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Extract from the Register of European Patents

EP About this file: EP0307729

EP0307729 - Test arrangement for electronic circuits [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  01.09.1992
Database last updated on 15.06.2024
Most recent event   Tooltip01.09.1992Application deemed to be withdrawnpublished on 21.10.1992 [1992/43]
Applicant(s)For all designated states
SIEMENS AKTIENGESELLSCHAFT
Werner-von-Siemens-Str. 1
DE-80333 München / DE
[N/P]
Former [1989/12]For all designated states
SIEMENS AKTIENGESELLSCHAFT
Wittelsbacherplatz 2
D-80333 München / DE
Inventor(s)01 / Kolb, Eberhard, Dipl.-Phys.
Belchenstrasse 60
D-7516 Karlsbad / DE
[1989/12]
Application number, filing date88114297.001.09.1988
[1989/12]
Priority number, dateDE1987372971204.09.1987         Original published format: DE 3729712
[1989/12]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP0307729
Date:22.03.1989
Language:DE
[1989/12]
Search report(s)(Supplementary) European search report - dispatched on:EP30.01.1989
ClassificationIPC:G01R15/00, G01R33/06
[1989/12]
CPC:
G01R15/205 (EP)
Designated contracting statesDE,   FR,   GB,   IT [1989/12]
TitleGerman:Prüfanordnung für elektronische Schaltungen[1989/12]
English:Test arrangement for electronic circuits[1989/12]
French:Dispositif de test pour circuits électroniques[1989/12]
File destroyed:12.06.1999
Examination procedure29.05.1989Examination requested  [1989/30]
10.12.1991Despatch of a communication from the examining division (Time limit: M04)
22.04.1992Application deemed to be withdrawn, date of legal effect  [1992/43]
25.05.1992Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [1992/43]
Fees paidRenewal fee
20.12.1990Renewal fee patent year 03
02.01.1991Renewal fee patent year 04
Penalty fee
Additional fee for renewal fee
01.10.199003   M06   Fee paid on   20.12.1990
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]US3365665  ;
 [A]DE1516123
 [AD]  - IBM TECHNICAL DISCLOSURE BULLETIN, Band 18, Nr. 8, Januar 1976, Seiten 2745-2748, New York, US; C.H. BAJOREK et al.: "Magnetoresistive current sensor"
 [A]  - K.-W. DUGGE et al.: "Grundlagen der Elektronik", 1985, Seiten 351,372-375, Vogel-Buchverlag, Würzburg, DE
 [A]  - IBM TECHNICAL DISCLOSURE BULLETIN, Band 18, Nr. 11, April 1976, Seiten 3847-3851, New York, US; J.S. FENG: "Self-biased magnetoresistive bridge configuration for current measurement"
 [A]  - JOURNAL OF PHYSICS E- SCIENTIFIC INSTRUMENTS, Band 19, Nr. 7, July 1986, Seiten 502-515, The Institute of Physics, Bristol, GB; W. KWIATKOWSKI et al.: "The permalloy magnetoresistive sensors - properties and applications"
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.