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Extract from the Register of European Patents

EP About this file: EP0366423

EP0366423 - Manufacturing method of semiconductor non-volatile memory device [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  30.03.1995
Database last updated on 26.07.2024
Most recent event   Tooltip30.03.1995No opposition filed within time limitpublished on 17.05.1995 [1995/20]
Applicant(s)For all designated states
Matsushita Electronics Corporation
1006, Oaza-Kadoma Kadoma-shi
Osaka 571-8501 / JP
[N/P]
Former [1990/18]For all designated states
Matsushita Electronics Corporation
1006, Oaza-Kadoma
Kadoma-shi, Osaka 571 / JP
Inventor(s)01 / Sugaya, Tadashi
1-1-57-104, Sujyaku, 5-chome
Nara-shi Nara / JP
[1990/18]
Representative(s)Crawford, Andrew Birkby, et al
A.A. Thornton & Co. 235 High Holborn
London WC1V 7LE / GB
[N/P]
Former [1990/18]Crawford, Andrew Birkby, et al
A.A. THORNTON & CO. Northumberland House 303-306 High Holborn
London WC1V 7LE / GB
Application number, filing date89310967.824.10.1989
[1990/18]
Priority number, dateJP1988026704125.10.1988         Original published format: JP 26704188
[1990/18]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0366423
Date:02.05.1990
Language:EN
[1990/18]
Type: A3 Search report 
No.:EP0366423
Date:11.09.1991
Language:EN
[1991/37]
Type: B1 Patent specification 
No.:EP0366423
Date:25.05.1994
Language:EN
[1994/21]
Search report(s)(Supplementary) European search report - dispatched on:EP19.07.1991
ClassificationIPC:H01L21/28, H01L21/316
[1991/43]
CPC:
H01L21/28202 (EP,US); H01L21/02238 (EP,US); H01L21/02255 (EP,US);
H01L21/02299 (EP,US); H01L21/28211 (EP,US); H01L21/31662 (US);
H01L29/512 (EP,US); H01L29/518 (EP,US); H10B69/00 (EP,US);
Y10S438/911 (EP,US); Y10S438/981 (EP,US) (-)
Former IPC [1990/18]H01L21/82
Designated contracting statesDE,   FR,   GB,   NL [1990/18]
TitleGerman:Verfahren zur Herstellung einer nicht-flüchtigen Speicheranordnung[1990/18]
English:Manufacturing method of semiconductor non-volatile memory device[1990/18]
French:Méthode de fabrication d'un dispositif de mémoire non volatile en semi-conducteur[1990/18]
Examination procedure14.10.1991Examination requested  [1991/52]
18.08.1993Despatch of communication of intention to grant (Approval: Yes)
19.11.1993Communication of intention to grant the patent
09.02.1994Fee for grant paid
09.02.1994Fee for publishing/printing paid
Opposition(s)28.02.1995No opposition filed within time limit [1995/20]
Fees paidRenewal fee
10.10.1991Renewal fee patent year 03
09.10.1992Renewal fee patent year 04
11.10.1993Renewal fee patent year 05
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Documents cited:Search[A]US4302766  (GUTERMAN DANIEL C, et al);
 [A]EP0051534  (FAIRCHILD CAMERA INSTR CO [US]);
 [A]EP0197284  (FUJITSU LTD [JP]);
 [A]US4635344  (HAVEMANN ROBERT H [US])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.