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Extract from the Register of European Patents

EP About this file: EP0294938

EP0294938 - Exponential decay time constant measurement using frequency of offset-phase locked loop: system and method [Right-click to bookmark this link]
StatusPatent revoked
Status updated on  14.01.2000
Database last updated on 07.10.2024
Most recent event   Tooltip15.08.2008Change - applicantpublished on 17.09.2008  [2008/38]
Applicant(s)For all designated states
Hewlett-Packard Company
3000 Hanover Street
Palo Alto, CA 94304-1112 / US
[N/P]
Former [2008/38]For all designated states
Hewlett-Packard Company
3000 Hanover Street
Palo Alto CA 94304-1112 / US
Former [1991/02]For all designated states
Hewlett-Packard Company
Mail Stop 20 B-O, 3000 Hanover Street
Palo Alto, California 94304 / US
Former [1988/50]For all designated states
Hewlett-Packard Company
3000 Hanover Street
Palo Alto California 94304 / US
Inventor(s)01 / Dukes, John Noland
27783 Lupine Road
Los Altos Hills, CA 94022 / US
02 / Carlsen, William F., Jr.
2061 Carol Avenue
Mountain View, CA 94040 / US
03 / Pittaro, Richard J.
70 Curry Court
San Carlos, CA 94070 / US
[1988/50]
Representative(s)Williams, John Francis, et al
WILLIAMS, POWELL & ASSOCIATES 4 St Paul's Churchyard
London EC4M 8AY / GB
[N/P]
Former [1988/50]Williams, John Francis, et al
WILLIAMS, POWELL & ASSOCIATES 34 Tavistock Street
London WC2E 7PB / GB
Application number, filing date88304136.006.05.1988
[1988/50]
Priority number, dateUS1987004781808.05.1987         Original published format: US 47818
[1988/50]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0294938
Date:14.12.1988
Language:EN
[1988/50]
Type: A3 Search report 
No.:EP0294938
Date:28.03.1990
Language:EN
[1990/13]
Type: B1 Patent specification 
No.:EP0294938
Date:26.08.1992
Language:EN
[1992/35]
Search report(s)(Supplementary) European search report - dispatched on:EP08.02.1990
ClassificationIPC:G01N21/64, G01R25/00, G01R23/00
[1990/13]
CPC:
G01N21/6408 (EP,US); G01N25/00 (EP,US); G01R23/00 (EP,US);
G01N2021/3144 (EP,US); G01N21/6428 (EP,US); Y10T436/207497 (EP,US);
Y10T436/209163 (EP,US) (-)
Former IPC [1988/50]G01N21/64, G01R23/00
Designated contracting statesDE,   FR,   GB [1988/50]
TitleGerman:System und Verfahren zur Messung der Zeitkonstante eines Exponentialzerfalls über die Frequenz einer Offset-Phasenregelschleife[1988/50]
English:Exponential decay time constant measurement using frequency of offset-phase locked loop: system and method[1988/50]
French:Système et procédé pour mesurer la constance de temps d'une décroissance exponentielle en utilisant la fréquence d'une boucle de régulation de phase offset[1988/50]
Examination procedure16.08.1990Examination requested  [1990/41]
05.12.1991Despatch of communication of intention to grant (Approval: Yes)
27.02.1992Communication of intention to grant the patent
30.03.1992Fee for grant paid
30.03.1992Fee for publishing/printing paid
Opposition(s)Opponent(s)01  19.05.1993  04.06.1993  ADMISSIBLE
Radiometer A/S
Akandevej 21
DK-2700 Bronshoj / DK
 [N/P]
Former [1993/28]
Opponent(s)01  19.05.1993  04.06.1993  ADMISSIBLE
Radiometer A/S
Emdrupvej 72
DK-2400 Kopenhagen NV / DK
30.06.1993Invitation to proprietor to file observations on the notice of opposition
20.12.1993Reply of patent proprietor to notice(s) of opposition
12.01.1994Communication of observations of patent proprietor (Time limit: M04)
14.05.1994Reply of parties involved to observations of patent proprietor
15.02.1995Despatch of a communication from the opposition division (Time limit: M04)
28.03.1995Reply to a communication from the opposition division
14.07.1997Despatch of a communication from the opposition division (Time limit: M06)
19.11.1997Reply to a communication from the opposition division
11.10.1999Despatch of communication that the patent will be revoked
21.10.1999Legal effect of revocation of patent [2000/09]
Fees paidRenewal fee
30.04.1990Renewal fee patent year 03
12.04.1991Renewal fee patent year 04
15.04.1992Renewal fee patent year 05
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Patent Court
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipGB06.05.1996
FR31.01.1997
DE02.03.1999
[2000/12]
Former [1997/44]GB06.05.1996
FR31.01.1997
Former [1997/17]GB06.05.1996
Documents cited:Search[A]JP57175276  ;
 [A]GB2089029  (SCINTREX LTD);
 [A]DE2815434  (MORITA MFG)
 [A]  - PATENT ABSTRACTS OF JAPAN, vol. 7, no. 23 (P-171)[1168] 29th January 1983; & JP-A-57 175 276 (FUJITSU K.K.) 28-10-1982, & JP57175276 A 00000000
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.