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Extract from the Register of European Patents

EP About this file: EP0380412

EP0380412 - Coating weight measuring and control apparatus and method [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  22.03.1996
Database last updated on 09.07.2024
Most recent event   Tooltip30.11.2007Lapse of the patent in a contracting state
Updated state(s): FR
published on 02.01.2008  [2008/01]
Applicant(s)For all designated states
MEASUREX CORPORATION
One Results Way
Cupertino, California 95014 / US
[1990/31]
Inventor(s)01 / Howarth, John J.
870 Weston Road
Scottsvalley, California 95066 / US
[1990/37]
Former [1990/31]01 / Howarth, John J.
15401 Winchester Blvd.
Monte Sereno, California / US
Representative(s)Dubois-Chabert, Guy, et al
BREVALEX 3, rue du Docteur Lanceraux
75008 Paris / FR
[N/P]
Former [1995/10]Dubois-Chabert, Guy, et al
Société de Protection des Inventions 25, rue de Ponthieu
F-75008 Paris / FR
Former [1990/31]Mongrédien, André
c/o SOCIETE DE PROTECTION DES INVENTIONS 25, rue de Ponthieu
F-75008 Paris / FR
Application number, filing date90400204.524.01.1990
[1990/31]
Priority number, dateUS1989030345127.01.1989         Original published format: US 303451
[1990/31]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0380412
Date:01.08.1990
Language:EN
[1990/31]
Type: A3 Search report 
No.:EP0380412
Date:20.03.1991
Language:EN
[1991/12]
Type: B1 Patent specification 
No.:EP0380412
Date:17.05.1995
Language:EN
[1995/20]
Search report(s)(Supplementary) European search report - dispatched on:EP28.01.1991
ClassificationIPC:G01B11/06
[1990/31]
CPC:
B05C1/0869 (EP,US); B05C1/0826 (EP,US); B05C11/02 (EP,US);
B05C3/18 (EP,US); G01B11/0616 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT,   SE [1990/31]
TitleGerman:Verfahren und Vorrichtung zum Messen und Kontrollieren des Gewichts einer Schicht[1990/31]
English:Coating weight measuring and control apparatus and method[1990/31]
French:Procédé et appareil pour mesurer et contrôler le poids d'une couche appliquée[1990/31]
Examination procedure22.08.1991Examination requested  [1991/42]
20.10.1992Despatch of a communication from the examining division (Time limit: M06)
19.04.1993Reply to a communication from the examining division
07.07.1993Despatch of a communication from the examining division (Time limit: M04)
02.11.1993Reply to a communication from the examining division
10.01.1994Despatch of communication that the application is refused, reason: substantive examination {1}
08.07.1994Despatch of communication of intention to grant (Approval: No)
09.11.1994Despatch of communication of intention to grant (Approval: later approval)
17.11.1994Communication of intention to grant the patent
16.01.1995Fee for grant paid
16.01.1995Fee for publishing/printing paid
Appeal following examination16.03.1994Appeal received
05.05.1994Statement of grounds filed
27.05.1994Interlocutory revision of appeal
Opposition(s)20.02.1996No opposition filed within time limit [1996/19]
Fees paidRenewal fee
17.12.1991Renewal fee patent year 03
14.12.1992Renewal fee patent year 04
22.12.1993Renewal fee patent year 05
27.12.1994Renewal fee patent year 06
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See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipFR17.05.1995
IT17.05.1995
SE17.08.1995
GB24.01.1996
[2006/14]
Former [1999/42]IT17.05.1995
SE17.08.1995
FR13.10.1995
GB24.01.1996
Former [1997/14]SE17.08.1995
FR13.10.1995
GB24.01.1996
Former [1996/16]SE17.08.1995
FR13.10.1995
Former [1996/04]SE17.08.1995
Documents cited:Search[A]JP61120004  ;
 [X]US4789820  (PARRENT JR GEORGE B [US], et al);
 [X]US4243882  (YASUJIMA AKITAKA, et al);
 [A]US4006358  (HOWARTH JOHN J);
 [A]US3801349  (WILSON W, et al);
 [A]EP0137696  (WIGGINS TEAPE GROUP LTD [GB]);
 [A]US3525863  (CONSTANTINE NIKIFOROS, et al)
 [X]  - REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 54, no. 6, June 1983, pages 690-694, American Institute of Physics, New York, US; K. TAKAMI et al.: "Thickness measurement method for thin photoresist film on transparent material"
 [A]  - PATENT ABSTRACTS OF JAPAN, vol. 10, no. 305 (P-507)[2361], 17th October 1986; & JP-A-61 120 004 (TOSHIBA ELECTRON SYST. K.K.) 07-06-1986, & JP61120004 A 00000000
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.