-
EP0406030
European procedure
Extract from the Register of European Patents
EP About this file: EP0406030
| EP0406030 - Inspection apparatus and method for detecting flaws on a diffractive surface [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 08.03.1996 Database last updated on 03.09.2024 | Most recent event Tooltip | 30.11.2007 | Lapse of the patent in a contracting state New state(s): IT | published on 02.01.2008 [2008/01] | Applicant(s) | For all designated states QC OPTICS, INC. 154 Middlesex Turnpike Burlington Massachusetts 01803 / US | [N/P] |
| Former [1991/01] | For all designated states QC OPTICS, INC. 154 Middlesex Turnpike Burlington, Massachusetts 01803 / US | Inventor(s) | 01 /
Johnson, Carly E. 3 Heritage Drive Merrimack, New Hampshire 03054 / US | 02 /
Ormsby, Jay L. 38 Crestwood Circle Salem, New Hampshire 03079 / US | 03 /
Chase, Eric T. 14 Lucerne Drive Andover, Massachusetts 01810 / US | 04 /
Quackenbos, George S. 83 Turkey Hill Road Newburyport, Massachusetts 01950 / US | 05 /
Broude, Sergey V. 399 Great Road Acton, Massachusetts 07120 / US | 06 /
Boudour, Abdu 25 Star Road West Newton, Massachusetts 02165 / US | [1991/01] | Representative(s) | Pinguet, André Cabinet de Proprieté Industrielle CAPRI, 94, avenue Mozart 75016 Paris / FR | [N/P] |
| Former [1991/01] | Pinguet, André Cabinet de Proprieté Industrielle CAPRI, 94, avenue Mozart F-75016 Paris / FR | Application number, filing date | 90400529.5 | 26.02.1990 | [1991/01] | Priority number, date | US19890373914 | 30.06.1989 Original published format: US 373914 | [1991/01] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0406030 | Date: | 02.01.1991 | Language: | EN | [1991/01] | Type: | A3 Search report | No.: | EP0406030 | Date: | 23.10.1991 | Language: | EN | [1991/43] | Type: | B1 Patent specification | No.: | EP0406030 | Date: | 03.05.1995 | Language: | EN | [1995/18] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 31.08.1991 | Classification | IPC: | G01N21/88 | [1991/01] | CPC: |
G01N21/95607 (EP,US);
G01N2021/4714 (EP,US);
G01N2021/95676 (EP,US);
G01N2201/1085 (EP,US)
| Designated contracting states | BE, CH, DE, FR, GB, IT, LI, NL, SE [1991/01] | Title | German: | Gerät und Verfahren zum Nachweis von Fehlern auf einer lichtbeugenden Oberfläche | [1991/01] | English: | Inspection apparatus and method for detecting flaws on a diffractive surface | [1991/01] | French: | Appareil et méthode d'inspection pour la détection de défauts sur une surface diffractive | [1991/01] | Examination procedure | 22.02.1992 | Examination requested [1992/17] | 09.11.1993 | Despatch of a communication from the examining division (Time limit: M06) | 06.05.1994 | Reply to a communication from the examining division | 09.06.1994 | Despatch of communication of intention to grant (Approval: Yes) | 31.08.1994 | Communication of intention to grant the patent | 25.11.1994 | Fee for grant paid | 25.11.1994 | Fee for publishing/printing paid | Opposition(s) | 06.02.1996 | No opposition filed within time limit [1996/17] | Fees paid | Renewal fee | 26.02.1992 | Renewal fee patent year 03 | 26.02.1993 | Renewal fee patent year 04 | 25.02.1994 | Renewal fee patent year 05 | 28.02.1995 | Renewal fee patent year 06 |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | BE | 03.05.1995 | IT | 03.05.1995 | SE | 03.08.1995 | [1999/42] |
| Former [1996/04] | BE | 03.05.1995 | |
| SE | 03.08.1995 | Documents cited: | Search | [A]JP54118891 ; | [A]JP63151840 ; | [A]EP0017371 (TOKYO SHIBAURA ELECTRIC CO [JP]); | [AD]US4402607 (MCVAY LANCE [US], et al); | [Y]DE3411934 (SICK OPTIK ELEKTRONIK ERWIN [DE]); | [Y]DD250850 (ROBOTRON ELEKTRONIK [DD]) | [A] - PATENT ABSTRACTS OF JAPAN vol. 3, no. 141 (E-153)21 November 1979 & JP-A-54 118 891 ( FUJI DENKI SEIZO ) 14 September 1979, & JP54118891 A 19790914 | [A] - PATENT ABSTRACTS OF JAPAN vol. 12, no. 415 (P-781)(3262) 4 November 1988 & JP-A-63 151 840 ( CITIZEN WATCH CO ) 24 June 1988, & JP63151840 A 19880624 |