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EP0402497
European procedure
Extract from the Register of European Patents
EP About this file: EP0402497
| EP0402497 - Method of and apparatus for diagnosing failures in read only memory systems and the like [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 09.09.1995 Database last updated on 22.08.2024 | Most recent event Tooltip | 17.02.2006 | Change - lapse in a contracting state Updated state(s): FR | published on 05.04.2006 [2006/14] | Applicant(s) | For all designated states JOHN FLUKE MFG. CO., INC. 6920 Seaway Boulevard Everett Washington 98203 / US | [N/P] |
| Former [1990/51] | For all designated states JOHN FLUKE MFG. CO., INC. 6920 Seaway Boulevard Everett Washington 98203 / US | Inventor(s) | 01 /
Guntheroth, Kurt 961, 4th Street Mukilteo Washington 98275 / US | [1990/51] | Representative(s) | Betten & Resch Patent- und Rechtsanwälte PartGmbB Postfach 10 02 51 80076 München / DE | [N/P] |
| Former [1990/51] | Betten & Resch Reichenbachstrasse 19 D-80469 München / DE | Application number, filing date | 89110705.4 | 13.06.1989 | [1990/51] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0402497 | Date: | 19.12.1990 | Language: | EN | [1990/51] | Type: | B1 Patent specification | No.: | EP0402497 | Date: | 09.11.1994 | Language: | EN | [1994/45] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 12.03.1990 | Classification | IPC: | G11C29/00 | [1990/51] | CPC: |
G11C29/025 (EP,US);
G11C29/10 (EP,US);
G11C29/56 (EP,US);
G11C17/14 (EP,US)
| Designated contracting states | DE, FR, GB [1990/51] | Title | German: | Verfahren und Vorrichtung zur Fehlerdiagnose in Festwertspeichersystemen und dergleichen | [1990/51] | English: | Method of and apparatus for diagnosing failures in read only memory systems and the like | [1990/51] | French: | Procédé et dispositif de diagnostic de défauts pour systèmes de mémoire morte et similaire | [1990/51] | File destroyed: | 03.03.2001 | Examination procedure | 27.07.1990 | Examination requested [1990/51] | 31.08.1993 | Despatch of communication of intention to grant (Approval: Yes) | 10.05.1994 | Communication of intention to grant the patent | 11.08.1994 | Fee for grant paid | 11.08.1994 | Fee for publishing/printing paid | Opposition(s) | 10.08.1995 | No opposition filed within time limit [1995/44] | Fees paid | Renewal fee | 27.05.1991 | Renewal fee patent year 03 | 18.05.1992 | Renewal fee patent year 04 | 27.05.1993 | Renewal fee patent year 05 | 27.05.1994 | Renewal fee patent year 06 |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | FR | 09.11.1994 | DE | 10.02.1995 | GB | 13.06.1995 | [2006/14] |
| Former [1996/30] | DE | 10.02.1995 | |
| FR | 07.04.1995 | ||
| GB | 13.06.1995 | ||
| Former [1995/41] | DE | 10.02.1995 | |
| FR | 07.04.1995 | ||
| Former [1995/30] | DE | 10.02.1995 | Documents cited: | Search | [A]JP57100696 | [X] - ELECTRONICS, vol. 47, no. 23, November 1974, pages 153-155; J.B. PEATMAN et al.: "ROMs in microprocessors can test themselves" | [A] - IEE PROCEEDINGS-E/COMPUTERS AND DIGITAL TECHNIQUES, vol. 136, no. 1, part E, January 1989, pages 29-40, Stevenage, Herts, GB; J.J. NARRAWAY: "Diagnosis of multiple bus faults" | [A] - DIGEST OF PAPERS 1980 TEST CONFERENCE, 11th-13th November 1980, pages 131-136, New York, US; F.D. PATCH et al.: "Evaluation of array tests" | [A] - IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. SC-19, no. 2, April 1984, pages 212-218, New York, US; M. PAWLOWSKI et al.: "Functional Testing of EPROM's" | [A] - IBM TECHNICAL DISCLOSURE BULLETIN, vol. 12, no. 11, April 1970, page 1917, New York, US; R.H. MINERO et al.: "Checking of storage driver circuits" | [A] - PATENT ABSTRACTS OF JAPAN, vol. 6, no. 188 (P-144)[1066], 28th August 1982; & JP-A-57 100 696 (FUJITSU) 22-06-1982, & JP57100696 A 00000000 |