Extract from the Register of European Patents

EP About this file: EP0405153

EP0405153 - Measuring head for differential thermal analysis [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  05.01.1995
Database last updated on 26.03.2026
Most recent event   Tooltip13.11.2009Change - representativepublished on 16.12.2009  [2009/51]
Applicant(s)For all designated states
NETZSCH-GERÄTEBAU GmbH
Wittelsbacherstrasse 42
D-95100 Selb / DE
[1991/01]
Inventor(s)01 / Bräuer, Gerhard
Rossbachweg 16
D-8672 Selb / DE
02 / Schmidt, Martin
Unterweissenbach 121
D-8672 Selb / DE
03 / Wassmer, Erich
Bei der Linde 34
D-8672 Sellb / DE
[1991/01]
Representative(s)von Hellfeld, Axel, et al
Wuesthoff & Wuesthoff
Patentanwälte PartG mbB
Schweigerstrasse 2
81541 München / DE
[N/P]
Former [2009/51]von Hellfeld, Axel, et al
Wuesthoff & Wuesthoff Patent- und Rechtsanwälte Schweigerstrasse 2
81541 München / DE
Former [1991/01]von Hellfeld, Axel, Dr. Dipl.-Phys., et al
WUESTHOFF & WUESTHOFF Schweigerstrasse 2
D-81541 München / DE
Application number, filing date90110142.829.05.1990
[1991/01]
Priority number, dateDE1989392165530.06.1989         Original published format: DE 3921655
[1991/01]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP0405153
Date:02.01.1991
Language:DE
[1991/01]
Type: B1 Patent specification 
No.:EP0405153
Date:02.03.1994
Language:DE
[1994/09]
Search report(s)(Supplementary) European search report - dispatched on:EP02.11.1990
ClassificationIPC:G01N25/02, G01N25/20
[1991/01]
CPC:
G01N25/486 (EP); G01N5/04 (EP)
Designated contracting statesCH,   DE,   FR,   GB,   LI [1991/01]
TitleGerman:Messkopf für die Differenzthermoanalyse[1991/01]
English:Measuring head for differential thermal analysis[1991/01]
French:Tête de mesure pour l'analyse thermique différentielle[1991/01]
File destroyed:20.04.2002
Examination procedure31.12.1990Examination requested  [1991/10]
08.07.1992Despatch of a communication from the examining division (Time limit: M04)
06.11.1992Reply to a communication from the examining division
15.04.1993Despatch of communication of intention to grant (Approval: Yes)
24.08.1993Communication of intention to grant the patent
18.11.1993Fee for grant paid
18.11.1993Fee for publishing/printing paid
Opposition(s)03.12.1994No opposition filed within time limit [1995/08]
Fees paidRenewal fee
15.05.1992Renewal fee patent year 03
17.05.1993Renewal fee patent year 04
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Lapses during opposition  TooltipFR02.03.1994
GB02.03.1994
DE04.03.1994
CH31.05.1994
LI31.05.1994
[2002/24]
Former [1995/13]GB02.03.1994
DE04.03.1994
CH31.05.1994
LI31.05.1994
Former [1995/03]GB02.03.1994
DE04.03.1994
Former [1994/32]DE04.03.1994
Documents cited:Search[Y] JP60228946  
 [Y]   Electronique industrielle no. 118, November 1968, Seiten 707 - 711; G. Lhuillery: "La micro-analyse thermique differentielle;etude et applications d'un micro-analyseur"
 [Y]   PATENT ABSTRACTS OF JAPAN vol. 10, no. 93 (P-445)(2150) 10 April 1986, & JP-A-60 228946 (SHIMAZU SEISHAKUSHO K.K.) 14 November 85 [Y]
 [Y]   ANALYTICAL CHEMISTRY. vol. 36, no. 11, Oktober 1964, COLUMBUS US Seiten 2172 - 2174; E.M. Barrall II, et al.: "Calorimetric Studies_by Differential Thermal Analysis" [Y]
Examination  Hemminger/Hhne: Calorimetry, Weinheim, 1984, ISBN 3-527-25948-1, S. 196-203
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