EP0444324 - Method for removing artifact and for correcting sensitivity of single photon emission computerized tomography and apparatus thereof [Right-click to bookmark this link] | Status | The application has been refused Status updated on 20.11.1998 Database last updated on 11.05.2024 | Most recent event Tooltip | 05.10.2005 | Change: Appeal number | Applicant(s) | For all designated states Kabushiki Kaisha Toshiba 72, Horikawa-cho, Saiwai-ku Kawasaki-shi Kanagawa-ken 210-8572 / JP | [N/P] |
Former [1995/01] | For all designated states KABUSHIKI KAISHA TOSHIBA 72, Horikawa-cho, Saiwai-ku Kawasaki-shi, Kanagawa-ken 210, Tokyo / JP | ||
Former [1991/36] | For all designated states Kabushiki Kaisha Toshiba 72, Horikawa-cho Saiwai-ku Kawasaki-shi / JP | Inventor(s) | 01 /
Ichihara, Takashi 3-3359-15 Mihara Ootawara-shi, Toshigi-ken / JP | [1991/36] | Representative(s) | Blumbach · Zinngrebe Patent PartG mbB European Patent Attorneys Patenta Radeckestrasse 43 81245 München / DE | [N/P] |
Former [1995/18] | Blumbach, Kramer & Partner Patentanwälte Radeckestrasse 43 D-81245 München / DE | ||
Former [1991/36] | Blumbach Weser Bergen Kramer Zwirner Hoffmann Patentanwälte Radeckestrasse 43 D-81245 München / DE | Application number, filing date | 90125862.4 | 31.12.1990 | [1991/36] | Priority number, date | JP19900020793 | 31.01.1990 Original published format: JP 2079390 | [1991/36] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0444324 | Date: | 04.09.1991 | Language: | EN | [1991/36] | Type: | A3 Search report | No.: | EP0444324 | Date: | 11.09.1991 | Language: | EN | [1991/37] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 22.07.1991 | Classification | IPC: | G01T1/164 | [1991/36] | CPC: |
G01T1/1648 (EP,US)
| Designated contracting states | DE, GB [1991/36] | Title | German: | Verfahren und Vorrichtung zur Unterdrückung von Bildstörungen und zur Empfindlichkeitskorrektur eines einzelphotonemittierenden computergesteuerten Tomographes | [1991/36] | English: | Method for removing artifact and for correcting sensitivity of single photon emission computerized tomography and apparatus thereof | [1991/36] | French: | Procédé et appareil pour supprimer la distorsion d'image et pour corriger la sensibilité d'un tomographe numérisé à émission de photons isolés | [1991/36] | Examination procedure | 31.12.1990 | Examination requested [1991/36] | 17.07.1992 | Despatch of a communication from the examining division (Time limit: M06) | 22.01.1993 | Reply to a communication from the examining division | 21.05.1993 | Despatch of a communication from the examining division (Time limit: M06) | 30.11.1993 | Reply to a communication from the examining division | 13.07.1994 | Date of oral proceedings | 29.07.1994 | Despatch of communication that the application is refused, reason: substantive examination [1999/01] | 29.07.1994 | Minutes of oral proceedings despatched | 30.09.1998 | Application refused, date of legal effect [1999/01] | Appeal following examination | 27.09.1994 | Appeal received No. T0974/94 | 29.11.1994 | Statement of grounds filed | 30.09.1998 | Result of appeal procedure: appeal of the applicant was rejected | 30.09.1998 | Date of oral proceedings | 08.10.1998 | Minutes of oral proceedings despatched | Fees paid | Renewal fee | 09.10.1992 | Renewal fee patent year 03 | 13.12.1993 | Renewal fee patent year 04 | 07.12.1994 | Renewal fee patent year 05 | 08.12.1995 | Renewal fee patent year 06 | 11.12.1996 | Renewal fee patent year 07 | 12.12.1997 | Renewal fee patent year 08 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A] - IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. NS-32, no. 1, February 1985, pages 794-798, New York, US; K.S. HAN; "Some methods for SPECT uniformity correction and their evaluation" | [AD] - IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. NS-32, no. 1, February 1985, pages 741-747, New York, US; C.B. LIM et al.; "Triangular SPECT system for 3-D total organ volume imaging: design concept and preliminary imaging results" |