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Extract from the Register of European Patents

EP About this file: EP0354214

EP0354214 - PROCESS FOR DETERMINING THE ELECTRICAL DURATION OF SIGNAL PATHS [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  10.07.1993
Database last updated on 19.10.2024
Most recent event   Tooltip11.03.1994Lapse of the patent in a contracting statepublished on 04.05.1994 [1994/18]
Applicant(s)For all designated states
SIEMENS AKTIENGESELLSCHAFT
Werner-von-Siemens-Str. 1
DE-80333 München / DE
[N/P]
Former [1990/07]For all designated states
SIEMENS AKTIENGESELLSCHAFT
Wittelsbacherplatz 2
D-80333 München / DE
Inventor(s)01 / WELZHOFER, Klaus
Ruffini-Allee 30
D-8032 Graefelfing / DE
02 / VUKSIC, Antun
Otto-Bezold-Weg 18
D-8000 München 83 / DE
[1990/07]
Application number, filing date88903772.705.05.1988
[1990/07]
WO1988DE00274
Priority number, dateDE1987371811329.05.1987         Original published format: DE 3718113
[1990/07]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO8809511
Date:01.12.1988
Language:DE
[1988/26]
Type: A1 Application with search report 
No.:EP0354214
Date:14.02.1990
Language:DE
The application published by WIPO in one of the EPO official languages on 01.12.1988 takes the place of the publication of the European patent application.
[1990/07]
Type: B1 Patent specification 
No.:EP0354214
Date:09.09.1992
Language:DE
[1992/37]
Search report(s)International search report - published on:EP01.12.1988
ClassificationIPC:G01R27/28
[1990/07]
CPC:
G01R27/28 (EP,US); G01R31/3191 (EP,US); G01R31/31924 (EP,US);
G01S7/298 (EP,US)
Designated contracting statesAT,   BE,   CH,   DE,   FR,   GB,   IT,   LI,   LU,   NL,   SE [1990/07]
TitleGerman:VERFAHREN ZUR FESTSTELLUNG DER ELEKTRISCHEN LAUFZEIT VON SIGNALSTRECKEN[1990/07]
English:PROCESS FOR DETERMINING THE ELECTRICAL DURATION OF SIGNAL PATHS[1990/07]
French:PROCEDE DE DETERMINATION DE LA DUREE ELECTRIQUE DE TRAJETS DE SIGNAUX[1990/07]
Entry into regional phase08.11.1989National basic fee paid 
08.11.1989Designation fee(s) paid 
08.11.1989Examination fee paid 
Examination procedure24.10.1988Request for preliminary examination filed
08.11.1989Examination requested  [1990/07]
27.02.1992Despatch of communication of intention to grant (Approval: Yes)
13.03.1992Communication of intention to grant the patent
09.06.1992Fee for grant paid
09.06.1992Fee for publishing/printing paid
Opposition(s)10.06.1993No opposition filed within time limit [1993/35]
Fees paidRenewal fee
28.05.1990Renewal fee patent year 03
20.12.1990Renewal fee patent year 04
21.05.1992Renewal fee patent year 05
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Lapses during opposition  TooltipCH31.05.1993
LI31.05.1993
[1994/18]
Cited inInternational searchDE2752331  [ ] (ELEKTRONIKUS);
 DE2833608  [ ] (SIEMENS AG)
Examination   - Osinga/Maaskant "Handbuch der elektronischen Messgeräte", 1984, S. 273-281
    - IBM Technical Disclosure Bulletin, Vol. 28, Nr. 9 February 1986, Armonk NY (US), "Inferred on-chip waveform delay measurement technique", pages 4048-4049
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.