EP0380412 - Coating weight measuring and control apparatus and method [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 22.03.1996 Database last updated on 09.07.2024 | Most recent event Tooltip | 30.11.2007 | Lapse of the patent in a contracting state Updated state(s): FR | published on 02.01.2008 [2008/01] | Applicant(s) | For all designated states MEASUREX CORPORATION One Results Way Cupertino, California 95014 / US | [1990/31] | Inventor(s) | 01 /
Howarth, John J. 870 Weston Road Scottsvalley, California 95066 / US | [1990/37] |
Former [1990/31] | 01 /
Howarth, John J. 15401 Winchester Blvd. Monte Sereno, California / US | Representative(s) | Dubois-Chabert, Guy, et al BREVALEX 3, rue du Docteur Lanceraux 75008 Paris / FR | [N/P] |
Former [1995/10] | Dubois-Chabert, Guy, et al Société de Protection des Inventions 25, rue de Ponthieu F-75008 Paris / FR | ||
Former [1990/31] | Mongrédien, André c/o SOCIETE DE PROTECTION DES INVENTIONS 25, rue de Ponthieu F-75008 Paris / FR | Application number, filing date | 90400204.5 | 24.01.1990 | [1990/31] | Priority number, date | US19890303451 | 27.01.1989 Original published format: US 303451 | [1990/31] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0380412 | Date: | 01.08.1990 | Language: | EN | [1990/31] | Type: | A3 Search report | No.: | EP0380412 | Date: | 20.03.1991 | Language: | EN | [1991/12] | Type: | B1 Patent specification | No.: | EP0380412 | Date: | 17.05.1995 | Language: | EN | [1995/20] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 28.01.1991 | Classification | IPC: | G01B11/06 | [1990/31] | CPC: |
B05C1/0869 (EP,US);
B05C1/0826 (EP,US);
B05C11/02 (EP,US);
B05C3/18 (EP,US);
G01B11/0616 (EP,US)
| Designated contracting states | DE, FR, GB, IT, SE [1990/31] | Title | German: | Verfahren und Vorrichtung zum Messen und Kontrollieren des Gewichts einer Schicht | [1990/31] | English: | Coating weight measuring and control apparatus and method | [1990/31] | French: | Procédé et appareil pour mesurer et contrôler le poids d'une couche appliquée | [1990/31] | Examination procedure | 22.08.1991 | Examination requested [1991/42] | 20.10.1992 | Despatch of a communication from the examining division (Time limit: M06) | 19.04.1993 | Reply to a communication from the examining division | 07.07.1993 | Despatch of a communication from the examining division (Time limit: M04) | 02.11.1993 | Reply to a communication from the examining division | 10.01.1994 | Despatch of communication that the application is refused, reason: substantive examination {1} | 08.07.1994 | Despatch of communication of intention to grant (Approval: No) | 09.11.1994 | Despatch of communication of intention to grant (Approval: later approval) | 17.11.1994 | Communication of intention to grant the patent | 16.01.1995 | Fee for grant paid | 16.01.1995 | Fee for publishing/printing paid | Appeal following examination | 16.03.1994 | Appeal received | 05.05.1994 | Statement of grounds filed | 27.05.1994 | Interlocutory revision of appeal | Opposition(s) | 20.02.1996 | No opposition filed within time limit [1996/19] | Fees paid | Renewal fee | 17.12.1991 | Renewal fee patent year 03 | 14.12.1992 | Renewal fee patent year 04 | 22.12.1993 | Renewal fee patent year 05 | 27.12.1994 | Renewal fee patent year 06 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | FR | 17.05.1995 | IT | 17.05.1995 | SE | 17.08.1995 | GB | 24.01.1996 | [2006/14] |
Former [1999/42] | IT | 17.05.1995 | |
SE | 17.08.1995 | ||
FR | 13.10.1995 | ||
GB | 24.01.1996 | ||
Former [1997/14] | SE | 17.08.1995 | |
FR | 13.10.1995 | ||
GB | 24.01.1996 | ||
Former [1996/16] | SE | 17.08.1995 | |
FR | 13.10.1995 | ||
Former [1996/04] | SE | 17.08.1995 | Documents cited: | Search | [A]JP61120004 ; | [X]US4789820 (PARRENT JR GEORGE B [US], et al); | [X]US4243882 (YASUJIMA AKITAKA, et al); | [A]US4006358 (HOWARTH JOHN J); | [A]US3801349 (WILSON W, et al); | [A]EP0137696 (WIGGINS TEAPE GROUP LTD [GB]); | [A]US3525863 (CONSTANTINE NIKIFOROS, et al) | [X] - REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 54, no. 6, June 1983, pages 690-694, American Institute of Physics, New York, US; K. TAKAMI et al.: "Thickness measurement method for thin photoresist film on transparent material" | [A] - PATENT ABSTRACTS OF JAPAN, vol. 10, no. 305 (P-507)[2361], 17th October 1986; & JP-A-61 120 004 (TOSHIBA ELECTRON SYST. K.K.) 07-06-1986, & JP61120004 A 00000000 |