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Extract from the Register of European Patents

EP About this file: EP0357606

EP0357606 - LOW STRESS HEAT SINKING FOR SEMICONDUCTORS [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  22.01.1991
Database last updated on 24.07.2024
Most recent event   Tooltip22.01.1991Application deemed to be withdrawnpublished on 13.03.1991 [1991/11]
Applicant(s)For all designated states
MOTOROLA, INC.
1303 East Algonquin Road
Schaumburg, IL 60196 / US
[1990/11]
Inventor(s)01 / GREENSTEIN, Bernard
2444 Saranac Lane
Glenview, IL 60025 / US
[1990/11]
Representative(s)Ibbotson, Harold, et al
Motorola, European Intellectual Property, Midpoint, Alencon Link, Basingstoke
Hampshire RG21 1PL / GB
[N/P]
Former [1990/11]Ibbotson, Harold, et al
Motorola European Intellectual Property Midpoint Alencon Link
Basingstoke Hampshire RG 21 1PL / GB
Application number, filing date88901361.115.01.1988
[1990/11]
WO1988US00074
Priority number, dateUS1987001167006.02.1987         Original published format: US 11670
[1990/11]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO8805706
Date:11.08.1988
Language:EN
[1988/18]
Type: A1 Application with search report 
No.:EP0357606
Date:14.03.1990
Language:EN
The application published by WIPO in one of the EPO official languages on 11.08.1988 takes the place of the publication of the European patent application.
[1990/11]
Search report(s)International search report - published on:US11.08.1988
(Supplementary) European search report - dispatched on:EP05.06.1990
ClassificationIPC:B23K31/02, B23K35/22, H01L23/48, H01L21/58
[1990/33]
CPC:
H01L24/83 (EP,US); B23K31/02 (KR); B23K1/19 (EP,US);
B23K35/002 (EP,US); H01L23/3735 (EP,US); H01L24/27 (EP,US);
H01L24/32 (EP,US); B23K2035/008 (EP,US); H01L2224/04026 (EP,US);
H01L2224/2908 (EP,US); H01L2224/29084 (EP,US); H01L2224/29111 (EP,US);
H01L2224/2918 (EP,US); H01L2224/29184 (EP,US); H01L2224/29186 (EP,US);
H01L2224/32245 (EP,US); H01L2224/8319 (EP,US); H01L2224/83801 (EP,US);
H01L2224/8385 (EP,US); H01L2924/01005 (EP,US); H01L2924/01006 (EP,US);
H01L2924/01013 (EP,US); H01L2924/01014 (EP,US); H01L2924/01029 (EP,US);
H01L2924/01033 (EP,US); H01L2924/01042 (EP,US); H01L2924/01047 (EP,US);
H01L2924/0105 (EP,US); H01L2924/01074 (EP,US); H01L2924/01082 (EP,US);
H01L2924/0132 (EP,US); H01L2924/014 (EP,US); H01L2924/07802 (EP,US);
H01L2924/10253 (EP,US); H01L2924/15724 (EP,US); H01L2924/351 (EP,US) (-)
C-Set:
H01L2224/29184, H01L2924/00014 (US,EP);
H01L2224/29186, H01L2924/05432 (US,EP);
H01L2224/2918, H01L2924/00014 (US,EP);
H01L2924/0132, H01L2924/01047, H01L2924/0105 (EP,US);
H01L2924/10253, H01L2924/00 (EP,US);
H01L2924/351, H01L2924/00 (EP,US)
(-)
Former IPC [1990/11]B23K31/02, B23K35/22
Designated contracting statesDE,   FR,   GB [1990/11]
TitleGerman:WÄRMEAUSLÖSUNG MIT NIEDRIGER SPANNUNG FÜR HALBLEITER[1990/11]
English:LOW STRESS HEAT SINKING FOR SEMICONDUCTORS[1990/11]
French:SYSTEME DE DISSIPATION THERMIQUE AVEC REDUCTION DES CONTRAINTES DESTINE A DES SEMI-CONDUCTEURS[1990/11]
File destroyed:04.03.1999
Entry into regional phase23.10.1989National basic fee paid 
23.10.1989Search fee paid 
23.10.1989Designation fee(s) paid 
23.10.1989Examination fee paid 
Examination procedure16.06.1988Request for preliminary examination filed
International Preliminary Examining Authority: DE
23.10.1989Examination requested  [1990/11]
19.08.1990Application deemed to be withdrawn, date of legal effect  [1991/11]
26.09.1990Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [1991/11]
Fees paidRenewal fee
29.01.1990Renewal fee patent year 03
Penalty fee
Penalty fee Rule 85a EPC 1973
19.10.1989DE   M01   Fee paid on   23.10.1989
19.10.1989FR   M01   Fee paid on   23.10.1989
19.10.1989GB   M01   Fee paid on   23.10.1989
Penalty fee Rule 85b EPC 1973
18.09.1989M01   Fee paid on   23.10.1989
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See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]US4039116  (CHAFFIN III JOHN H);
 [A]US4358784  (WISLOCKY JOSEPH, et al)
International search[A]US2662997  (HOWARD CHRISTENSEN);
 [A]US2763822  (FROLA FRANK V, et al);
 [A]US2922092  (GAZZARA CHARLES P, et al);
 [A]US3010057  (ALBERT WILLIARD S);
 [A]US3209218  (GOTTHOLD ZIELASEK, et al);
 [A]US3248681  (REINTGEN ROBERT J);
 [A]US3303432  (MARVIN GARFINKEL, et al);
 [A]US3331995  (LARRISON JOHN E);
 [A]US3339267  (BRONNES ROBERT L, et al);
 [A]US3387191  (DENIS FISHMAN, et al);
 [A]US3399332  (SAVOLAINEN UNTO U);
 [A]US3600144  (CSAKVARY TIBOR);
 [A]US3839727  (PETERSON G, et al);
 [A]US4074342  (HONN JAMES JOSEPH, et al);
 [A]US4224636  (YONEZAWA TOSHIO, et al);
 [A]US4542401  (SEKIBA TOSHINOBU [JP])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.