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EP0502866
European procedure
Extract from the Register of European Patents
EP About this file: EP0502866
| EP0502866 - DOUBLE-BEAM SPECTROMETER [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 03.01.1996 Database last updated on 30.10.2024 | Most recent event Tooltip | 06.11.2009 | Change - representative | published on 09.12.2009 [2009/50] | Applicant(s) | For all designated states KERNFORSCHUNGSZENTRUM KARLSRUHE GMBH Postfach 36 40 D-76021 Karlsruhe / DE | [1994/52] |
| Former [1994/51] | For all designated states KERNFORSCHUNGSZENTRUM KARLSRUHE GMBH Postfach 36 40 D-76021 Karlsruhe / DE | ||
| For all designated states BERNATH ATOMIC GmbH & Co. KG Gottlieb-Daimler-Strasse 11-15 D-30974 Wennigsen / DE | |||
| Former [1992/38] | For all designated states KERNFORSCHUNGSZENTRUM KARLSRUHE GMBH Postfach 36 40 D-76050 Karlsruhe / DE | ||
| For all designated states BERNATH ATOMIC GmbH & Co. KG Gottlieb-Daimler-Strasse 11-15 D-30974 Wennigsen / DE | Inventor(s) | 01 /
RINKE, Günter Traminerweg 3 D-7504 Weingarten / DE | [1992/38] | Representative(s) | Rückert, Friedrich Karlsruher Institut für Technologie Stabsabteilung Innovation Postfach 36 40 76021 Karlsruhe / DE | [2009/50] |
| Former [1994/52] | Rückert, Friedrich, Dr. Forschungszentrum Karlsruhe GmbH Patente und Lizenzen Weberstrasse 5 D-76133 Karlsruhe / DE | ||
| Former [1992/38] | Gottlob, Peter Kernforschungszentrum Karlsruhe GmbH Stabs. Patente und Lizenzen Weberstrasse 5 D-76133 Karlsruhe / DE | Application number, filing date | 90916689.4 | 19.11.1990 | [1992/38] | WO1990DE00887 | Priority number, date | DE19893939148 | 27.11.1989 Original published format: DE 3939148 | [1992/38] | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | WO9108454 | Date: | 13.06.1991 | Language: | DE | [1991/13] | Type: | A1 Application with search report | No.: | EP0502866 | Date: | 16.09.1992 | Language: | DE | The application published by WIPO in one of the EPO official languages on 13.06.1991 takes the place of the publication of the European patent application. | [1992/38] | Type: | B1 Patent specification | No.: | EP0502866 | Date: | 01.02.1995 | Language: | DE | [1995/05] | Search report(s) | International search report - published on: | EP | 13.06.1991 | Classification | IPC: | G01J3/02, G01J3/42 | [1992/38] | CPC: |
G01J3/36 (EP,US);
G01J3/2803 (EP,US);
G01J3/42 (EP,US);
G01J2003/2866 (EP,US);
G01J3/0294 (EP,US)
| Designated contracting states | AT, BE, CH, DE, FR, GB, IT, LI, NL, SE [1992/38] | Title | German: | ZWEISTRAHL-SPEKTROMETER | [1992/38] | English: | DOUBLE-BEAM SPECTROMETER | [1992/38] | French: | SPECTROMETRE A DOUBLE FAISCEAU | [1992/38] | Entry into regional phase | 31.07.1991 | National basic fee paid | 31.07.1991 | Designation fee(s) paid | 31.07.1991 | Examination fee paid | Examination procedure | 30.04.1991 | Request for preliminary examination filed International Preliminary Examining Authority: DE | 31.07.1991 | Examination requested [1992/38] | 30.08.1993 | Despatch of a communication from the examining division (Time limit: M04) | 18.12.1993 | Reply to a communication from the examining division | 28.01.1994 | Despatch of communication of intention to grant (Approval: Yes) | 04.05.1994 | Communication of intention to grant the patent | 05.07.1994 | Fee for grant paid | 05.07.1994 | Fee for publishing/printing paid | Opposition(s) | 03.11.1995 | No opposition filed within time limit [1996/04] | Fees paid | Renewal fee | 28.11.1992 | Renewal fee patent year 03 | 10.11.1993 | Renewal fee patent year 04 | 17.10.1994 | Renewal fee patent year 05 |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | IT | 01.02.1995 | NL | 01.02.1995 | SE | 01.05.1995 | [2008/02] |
| Former [1999/42] | IT | 01.02.1995 | |
| NL | 01.02.1995 | ||
| SE | 01.05.1995 | ||
| Former [1996/04] | NL | 01.02.1995 | |
| SE | 01.05.1995 | ||
| Former [1995/49] | NL | 01.02.1995 | Cited in | International search | US4669873 [ ] (WIRZ PETER [DE]); | EP0340915 [ ] (MILTON ROY CO [US]) | Examination | JP63198832 | JP54123085 | - Applied Spectroscopy, vol. 42, no. 8, December 1988, Society for Applied Spectroscopy, J. Zhu et al: "Simultaneous dual-window measurements with a linear photodiode array detector", pages 1567-1571 | - Patent Abstracts of Japan, vol. 12, no. 483 (P-802)(3330), 16 December 1988 & JP-A-63198832, & JP63198832 A 19881216 | - Patent Abstracts of Japan, vol. 3, no. 145 (E-155), 30 November 1979, & JP-A-54123085, & JP54123085 A 19791130 | - Labor Praxis Spezial, 1988, M. Steinwand: "Diodenarray-Detektion in der HPLC mit der Empfindlichkeit eines variablen UV-Detektors", pages 90-92 |