EP0360484 - Densitometer for measuring specular reflectivity [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 03.05.1996 Database last updated on 26.06.2024 | Most recent event Tooltip | 03.05.1996 | No opposition filed within time limit | published on 19.06.1996 [1996/25] | Applicant(s) | For all designated states Xerox Corporation Xerox Square - 020 Rochester New York 14644 / US | [N/P] |
Former [1990/13] | For all designated states XEROX CORPORATION Xerox Square - 020 Rochester New York 14644 / US | Inventor(s) | 01 /
Hubble, Fred F. III 180 Beaconview Court Rochester New York / US | 02 /
Mattioli, Theresa K. 12 Baymon Drive Rochester New York 14624 / US | 03 /
Carpenter, Sarah E. 3812 Woodley Road N.W. Washington D.C. 2016 / US | [1990/13] | Representative(s) | Johnson, Reginald George, et al Rank Xerox Ltd Patent Department Parkway Marlow Buckinghamshire SL7 1YL / GB | [N/P] |
Former [1995/05] | Johnson, Reginald George, et al Rank Xerox Ltd Patent Department Parkway Marlow Buckinghamshire SL7 1YL / GB | ||
Former [1994/50] | Johnson, Reginald George Rank Xerox Ltd Patent Department Parkway Marlow Buckinghamshire SL7 1YL / GB | ||
Former [1990/13] | Hill, Cecilia Ann Rank Xerox Ltd Patent Department Parkway Marlow Buckinghamshire SL7 1YL / GB | Application number, filing date | 89309255.1 | 12.09.1989 | [1990/13] | Priority number, date | US19880246242 | 19.09.1988 Original published format: US 246242 | [1990/13] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0360484 | Date: | 28.03.1990 | Language: | EN | [1990/13] | Type: | A3 Search report | No.: | EP0360484 | Date: | 03.07.1991 | Language: | EN | [1991/27] | Type: | B1 Patent specification | No.: | EP0360484 | Date: | 28.06.1995 | Language: | EN | [1995/26] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 16.05.1991 | Classification | IPC: | G01N21/55, G03G15/08 | [1990/13] | CPC: |
G01N21/55 (EP,US);
G03G15/0855 (EP,US);
G01N2021/559 (EP,US);
G01N2021/5957 (EP,US);
G01N21/359 (EP,US);
G01N2201/0621 (EP,US);
G03G15/5041 (EP,US)
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| Designated contracting states | DE, FR, GB [1990/13] | Title | German: | Densitometer zur Messung des Spiegelreflexionsvermögens | [1990/13] | English: | Densitometer for measuring specular reflectivity | [1990/13] | French: | Densitomètre pour mesurer la réflectance spéculaire | [1990/13] | Examination procedure | 23.12.1991 | Examination requested [1992/09] | 07.03.1994 | Despatch of a communication from the examining division (Time limit: M04) | 24.05.1994 | Reply to a communication from the examining division | 16.08.1994 | Despatch of communication of intention to grant (Approval: Yes) | 15.12.1994 | Communication of intention to grant the patent | 27.03.1995 | Fee for grant paid | 27.03.1995 | Fee for publishing/printing paid | Opposition(s) | 29.03.1996 | No opposition filed within time limit [1996/25] | Fees paid | Renewal fee | 22.06.1991 | Renewal fee patent year 03 | 09.06.1992 | Renewal fee patent year 04 | 24.06.1993 | Renewal fee patent year 05 | 23.06.1994 | Renewal fee patent year 06 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]JP62209476 ; | [A]JP56073336 ; | [XP]US4796065 (KANBAYASHI HIDEYUKI [JP]); | [AD]US4553033 (HUBBLE III FRED F [US], et al); | [A]GB2150688 (KOLLMORGEN TECH CORP); | [A]GB2177793 (ANDO ELECTRIC) | [X] - PATENT ABSTRACTS OF JAPAN, vol. 12, no. 68 (P-672)[2915], 3rd March 1988; & JP-A-62 209 476 (MINOLTA CAMERA) 14-09-1987, & JP62209476 A 00000000 | [X] - J. PHYS. E: SCI. INSTRUM., vol. 85, 1985, pages 689-696, The Institute of Physics, Bristol, GB; D.B. BETTS et al.: "Infrared reflection properties of five types of black coating for radiometric detectors" | [A] - PATENT ABSTRACTS OF JAPAN, vol. 5, no. 138 (P-78)[810], 2nd September 1981; & JP-A-56 073 336 (RICOH) 18-06-1981, & JP56073336 A 00000000 |