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EP0456254
European procedure
Extract from the Register of European Patents
EP About this file: EP0456254
| EP0456254 - Semiconductor device and method of screening the same [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 29.05.1998 Database last updated on 28.06.2024 | Most recent event Tooltip | 29.05.1998 | No opposition filed within time limit | published on 15.07.1998 [1998/29] | Applicant(s) | For all designated states Kabushiki Kaisha Toshiba 72, Horikawa-cho, Saiwai-ku Kawasaki-shi Kanagawa-ken 210-8572 / JP | [N/P] |
| Former [1995/01] | For all designated states KABUSHIKI KAISHA TOSHIBA 72, Horikawa-cho, Saiwai-ku Kawasaki-shi, Kanagawa-ken 210, Tokyo / JP | ||
| Former [1991/46] | For all designated states Kabushiki Kaisha Toshiba 72, Horikawa-cho Saiwai-ku Kawasaki-shi / JP | Inventor(s) | 01 /
Furuyama, Tohru, c/o Int. Pty. Div., K.K. Toshiba 1-1 Shibaura 1-chome, Minato-ku Tokyo 105 / JP | [1991/46] | Representative(s) | Lehn, Werner, et al Hoffmann Eitle, Patent- und Rechtsanwälte, Postfach 81 04 20 81904 München / DE | [N/P] |
| Former [1991/46] | Lehn, Werner, Dipl.-Ing., et al Hoffmann, Eitle & Partner, Patentanwälte, Postfach 81 04 20 D-81904 München / DE | Application number, filing date | 91107613.1 | 10.05.1991 | [1991/46] | Priority number, date | JP19900119948 | 11.05.1990 Original published format: JP 11994890 | [1991/46] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0456254 | Date: | 13.11.1991 | Language: | EN | [1991/46] | Type: | A3 Search report | No.: | EP0456254 | Date: | 27.12.1991 | Language: | EN | [1991/52] | Type: | B1 Patent specification | No.: | EP0456254 | Date: | 23.07.1997 | Language: | EN | [1997/30] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 05.11.1991 | Classification | IPC: | G11C5/14, G11C29/00 | [1991/52] | CPC: |
G11C11/4085 (EP,US);
H01L22/00 (KR);
G11C29/46 (EP,US);
G11C29/50 (EP,US);
G11C5/145 (EP,US);
G11C5/147 (EP,US);
G11C11/401 (EP,US)
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| Former IPC [1991/46] | G11C5/14 | Designated contracting states | DE, FR, GB [1991/46] | Title | German: | Halbleiteranordnung und ihre Prüfungsverfahren | [1991/46] | English: | Semiconductor device and method of screening the same | [1991/46] | French: | Dispositf à semi-conducteurs et méthode pour l'examiner | [1991/46] | Miscellaneous | EPB 1996/36: Teilanmeldung 96108851.5 eingereicht am 03/06/96 | EPB 1996/36: Divisional application 96108851.5 filed on 03/06/96 | EPB 1996/36: Demande divisionnaire 96108851.5 déposée le 03/06/96 | Examination procedure | 10.05.1991 | Examination requested [1991/46] | 12.04.1995 | Despatch of a communication from the examining division (Time limit: M04) | 11.08.1995 | Reply to a communication from the examining division | 19.12.1995 | Despatch of a communication from the examining division (Time limit: M04) | 04.04.1996 | Reply to a communication from the examining division | 16.09.1996 | Despatch of communication of intention to grant (Approval: Yes) | 27.11.1996 | Communication of intention to grant the patent | 21.02.1997 | Fee for grant paid | 21.02.1997 | Fee for publishing/printing paid | Divisional application(s) | EP96108851.5 / EP0740308 | Opposition(s) | 24.04.1998 | No opposition filed within time limit [1998/29] | Fees paid | Renewal fee | 10.05.1993 | Renewal fee patent year 03 | 09.05.1994 | Renewal fee patent year 04 | 12.04.1995 | Renewal fee patent year 05 | 09.05.1996 | Renewal fee patent year 06 | 12.05.1997 | Renewal fee patent year 07 |
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