) | 22.04.1992 | Application deemed to be withdrawn, date of legal effect [1992/43] | 25.05.1992 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [1992/43] | Fees paid | Renewal fee | 20.12.1990 | Renewal fee patent year 03 | 02.01.1991 | Renewal fee patent year 04 | Penalty fee | Additional fee for renewal fee | 01.10.1990 | 03   M06   Fee paid on   20.12.1990 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US3365665 ; | [A]DE1516123 | [AD] - IBM TECHNICAL DISCLOSURE BULLETIN, Band 18, Nr. 8, Januar 1976, Seiten 2745-2748, New York, US; C.H. BAJOREK et al.: "Magnetoresistive current sensor" | [A] - K.-W. DUGGE et al.: "Grundlagen der Elektronik", 1985, Seiten 351,372-375, Vogel-Buchverlag, Würzburg, DE | [A] - IBM TECHNICAL DISCLOSURE BULLETIN, Band 18, Nr. 11, April 1976, Seiten 3847-3851, New York, US; J.S. FENG: "Self-biased magnetoresistive bridge configuration for current measurement" | [A] - JOURNAL OF PHYSICS E- SCIENTIFIC INSTRUMENTS, Band 19, Nr. 7, July 1986, Seiten 502-515, The Institute of Physics, Bristol, GB; W. KWIATKOWSKI et al.: "The permalloy magnetoresistive sensors - properties and applications" |