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Extract from the Register of European Patents

EP About this file: EP0291420

EP0291420 - Method of dosing with the aid of the average atomic number of phases containing a light element using a scanning microscope and an image analyser [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  18.05.1990
Database last updated on 05.10.2024
Most recent event   Tooltip18.05.1990Withdrawal of applicationpublished on 04.07.1990 [1990/27]
Applicant(s)For all designated states
PECHINEY
23, rue Balzac
75008 Paris / FR
[N/P]
Former [1988/46]For all designated states
PECHINEY
23, rue Balzac
F-75008 Paris / FR
Inventor(s)01 / Dubus, Alain
Chemin de Beauregard
F-38500 Coublevie / FR
[1988/46]
Representative(s)Séraphin, Léon, et al
PECHINEY Immeuble "SIS" 217, cours Lafayette
69451 Lyon Cedex 06 / FR
[N/P]
Former [1988/46]Séraphin, Léon, et al
PECHINEY 28, rue de Bonnel
F-69433 Lyon Cedex 03 / FR
Application number, filing date88420116.111.04.1988
[1988/46]
Priority number, dateFR1987000556213.04.1987         Original published format: FR 8705562
[1988/46]
Filing languageFR
Procedural languageFR
PublicationType: A1 Application with search report 
No.:EP0291420
Date:17.11.1988
Language:FR
[1988/46]
Search report(s)(Supplementary) European search report - dispatched on:EP25.08.1988
ClassificationIPC:G01N23/203
[1988/46]
CPC:
G01N23/203 (EP,US); G01N23/04 (KR)
Designated contracting statesAT,   BE,   CH,   DE,   ES,   GB,   GR,   IT,   LI,   LU,   NL,   SE [1988/46]
TitleGerman:Verfahren zum Dosieren durch Bestimmung der mittleren Atomzahl von ein leichtes Element enthaltenden Phasen mit einem Abtastmikroskop und einem Bildanalysator[1988/46]
English:Method of dosing with the aid of the average atomic number of phases containing a light element using a scanning microscope and an image analyser[1988/46]
French:Méthode de dosage à l'aide du numéro atomique moyen de phases contenant un élément léger à l'aide d'un microscope balayage et d'un analyseur d'images[1988/46]
File destroyed:02.07.1996
Examination procedure14.12.1988Examination requested  [1989/06]
08.01.1990Despatch of a communication from the examining division (Time limit: M04)
07.05.1990Application withdrawn by applicant  [1990/27]
Fees paidRenewal fee
15.03.1990Renewal fee patent year 03
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Documents cited:Search[A]GB2124759  (UNISEARCH LTD)
 [AD]  - JOURNAL OF MICROSCOPY, vol. 124, partie 1, octobre 1981, pages 57-68, the Royal Microscopical Society; M.D. BALL et al.: "The measurement of atomic number and composition in an SEM using backscattered detectors"
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.