blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability
Register Forum

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP0469216

EP0469216 - Method of forming metal contact pads and terminals on semiconductor chips [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  12.10.1995
Database last updated on 03.09.2024
Most recent event   Tooltip30.11.2007Lapse of the patent in a contracting statepublished on 02.01.2008  [2008/01]
Applicant(s)For:DE  GB  IT 
International Business Machines Corporation
New Orchard Road
Armonk, NY 10504 / US
For:FR 
Compagnie IBM FRANCE
5 Place Vendôme
F-75000 Paris 1er / FR
[N/P]
Former [1992/06]For:DE  GB  IT 
International Business Machines Corporation
Old Orchard Road
Armonk, N.Y. 10504 / US
For:FR 
Compagnie IBM FRANCE
5 Place Vendôme
F-75000 Paris 1er / FR
Inventor(s)01 / Lochon, Henri
15, Allée du Colonel Koch
F-91250 Saintry-Sur-Seine / FR
02 / Robert, Georges
1, rue de la Ferme, Baulne
F-91510 La Ferte-Alais / FR
[1992/06]
Representative(s)Klein, Daniel Jacques Henri
Compagnie IBM France Département de Propriété Intellectuelle
06610 La Gaude / FR
[N/P]
Former [1992/06]Klein, Daniel Jacques Henri
Compagnie IBM France Département de Propriété Intellectuelle
F-06610 La Gaude / FR
Application number, filing date90480110.731.07.1990
[1992/06]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0469216
Date:05.02.1992
Language:EN
[1992/06]
Type: B1 Patent specification 
No.:EP0469216
Date:07.12.1994
Language:EN
[1994/49]
Search report(s)(Supplementary) European search report - dispatched on:EP05.04.1991
ClassificationIPC:H01L21/60, H01L23/485
[1992/06]
CPC:
H01L24/11 (EP,US); H01L23/53209 (EP,US); H01L24/03 (EP);
H01L24/05 (EP); H01L24/13 (EP,US); H01L2224/023 (EP);
H01L2224/05124 (EP,US); H01L2224/05147 (EP,US); H01L2224/05171 (EP,US);
H01L2224/05644 (EP,US); H01L2224/1147 (EP,US); H01L2224/11472 (EP,US);
H01L2224/11902 (EP,US); H01L2224/13023 (EP,US); H01L2224/13099 (EP,US);
H01L2224/131 (EP,US); H01L2224/13116 (EP,US); H01L2924/0001 (EP,US);
H01L2924/01005 (EP,US); H01L2924/01006 (EP,US); H01L2924/01011 (EP,US);
H01L2924/01013 (EP,US); H01L2924/01018 (EP,US); H01L2924/01019 (EP,US);
H01L2924/01024 (EP,US); H01L2924/01029 (EP,US); H01L2924/01033 (EP,US);
H01L2924/01042 (EP,US); H01L2924/01058 (EP,US); H01L2924/01059 (EP,US);
H01L2924/01079 (EP,US); H01L2924/01082 (EP,US); H01L2924/014 (EP,US);
H01L2924/14 (EP,US); H01L2924/15787 (EP,US); Y10S148/143 (EP,US) (-)
C-Set:
H01L2224/023, H01L2924/0001 (EP);
H01L2224/05124, H01L2924/00014 (EP,US);
H01L2224/05147, H01L2924/00014 (EP,US);
H01L2224/05171, H01L2924/00014 (EP,US);
H01L2224/05644, H01L2924/00014 (EP,US);
H01L2224/13116, H01L2924/0105, H01L2924/00014 (US,EP);
H01L2224/131, H01L2924/014 (US,EP);
H01L2924/0001, H01L2224/13099 (US,EP);
H01L2924/15787, H01L2924/00 (US,EP)
(-)
Designated contracting statesDE,   FR,   GB,   IT [1992/06]
TitleGerman:Verfahren zur Bildung metallischer Kontaktflächen und Anschlüsse auf Halbleiterchips[1992/06]
English:Method of forming metal contact pads and terminals on semiconductor chips[1992/06]
French:Procédé pour former des terminaux et des plages de contact métalliques sur des chips semi-conducteurs[1992/06]
Examination procedure21.05.1992Examination requested  [1992/30]
11.03.1994Despatch of communication of intention to grant (Approval: Yes)
10.06.1994Communication of intention to grant the patent
28.06.1994Fee for grant paid
28.06.1994Fee for publishing/printing paid
Opposition(s)08.09.1995No opposition filed within time limit [1995/48]
Fees paidRenewal fee
25.07.1992Renewal fee patent year 03
16.07.1993Renewal fee patent year 04
18.07.1994Renewal fee patent year 05
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipIT07.12.1994
[2008/01]
Former [1999/42]IT07.12.1994
Documents cited:Search[A]US4293637  (HATADA KENZO, et al);
 [AD]EP0061593  (IBM [US]);
 [A]US4410622  (DALAL HORMAZDYZR D [US], et al)
 [A]  - IBM TECHNICAL DISCLOSURE BULLETIN. vol. 25, no. 11A, April 1983, NEW YORK US pages 5725 - 5726; S.BOYAR ET AL.: "Sub-etch ball limiting metallurgy technology"
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.