blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability
Register Forum

2022.02.11

More...
blank News flashes

News flashes

New version of the European Patent Register - SPC information for Unitary Patents.

2024-03-06

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP0360484

EP0360484 - Densitometer for measuring specular reflectivity [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  03.05.1996
Database last updated on 26.06.2024
Most recent event   Tooltip03.05.1996No opposition filed within time limitpublished on 19.06.1996 [1996/25]
Applicant(s)For all designated states
Xerox Corporation
Xerox Square - 020 Rochester
New York 14644 / US
[N/P]
Former [1990/13]For all designated states
XEROX CORPORATION
Xerox Square - 020
Rochester New York 14644 / US
Inventor(s)01 / Hubble, Fred F. III
180 Beaconview Court
Rochester New York / US
02 / Mattioli, Theresa K.
12 Baymon Drive
Rochester New York 14624 / US
03 / Carpenter, Sarah E.
3812 Woodley Road N.W.
Washington D.C. 2016 / US
[1990/13]
Representative(s)Johnson, Reginald George, et al
Rank Xerox Ltd Patent Department Parkway Marlow
Buckinghamshire SL7 1YL / GB
[N/P]
Former [1995/05]Johnson, Reginald George, et al
Rank Xerox Ltd Patent Department Parkway
Marlow Buckinghamshire SL7 1YL / GB
Former [1994/50]Johnson, Reginald George
Rank Xerox Ltd Patent Department Parkway
Marlow Buckinghamshire SL7 1YL / GB
Former [1990/13]Hill, Cecilia Ann
Rank Xerox Ltd Patent Department Parkway
Marlow Buckinghamshire SL7 1YL / GB
Application number, filing date89309255.112.09.1989
[1990/13]
Priority number, dateUS1988024624219.09.1988         Original published format: US 246242
[1990/13]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0360484
Date:28.03.1990
Language:EN
[1990/13]
Type: A3 Search report 
No.:EP0360484
Date:03.07.1991
Language:EN
[1991/27]
Type: B1 Patent specification 
No.:EP0360484
Date:28.06.1995
Language:EN
[1995/26]
Search report(s)(Supplementary) European search report - dispatched on:EP16.05.1991
ClassificationIPC:G01N21/55, G03G15/08
[1990/13]
CPC:
G01N21/55 (EP,US); G03G15/0855 (EP,US); G01N2021/559 (EP,US);
G01N2021/5957 (EP,US); G01N21/359 (EP,US); G01N2201/0621 (EP,US);
G03G15/5041 (EP,US) (-)
Designated contracting statesDE,   FR,   GB [1990/13]
TitleGerman:Densitometer zur Messung des Spiegelreflexionsvermögens[1990/13]
English:Densitometer for measuring specular reflectivity[1990/13]
French:Densitomètre pour mesurer la réflectance spéculaire[1990/13]
Examination procedure23.12.1991Examination requested  [1992/09]
07.03.1994Despatch of a communication from the examining division (Time limit: M04)
24.05.1994Reply to a communication from the examining division
16.08.1994Despatch of communication of intention to grant (Approval: Yes)
15.12.1994Communication of intention to grant the patent
27.03.1995Fee for grant paid
27.03.1995Fee for publishing/printing paid
Opposition(s)29.03.1996No opposition filed within time limit [1996/25]
Fees paidRenewal fee
22.06.1991Renewal fee patent year 03
09.06.1992Renewal fee patent year 04
24.06.1993Renewal fee patent year 05
23.06.1994Renewal fee patent year 06
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]JP62209476  ;
 [A]JP56073336  ;
 [XP]US4796065  (KANBAYASHI HIDEYUKI [JP]);
 [AD]US4553033  (HUBBLE III FRED F [US], et al);
 [A]GB2150688  (KOLLMORGEN TECH CORP);
 [A]GB2177793  (ANDO ELECTRIC)
 [X]  - PATENT ABSTRACTS OF JAPAN, vol. 12, no. 68 (P-672)[2915], 3rd March 1988; & JP-A-62 209 476 (MINOLTA CAMERA) 14-09-1987, & JP62209476 A 00000000
 [X]  - J. PHYS. E: SCI. INSTRUM., vol. 85, 1985, pages 689-696, The Institute of Physics, Bristol, GB; D.B. BETTS et al.: "Infrared reflection properties of five types of black coating for radiometric detectors"
 [A]  - PATENT ABSTRACTS OF JAPAN, vol. 5, no. 138 (P-78)[810], 2nd September 1981; & JP-A-56 073 336 (RICOH) 18-06-1981, & JP56073336 A 00000000
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.