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EP0299887
European procedure
Extract from the Register of European Patents
EP About this file: EP0299887
| EP0299887 - Test appliance and process for an integrated circuit so as to measure surface layer effects [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 04.12.1993 Database last updated on 31.08.2024 | Most recent event Tooltip | 04.12.1993 | No opposition filed within time limit | published on 26.01.1994 [1994/04] | Applicant(s) | For all designated states STMicroelectronics S.A. 7, Avenue Galliéni 94250 Gentilly / FR | [N/P] |
| Former [1989/03] | For all designated states SGS-THOMSON MICROELECTRONICS S.A. 7, Avenue Galliéni F-94250 Gentilly / FR | Inventor(s) | 01 /
Juge, André 15, Rue de la Contamine F-38120 Saint Egreve / FR | [1989/03] | Representative(s) | de Beaumont, Michel, et al 1bis, rue Champollion 38000 Grenoble / FR | [N/P] |
| Former [1989/03] | de Beaumont, Michel, et al 1bis, rue Champollion F-38000 Grenoble / FR | Application number, filing date | 88420237.5 | 06.07.1988 | [1989/03] | Priority number, date | FR19870009903 | 07.07.1987 Original published format: FR 8709903 | [1989/03] | Filing language | FR | Procedural language | FR | Publication | Type: | A1 Application with search report | No.: | EP0299887 | Date: | 18.01.1989 | Language: | FR | [1989/03] | Type: | B1 Patent specification | No.: | EP0299887 | Date: | 03.02.1993 | Language: | FR | [1993/05] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 24.11.1988 | Classification | IPC: | G01R27/02, H01L29/06 | [1989/03] | CPC: |
H01L29/0603 (EP,US);
H01L22/00 (KR);
G01R27/02 (EP,US)
| Designated contracting states | DE, FR, GB, IT, NL [1989/03] | Title | German: | Testanordnung und -verfahren für integrierte Schaltungen, womit das Bestimmen von Oberflächenschichteffekten möglich wird | [1989/03] | English: | Test appliance and process for an integrated circuit so as to measure surface layer effects | [1989/03] | French: | Structure et procédé de test pour circuit intégré permettant la détermination des effets de surface de couches | [1989/03] | Examination procedure | 07.07.1989 | Examination requested [1989/38] | 06.12.1991 | Despatch of a communication from the examining division (Time limit: M04) | 11.01.1992 | Reply to a communication from the examining division | 16.03.1992 | Despatch of communication of intention to grant (Approval: Yes) | 03.07.1992 | Communication of intention to grant the patent | 03.09.1992 | Fee for grant paid | 03.09.1992 | Fee for publishing/printing paid | Opposition(s) | 04.11.1993 | No opposition filed within time limit [1994/04] | Fees paid | Renewal fee | 19.07.1990 | Renewal fee patent year 03 | 13.07.1991 | Renewal fee patent year 04 | 09.07.1992 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | NL | 03.02.1993 | [1993/38] | Documents cited: | Search | [A]FR2296852 (IBM [US]); | [A]EP0201945 (PHILIPS ELECTRONICS UK LTD [GB], et al); | [A]EP0175870 (MOSAIC SYSTEMS INC [US]) | [A] - IBM TECHNICAL DISCLOSURE BULLETIN, vol. 14, no. 12, 12 mai 1972, page 3707, New York, US; T.H. BAKER et al.: "Dumbbell-type resistance testing structure" |